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APPENDIX )
13-70
Version 1.23
MODEL 5000 SERIES MANUAL
Installation
Connect the adaptor as shown in the supplied Interconnect Diagram.
Operation
13.1.18
V
CESUS
Use the V
CESUS
test in the Transistor Device family. Make the appropriate entries as
desired in the test edit screen.
13.1.18.1 I
CESUS
I
CESUS
is the current at which V
CESUS
measurements are made; I
CESUS
cannot exceed
the programmed I
C
.
13.1.18.2 V
CEOSUS
R
BE
OPEN
Rev Bias
OFF
13.1.18.3 V
CERSUS
R
BE
EXT, 1K or 10K
Rev Bias
OFF
13.1.18.4 V
CEVSUS
R
BE
OPEN
Rev Bias
ON
Note: Maximum available reverse bias base current is the same as the IB test entry.
Be certain sufficient IB current is programmed to adequately drive the reverse bias
condition.
13.1.19
I
CEV
Use the I
CEV
test in the Transistor Device family. This test is used only as a reverse
bias test. For I
CEO
or I
CER
, use the I
CE
test in the same device family. The ADP-410
contains a floating bias supply used for the I
CEV
test.
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