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1 - OVERVIEW 

 MODEL 5000 SERIES MANUAL 

Version 1.23

 

1-1 

1  OVERVIEW 

 

1.1 System Description 

This manual covers the 5000 Series Tester (Models 5000E and 5300HX).  The 5000 
Series  Tester  is  an  extension  of  the  proven  Model  5150,  adding  improved  Analog 
Board  and  modern  CPU.    Upgrading  becomes  much  easier  since  all  systems  now 
use the same hardware and software. 
 
The 5000 Series Testers incorporate the proven power sources and matrix switching 
of the original 5150 and retains all of the basic power-source performance and ease 
of use features. 
 
The  5000  Series  Testers  are  programmed  only  from  the  Windows

®

  PCW  PC 

program.    All  tests  are  individually  selected  from  any  device  family  and  may  be 
intermixed as desired. 
 
The 5000 Series Tester PC software includes the ability to automatically convert test 
programs created with the older 5300PC software to the Windows

®

 software format. 

 
Added capabilities include: 
 

 

Auto-Calibrate

 

 

Software math expressions 

 

True parameter substitution using math expressions 

 

Wafer Mapping Option 

 

Hi-Rel Delta Testing Option 

 

Single test measurement 

 

Improved throughput 

 

Per step scan with Model 6010 Scanner Option 

 

Multiplex capabilities 

 

Curve Tracer Option 

1.1.1 Single Test Measurement 

The Models 5000E and 5300HX provide measured values in a single test application 
for certain tests.  Single test measurements include, but are not limited to: 

  Leakage: 

I

R

, I

CBO

, I

CEO

, I

DSS

, I

DRM

, I

RRM

, I

EBO

, I

GSSF

, I

GSSR

 

  On-State: 

V

CESAT

, V

BESAT

, V

F

, V

T

, V

DSON

, I

DON

, V

O

 

  Breakdown: 

BV

CEO

, BV

Z

 (Zener), BV

EBO

, BV

GKO

 

  Zener/Diode: 

V

F

, I

R

, BV

R

, BV

Z

, ZZ 

  Triac/SCR: 

I

GT

, V

GT

, I

H

 (3 Test Cycles), I

D

, V

T

, V

D

 (Triac only) 

  Transistor: 

h

FE

,  V

BEON

,  I

EBO

,  BV

EBO

,  V

CESAT

,  I

CBO

,  I

CEO

,  BV

CEO

,  V

BESAT

, 

BV

CBO

 

  MOSFET: 

V

GSTH

, I

DSS

, BV

DSS

, V

DSON

, I

GSS

, V

SD

, I

DON

, V

GSON

 

  JFET:   

I

DSS

, BV

DGO

, I

GSS

, I

DOFF

, BV

GSS

, V

DSON

 

  OPTO:   

I

COFF

, I

CBO

, BV

CEO

, BV

CBO

, CTR, V

CESAT

, V

SAT

, I

R

, V

F

 

  Regulator: 

V

OUT

, I

IN

 

  MOV:   

V

N

, I

D

 

  SSOVP: 

V

BO

, I

H

, V

T

, V

Z

, I

D

 

  Opto-Logic: 

V

F

, I

R

, V

OH

, V

OL

, I

FON

, I

FOFF

 

  IGBT 

 

V

GETH

, I

CES

, B

VCES

, V

CEON

, I

GSS

, V

F

, I

CON

, V

GEON

 

Содержание 5000 Series

Страница 1: ... Manual Scientific Test Inc 1110 E Collins Blvd 130 Richardson Texas 75081 www scitest com Email info scitest com Voice 972 479 1300 FAX 972 479 1301 Version 1 23 March 25 2008 Copyright 2005 Scientific Test Inc All rights reserved ...

Страница 2: ......

Страница 3: ...DAMAGED BY ACCIDENT MISUSE NEGLECT IMPROPER PACKING OR IMPROPER MODIFICATIONS OR SERVICE IN THE EVENT THIS PRODUCT SHALL PROVE DEFECTIVE IN WORKMANSHIP OR MATERIALS THE PURCHASER S SOLE REMEDY SHALL BE THE REPAIRS STATED IN THIS WARRANTY AND UNDER NO CIRCUMSTANCES SHALL STI BE LIABLE FOR ANY LOSS OR DAMAGE DIRECT INCIDENTAL OR CONSEQUENTIAL ARISING OUT OF THE USE OF OR INABILITY TO USE THIS PRODUC...

Страница 4: ......

Страница 5: ...he following standard s or other normative document s EN55022 1994 EN50082 1 1992 IEC 801 2 1991 IEC 801 3 1991 ENV 50204 1996 IEC 801 4 1988 EN 61010 1 Following provisions of the Electromagnetic Compatibility 89 336 EEC Directive and Low Voltage 73 23 EEC Directive The Technical Construction File is maintained at Scientific Test Inc at the address listed above The authorized representative locat...

Страница 6: ...ons They are provided for your protection and to prevent damage to the system This safety information applies to all operators and service personnel Symbols and Terms These symbols appear on the equipment ATTENTION Refer to Manual Protective Ground DANGER High Voltage ...

Страница 7: ... of rendering first aid and resuscitation is present Use Care When Servicing With Power On Dangerous voltages which may exceed 2KV exist at several points in this product To avoid personnel injury do not touch exposed connections or components while power is on Disconnect power before removing protective panels soldering or replacing components Disconnect Power To avoid electrical shock disconnect...

Страница 8: ...ent and voltage specified on the rear of each system Use only a power cord that is in good condition Use The Proper Fuse To avoid fire hazard use only a fuse that meets all type voltage and current specifications as shown below IEC 127 5 by 20 mm time lag 1A 250V Type T or IEC 127 5 by 20 mm time lag 2A 120V Type T Do Not Remove Covers To avoid personal injury do not operate the system without the...

Страница 9: ...rough 63 Hz Temperature 25ºC 5ºC Relative Humidity To 50 at or below 30ºC Ventilation Requirements Equipment should be located no closer than 4 cm from the wall in a well ventilated room Installation Overvoltage Catagory II ESD Susceptibility The following areas can be static sensitive Screws seams toggle switches ports and the start stop switch ...

Страница 10: ......

Страница 11: ...cations 1 2 1 1 8 System Checkout 1 3 1 1 9 Options 1 3 1 1 10 Interfaces 1 3 1 2 Software 1 4 1 2 1 Operation 1 4 1 2 2 Error Messages 1 4 1 3 Front Panel Description 1 5 1 3 1 Front Panel Nomenclature 1 5 1 3 2 Load Resistors 1 5 1 3 3 Device Test Jacks with Kelvin Sense Leads 1 5 1 3 4 Device Fixture 1 5 1 3 5 Safety Interlock 1 6 1 3 6 Start From Handler Local Switch LED 1 6 1 3 7 Start Stop P...

Страница 12: ...ontrol Cable Wire List 2 5 2 2 6 Handler Interface Schematic 2 6 2 2 7 Optional Prober Interface 2 6 2 3 Adaptor Control 2 6 2 4 CNTL 12 Auxiliary Board 2 7 2 5 Product Support 2 8 3 THEORY 3 1 3 1 Overview 3 1 3 1 1 Card Cage Backplane 3 1 3 1 2 Analog Board 3 2 3 2 Power Sources 3 2 3 2 1 Hi Source Board 3 3 3 2 2 Lo Source Board 3 3 3 2 3 Relay Board 3 3 3 2 4 Power Supplies and Transformers 3 ...

Страница 13: ... Menu 6 2 6 3 1 Runtime 6 2 6 3 2 Test Programs 6 12 6 3 3 System 6 15 6 3 4 Window 6 16 6 4 Exact Value Popup Menu 6 17 6 4 1 Capture 6 17 6 4 2 Update Display 6 17 6 4 3 Serial Number 6 17 6 4 4 Datalog Mode 6 17 6 4 5 Start 6 18 6 4 6 Measure 6 18 6 4 7 Pass Fail 6 18 6 4 8 Datalog 6 18 6 4 9 Retest 6 19 6 4 10 Excel Spreadsheet 6 19 6 4 11 Print Selected Text 6 19 6 4 12 Copy to Clipboard 6 19...

Страница 14: ... 5 Extended Relay Plan Tab 6 30 6 6 6 ADP 401 Scanner Plan Tab 6 30 6 7 Special Software Options 6 31 6 7 1 Bin 1 Only for Pass 6 31 6 7 2 Device Retest 6 31 6 7 3 Excel Spreadsheet 6 31 6 7 4 Real Time SPC 6 31 6 8 Communicating With STI 5000 Series Tester 6 31 6 8 1 Serial Communications 6 31 6 8 2 Sending Information 6 31 6 8 3 Receiving Information 6 37 7 MAINTENANCE TROUBLESHOOTING 7 1 7 1 Ma...

Страница 15: ...uxiliary Low Source Calibration 7 11 7 4 5 Leakage Compensation 7 11 7 5 System Verification 7 11 7 5 1 High Source Board Verification 7 12 7 5 2 Low Source Board Verification 7 13 7 6 Self Test Error Code Reference Table 7 14 7 7 Error Code Block Diagrams 7 20 8 LOW CURRENT DECK 8 1 8 1 Installation 8 1 8 2 Programming 8 2 8 2 1 Answer Mode 8 3 8 2 2 Soak Time 8 3 8 3 Operation 8 3 8 3 1 External...

Страница 16: ... 10 3 Operation 10 3 10 4 Self Test 10 3 11 MODEL 6010 SCANNER 11 1 11 1 Installation 11 1 11 2 Programming 11 2 12 MULTIPLEXER 12 1 12 1 Description 12 1 12 2 Installation 12 1 12 3 Operation 12 2 12 4 Self Test of the Multiplex System 12 2 12 5 Multiplex Error Messages Self Test Errors 12 3 13 APPENDICES 13 1 Appendix A Oscilloscope Guidelines 13 3 Anode Monitor 13 3 AS to KS Monitor 13 3 GS Mon...

Страница 17: ...O 13 15 13 1 2 Base Pulse Programming BVCEO 13 16 13 1 3 BVCEO SUS 13 16 13 1 4 BVCER S V 13 16 Holding Current Test Method 13 16 MOSFET VGSF and VGSR Tests 13 17 Appendix G Opto Logic ADP 370 13 19 Description 13 19 VF and IR tests 13 20 VOH Test 13 20 VOL Test 13 20 IFON Test 13 20 IFOFF Test 13 21 Hysteresis Calculation 13 21 Appendix H SSOVP Tests Adaptors 13 23 ADP 360 13 23 13 1 5 SSOVP Test...

Страница 18: ...Device Option ADP 340 5G 13 33 Function 13 33 Interconnect Configuration 13 33 IGT 13 35 VGT 13 35 VF 13 36 ID 13 36 VBO 13 37 IG 13 37 IGAS IGKS 13 38 IBO 13 38 IH 13 39 VT 13 39 IR 13 40 10x1000uS Pulse Option Holdover Holding Current 13 41 Self Test ADP 340 4 5 Gated 10x1000 13 42 Calibration 10x1000 Pulse Option 13 48 Appendix J Zener Impedance 13 51 Zener Impedance Tests ZZK ZZT 13 51 Appendi...

Страница 19: ...3 1 16 VF Tests 13 60 13 1 17 VS1 VS2 13 60 Appendix M Sidac Adaptor ADP 360 13 61 Description 13 61 VBO Test 13 61 IBO Test 13 62 VBB test 13 62 IH VT Tests 13 62 VS Test 13 62 IS Test 13 62 RS Test 13 62 Appendix N Relay Tester ADP 390 13 65 Overview 13 65 Installation 13 65 Device Connector Pin Assignments 13 65 Test Operation 13 66 RCOIL Test 13 66 VOPER Test 13 66 VREL Test 13 66 RCONT Test 1...

Страница 20: ...vin Test for SSOVP 14 7 14 3 APP 003 STI Series 5000 Tester SPC Software 14 9 14 4 APP 004 STI Data Information File INF 14 11 14 5 APP 005 Data Logging Binning and Sorting 14 13 14 6 APP 006 Opto Switch 14 17 14 7 APP 007 IEEE 488 Interface Option 14 19 14 8 APP 008 Multiple Testers on One PC 14 23 14 9 APP 009 Excel with Datalog Data 14 25 15 PARTS LISTS SCHEMATICS 15 1 15 1 Component Level and ...

Страница 21: ...f test Fixture Assembly 15 15 15 11 5 A Board Assembly 15 15 15 11 6 G K Board Assembly 15 15 15 12 High Current Deck Assembly 15 16 15 12 1 Front Panel Assembly 15 16 15 12 2 Rear Panel Assembly 15 17 15 12 3 Card Cage Assembly 15 17 15 12 4 Base Plate Assembly 15 17 15 12 5 HC Relay Board Assembly 15 18 15 12 6 125 AMP PA 1 PA 3 Board Assembly 15 18 15 12 7 125 AMP PA 2 PA 4 Board Assembly 15 20...

Страница 22: ... IGBT ICON Test 6 11 Figure 6 6 IGBT ICON vs VCE Curve Trace 6 11 Figure 6 7 Excel Formatted Curve Trace 6 12 Figure 6 8 Mainframe Configuration Screen 6 13 Figure 6 9 Test Program Test Step Tab 6 21 Figure 6 10 Test Program Device Test Edit Window 6 21 Figure 6 11 Test Program Calculation Step Edit Window 6 22 Figure 6 12 Test Program Options Tab 6 25 Figure 6 13 Test Program Bin Sort Tab 6 27 Fi...

Страница 23: ... 7 48 Figure 7 30 Self Test Block 29 7 49 Figure 7 31 Self Test Block 30 7 50 Figure 7 32 Self Test Block 31 7 51 Figure 7 33 Self Test Block 32 7 52 Figure 7 34 Self Test Block 33 7 53 Figure 7 35 Self Test Block 34 7 54 Figure 7 36 Self Test Block 35 7 55 Figure 7 37 Self Test Block 36 7 56 Figure 7 38 Self Test Block 37 7 57 Figure 7 39 Self Test Block 38 7 58 Figure 7 40 Self Test Block 39 7 5...

Страница 24: ... Figure 7 67 Self Test Block 66 7 86 Figure 7 68 Self Test Block 67 7 87 Figure 7 69 Self Test Block 68 7 88 Figure 7 70 Self Test Block 69 7 89 Figure 7 71 Self Test Block 70 7 90 Figure 7 72 Self Test Block 71 7 91 Figure 7 73 Self Test Block 72 7 92 Figure 7 74 Self Test Block 73 7 93 Figure 7 75 Self Test Block 74 7 94 Figure 7 76 Self Test Block 75 7 95 Figure 7 77 Self Test Block 76 7 96 Fig...

Страница 25: ... 2 LM317 Adjustable Voltage Regulator 13 7 Figure 13 3 Opto Adaptor Schematic 13 9 Figure 13 4 Kelvin Test Adaptor 13 11 Figure 13 5 Holding Current Characteristic 13 17 Figure 13 6 Opto Logic Adaptor Schematic 13 19 Figure 13 7 Opto Logic IFON and IFOFF 13 19 Figure 13 8 SSOVP VCLAMP TEST 13 23 Figure 13 9 SSOVP IBO TEST 13 24 Figure 13 10 SSOVP VBO TEST 13 24 Figure 13 11 SSOVP IH TEST 13 25 Fig...

Страница 26: ...x1000 Pulse Option Calibration Screen 13 49 Figure 13 40 Zener Impedance Test 13 51 Figure 13 41 EXT 100 Schematic Diagram 13 53 Figure 13 42 EXT 100 Timing Diagram 13 54 Figure 13 43 Quadrac Diac VBO Test 13 57 Figure 13 44 Quadrac Diac ADP 350 Adaptor 13 58 Figure 13 45 STS Typical Characteristics 13 59 Figure 13 46 Sidac Characteristic 13 61 Figure 13 47 Sidac Test Program Screen 13 63 Figure 1...

Страница 27: ... 1 23 xvii Figure 14 10 APP 005 Sort Plan Screen 14 14 Figure 14 11 APP 005 Datalog Screen for STI Bin Plan 14 15 Figure 14 12 APP 005 Datalog Screen STI Sort Plan 14 15 Figure 14 13 Opto Switch Test Program 14 17 Figure 14 14 Typical Opto Switch 14 17 ...

Страница 28: ... Auxiliary Low Source Calibration 7 11 Table 7 8 High Source Board Verification 7 12 Table 7 9 Low Source Verification 7 13 Table 7 10 Self Test Error Codes 01 33 7 14 Table 7 11 Self Test Error Codes 34 6A 7 15 Table 7 12 Self Test Error Codes 70 B1 7 16 Table 7 13 Self Test Error Codes B2 E3 7 17 Table 7 14 Self Test Error Codes E4 10E 7 18 Table 7 15 Self Test Error Codes 110 123 7 19 Table 8 1...

Страница 29: ...y 600 012 Rev B 15 14 Table 15 11 LCD Front Panel Assembly 15 14 Table 15 12 LCD Rear Panel Assembly 15 14 Table 15 13 LCD Base Plate Assembly 15 15 Table 15 14 LCD Self Test Fixture Assembly 600 009 15 15 Table 15 15 LCD A Board Assembly 600 014 Rev C 15 15 Table 15 16 LCD G K Board Assembly 600 015 Rev E 15 16 Table 15 17 HCD Front Panel Assembly 15 16 Table 15 18 HCD Rear Panel Assembly 15 17 T...

Страница 30: ...TABLE OF CONTENTS xx Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 31: ...are format Added capabilities include Auto Calibrate Software math expressions True parameter substitution using math expressions Wafer Mapping Option Hi Rel Delta Testing Option Single test measurement Improved throughput Per step scan with Model 6010 Scanner Option Multiplex capabilities Curve Tracer Option 1 1 1 Single Test Measurement The Models 5000E and 5300HX provide measured values in a si...

Страница 32: ...esult of a previous test or a new test step reporting the calculation of ratios deltas percentages min max limits etc of two or more previous tests see Section 6 6 1 2 1 1 4 Per Step Scan The 5000 Series Tester allows the Model 6010 Scanner see Section 10 or Appendix Q to be directed independently in the test program This provides a means to test a variety of devices with a single package e g hybr...

Страница 33: ...he High Current Deck provides the ability to perform tests requiring high anode collector currents Model HC 500 and Model HC 1000 provide 500 and 1000 amps respectively Also a Multiplexer Option allows up to 4 test stations to be operated by 5000 Series Test System each station can run a different test program See Figure 1 1 for a system a 3 station Multiplexer a Manual Station MUX 1 DUT a High Cu...

Страница 34: ...rogram has been generated the normal operating method would be to Send the test program to the 5000 Series Tester Capture the measured values to a file screen and or Excel Spreadsheet or Do Go No Go testing Optionally monitor lot summary information as testing occurs If Exact Values were captured to a file this data can be reviewed basic statistics on the data can be generated and or translated fo...

Страница 35: ...l programming to attach networks from anode to gate and gate to cathode for special applications 1 3 3 Device Test Jacks with Kelvin Sense Leads The device lead jacks are labeled A G and K Each of the device leads has a corresponding Kelvin sense lead labeled AS GS and KS Kelvin sense leads are used to compensate for any voltage drop due to cable length In order to provide 50 amps at 4 volts at th...

Страница 36: ...icates handler mode 1 3 7 Start Stop Push Button The start stop button is used in local mode only It starts the test sequence and if in repetitive mode alternately starts then stops the test sequence 1 3 8 Repetitive Single Test Switch LED The repetitive switch is only valid when the Remote Local switch is in the local mode if LED green indicates single and yellow indicates repetitive mode When th...

Страница 37: ...isplay and keyboard on the front panel the 18 character display is used to display system menus bin results measured values and error messages The keyboard is used to scroll through the menus and input operator responses 1 3 11 Adaptor Control Relay Control Connector This 9 pin D Sub connector provides the controls for the relays that are located in the Handler Device Cable with Kelvin Test and ot...

Страница 38: ...1 OVERVIEW 1 8 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 39: ...fuses calibration resistors shorting bar and load mount jack Each 5000 Series Tester is carefully inspected prior to shipment If damages or deficiencies exist determine if they occurred during transit If so file a claim with the shipping agent If the 5000 Series tester is to be returned for repair or service contact the factory for authorization and shipping procedures It is highly recommended to ...

Страница 40: ...hat follow to be assured the unit has been received in good working order Install the Self Test fixture pc board with banana plugs and shorting bar in the interlock jacks Then apply power to tester by turning on power switch located at rear above fan Connect the PC to the 5000 Series Tester via the 9 pin D Sub cable and null modem supplied and run the System Self Test from the 5000 Series Interfac...

Страница 41: ...s if option selected A diode polarity reverse indication relay is also provided if the Auto Polarity Mode is turned ON when programming a diode The end of test and result signals are supplied by the 5000 Series Tester in the form of mercury wetted relay contacts with the following ratings EOT Bins Polarity 1A 50V The start test closure provided by the handler must withstand Start Test 35mA 12 VDC ...

Страница 42: ... results as required Note that EOT has a separate return which may need to be tied to handler common dependent on handler Make connection to handler from the 5000 Series Tester using standard 25 pin D type connector cable Use TRW cinch type DBM 25P for solder connections 3M P N 3482 1000 for ribbon cable or other equivalent HANDLER BOARD 600 040 HANDLER INTLK EOT RETURN K19 EOT K18 BIN FAIL K1 BIN...

Страница 43: ...ndler Timing shown is standard supplied by 5000 Series Tester Any modification to this interface will require a special program contact factory Figure 2 2 Handler Timing Diagram 2 2 5 5000 Series Tester Handler Control Cable Wire List 25p D Sub Plug Cable Color Code Signal Name 1 Black Red Bin 8 2 Red Bin 7 3 Orange Bin 6 4 Orange Green Bin 5 5 Green Bin 4 6 Blue Bin 3 7 Blue Red Bin 2 8 Black Whi...

Страница 44: ...nnect prober 5V to pin 13 and 5V return to pin 12 of the 25 pin D Sub connector labeled HANDLER at rear of the 5000 Series Tester If pulse level is 5V jumper the header labeled 5 located to right of U2 otherwise connect pulse level voltage 1 to 30V to pin 24 Hi Level Connect Start EOT Fail and Bins if ordered from prober to connector pins per schematic For start test jumper appropriate header for ...

Страница 45: ... 16 programmable relay drivers Four of these drivers are duplicated at the front panel Adaptor Control connector Section 2 3 These relay drivers are accessed from the real panel CNTL 12 25 Pin D Sub connector See Section 6 6 4 for complete details in setting these relay drivers Pin Number Name 1 Relay 8 2 Relay 7 3 Relay 6 4 Relay 5 5 Relay 4 CT7 6 Relay 3 CT6 7 Relay 2 CT5 8 Relay 1 CT4 9 N U 10 ...

Страница 46: ... com or info scitest com FAX 972 479 1301 Telephone 972 479 1300 9 00AM to 4 00PM CST When reporting a problem or requesting assistance please include the Mainframe Configuration data This can be obtained using the STI PCW Software main menu Test Programs Mainframe Configuration Click the Check Mainframe button to obtain the STI 5000 Series Tester configuration data Note the PC being used must be ...

Страница 47: ...ans to connect a variety of loads and to switch sources in and out of the circuit as required Shown in Figure 3 1 is the basic test configuration in simplified form DUT is the device under test Figure 3 1 Simplified Test Configuration 3 1 1 Card Cage Backplane The 5000 Series Tester is divided functionally into printed PC boards all of which plug into the card cage and communicate through the back...

Страница 48: ...roper time frame to obtain the result of each test as it occurs See Analog Board Schematic in Parts Lists Schematics section of this manual 3 2 Power Sources Two power sources are used for device excitation The Hi Source is applied across the device main terminals collector emitter anode cathode etc and the Lo Source is applied to the device control terminal Ranges and limits of the two sources ar...

Страница 49: ...d circuitry that controls the source element 3 2 2 Lo Source Board The Lo Source Board drives the base gate of the device under test and operates in much the same way as the Hi Source Board In fact both source boards use the same printed circuit board with silk screened identifiers to indicate differences Notes on the POWER SOURCE schematic indicate parts differences The primary difference in the ...

Страница 50: ...lator on the Analog I O Board The DC power supply has current limiting circuits and will shutdown in case of an over load or short Overload circuits will reset on power down See Chassis Interconnect Schematic in the Parts Lists Schematics section of this manual for additional information 3 3 Test Sequence A typical test sequence occurs as illustrated in Figure 3 2 Variables include rise times of e...

Страница 51: ...for higher current devices Check for oscillation using a scope attached at the collector of the device Attach the scope ground to the jack below the power switch Do not attach scope ground to any pin of the device in test Run an exact value measurement of hFE Run in the repetitive mode The test takes half a second to run and the collector can be observed to determine the end of the test There shou...

Страница 52: ...3 THEORY 3 6 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 53: ...bs 5 Powered from 5000 Series Tester MODEL HC 500 Hi Current Deck 17 432 x20 508 x10 5 267 35lbs 15 9 Powered from 5000 Series Tester MODEL 6010 Scanner 17 432 x20 508 x10 5 267 40lbs 18 2 Powered from 5000 Series Tester Multiplexer 16 5 419 x10 5 267 x8 203 11lbs 5 Powered from 5000 Series Tester Manual Station 16 5 419 x10 5 267 x8 203 8lbs 3 6 Powered from 5000 Series Tester 1 Refer to Section ...

Страница 54: ...0NA IF IB 1 5NA ON STATE VCESAT VBESAT VBEON VF VT VDSON IDON VGSON VGEON VF Opto Diode VCE VD VF VT 10V to 5 00V to 9 99V VGS VGE VBE VF 10V to 9 99V IE VT IF ID 10µA to 49 9A 99 9A 4 derate to 25A 50A 4 IB IF IGT 100NA to 10A 40A 7 1MV V 1 10MV IE IF ID IT 1 100NA IB IGT 1 5NA RDSON 1 0mΩ to 1KΩ ID IC 10µA to 49 9A 99 9A 0 1mV 1 0 5mΩ VGSTH VGETH 10V to 49 9V ID 100µA to 3A 1MV 1 10MV VO Regulat...

Страница 55: ...R IDRM IRRM IGKO VDRM VRRM BVGKO VTM IGT VGT IL IH MOSFET IDSS F IGSSF IGSSR BVDSS VGSTH gFS VDSON VSD IDON VGSON Diode IR BVR VF Zener IR BVZ ZZ 1KHz VF Opto Coupler ADP 310 ICOFF ICBO IR BVCEO BVCBO CTR hFE VCESAT VSAT COUPLED VF Regulator ADP 320 Regulation VO VIN MOV Transient Suppressor ID ID VN VN VC VC J FET IGSS IDOFF IDGO BVDGO BVGSS IDSS IDSON VGSOFF Opto Switch ICOFF VD Notch IGT1 IGT4 ...

Страница 56: ...4 SPECIFICATIONS 4 4 Version 1 23 MODEL 5000 SERIES MANUAL 4 4 Model 5300HX Test Specifications ...

Страница 57: ...to 25A 250A 4 derate to 3A IF IB 100NA to 10A 01 hFE 0001 CTR VCE 1 10MV IC 1 100NA IF IB 1 5NA ON STATE VCESAT VBESAT VBEON VF VT VDSON IDON VGSON VGEON VF Opto Diode VCE VD VF VT 10V to 5 00V to 9 99V VGS VGE VBE VF 10V to 9 99V IE VT IF ID 10µA to 49 9A 500A 4 derate to 25A 250A 4 IB IF IGT 100NA to 10A 40A 7 1MV V 1 10MV IE IF ID IT 1 100NA IB IGT 1 5NA VGSTH VGETH 10V to 49 9V ID 100µA to 3A ...

Страница 58: ...FICATIONS GATED DEVICES TEST SPECIFICATION PARAMETER V RANGE I RANGE MAX RES ACCURACY LEAKAGE IG IGKS IGAS ID IR 10V to 600V 1 0NA 20PA 2 to 200MA 0 1NA 1PA 2 1 0 5NA 20PA V 1 200PA 2PA V 2 ON STATE VF VT 10V to 5 00V to 9 99V 10µA to 49 9A derate to 25A 1MV V 1 10MV TRIGGER IGT VGT VGG 10V to 600V VGT 10V to 20V 80V 3 1 0µA to 3A RL 12 30 100 Ω EXT VGA 50V RL 100 Ω 10NA 1mV 1 5NA 1 10mV HOLD IH V...

Страница 59: ...O VIN MOV Transient Suppressor ID ID VN VN VC VC J FET IGSS IDOFF IDGO BVDGO BVGSS IDSS IDSON VGSOFF Opto Switch ICOFF VD Notch IGT1 IGT4 VON VSAT coupled ION IGT1 IGT4 IOFF IGT1 IGT4 Diac ADP 350 VV VV ΔV VBO VBO IBO IBO Symmetry ΔV Opto Logic ADP 370 IR IFON VOL Hysteresis IFOFF VOH SSOVP ADP 330 ADP 340 4 IDRM IRRM VCLAMP VCLAMP VZ VZ VT VT IH IH VBO VBO IBO IBO SSOVP ADP 340 5 Tip Com Ring Com...

Страница 60: ... Power Curve for Leakage and Breakdown Tests 450V 900V2 700V 1400V2 1000V 2000V2 50 200 1000 BREAKDOWN and LEAKAGE TESTS1 3000 200 100 FOR SSOVP OPTION CURRENT IS 900mA 1 5A NOTE 1 SEE TABLE 4 2 NOTE 2 2KV OPTION NOTE 3 40A GATE OPTION 20V Gate 80V Gate Option 20 80 10 403 5 mA VOLTS VOLTS AMPS ...

Страница 61: ...urrent Options 5 10 25 50 10 30 50 VOLTS AMPS ON STATE and GAIN TESTS1 GAIN FULL CURVE MAX ON STATE VOLTS 10V NOTE 1 SEE TABLE 4 2 5 10 15 20 250 5002 500 10002 VOLTS AMPS HIGH CURRENT OPTIONS 1 HC 500 HC 1000 GAIN FULL CURVE MAX ON STATE VOLTS 10V NOTE 1 SEE TABLE 4 2 NOTE 2 HC 1000 OPTION 250A 500A2 50A 100A2 ...

Страница 62: ...4 SPECIFICATIONS 4 10 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 63: ...est program that has been previously saved would be as follows Connect the computer to the 5000 Series Tester via the supplied RS 232 cable and supplied Null Modem adaptor The 5000 Series Tester has a connector on the back panel labeled RS 232 Turn on the main power switch at rear panel of the tester Allow the system to warm up for 15 minutes The test system has been calibrated at the factory to p...

Страница 64: ...5 BASIC OPERATION 5 2 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 65: ...the STI PCW program was unable to read the registry file This is normal and should be ignored The registry file is updated when the STI PCW program is closed Create a shortcut if desired to the STI PCW program and move it to the desktop Launch the STI PCW program by double clicking on the STI logo Use the mouse or the ALT key combination to access the main menu Use the Sub Menu Key or right mouse ...

Страница 66: ...I 5000 Series Tester to the top menu same as pressing the EXIT key on the front panel of the STI 5000 Series Tester NOTES Please report any bugs or problems with this software If possible include a brief description of the problem and actions taken just prior to the problem The Communications Baud rate of 9600 is specifically for STI 5000 Series Testers with a V53 SBC The newer A486 SBC will work ...

Страница 67: ...xer option has been selected operates the selected multiplexer station test from the PC Note the multiplexer must be connected and the multiplexer self test fixture must be connected to the selected station The multiplexer station pass fail result is displayed at the PC instead of the STI 5000 Series Tester 6 3 1 3 6 LED Test Operates the STI 5000 Series Tester front panel LED s Each LED is turned...

Страница 68: ...AC 500 Auto Verification Option contact factory The STI 5000 Series Tester Auto Verify steps can be run individually To run all Auto Verify steps and create a report use the Exact Value window 6 3 1 4 Tester Control The Tester Control window provides the means to set various STI 5000 Series Tester global functions equivalent to setting these options from the STI 5000 Series Tester front panel keyb...

Страница 69: ...en using the right mouse button The basic settings of both panels including size are saved when the window is closed and restored when the window is opened The width of the panels may be changed by placing the mouse on the panel divider holding the left mouse button and moving the divider to the desired location If Lot Summary is enabled current data is retrieved from the STI 5000 Series Tester fo...

Страница 70: ...de counts 6 3 1 7 1 2 STI Spreadsheet File Creates the STI spreadsheet ASCII comma delimited file This file may be imported into any spreadsheet program that handles standard comma delimited format 6 3 1 7 1 3 STI Columnar Report File Creates the STI columnar report file This is a standard ASCII file the individual lines may be longer than acceptable by the word processor The Print Columnar select...

Страница 71: ...nd column data along with the Bin and Sort results is encoded in the datalog data file Creating a wafer map requires first generating the datalog data file with the required encoded mapping information This is accomplished by selecting the Runtime Tester Controls menu selection and then clicking the Wafer Map button The Wafer Map button should display Wafer Map Off before and then Wafer Map On aft...

Страница 72: ... is optional Optional information is provided to make the generated map more readable and complete NOTE If the wafer map is by logical bin the test program allows for up to 16 logical bins however the prober card only allows for up to 8 logical bins If a bin is resolved in the datalog data file that is not defined in the wafer map configuration then that die will be represented with the color blac...

Страница 73: ... are distinct so that and suitable for the Monitor and or the printer being used Click the Create Wafer Map button to view the map see Figure 6 2 for an example The size of the actual wafer map is scaled to fit the wafer map window Click the Print Wafer Map button to obtain a printed copy of the wafer map The wafer map will be recreated and scaled to fit the printer selected Figure 6 2 Example Waf...

Страница 74: ...The X Axis increments are programmable in two gradations to allow for more data points in the area of interest In the example shown in Figure 6 6 the VCE is programmed in 0 2V increments from 0 2V to 3 0V and then in 1 0V increments from 3 0V to 10 0V Likewise The VGE can be programmed in two gradations Again as shown in Figure 6 6 the VGE is programmed 0 5V increments for the entire 6 0V to 7 5V ...

Страница 75: ...d a graphical representation of the curve is plotted on the screen see Figure 6 6 Figure 6 6 IGBT ICON vs VCE Curve Trace The Load Entries and Save Entries buttons allow the user to save the entries made for the particular Curve Trace or to load previously saved entries file type of CTE Note the test program with the test of interest as the same test step must be loaded and selected otherwise an e...

Страница 76: ... 5V VGS 6 0V VGS 5 5V VGS 5 0V Figure 6 7 Excel Formatted Curve Trace 6 3 2 Test Programs 6 3 2 1 Mainframe Configuration Allows the PCW software to be matched to the STI Series 5000 Tester NOTE if a password has been set the correct password must be entered before continuing These settings are correctly matched when the system is purchased It is not recommended that these be changed unless new op...

Страница 77: ... 6 3 2 1 4 Anode Max Current The 50A selection is standard select 500A or 1250A if the High Current Deck Option is attached to the STI 5000 Series Tester 6 3 2 1 5 Gate Max Voltage The 20V selection is standard select 80V if the 80V Low Source Option is in the STI 5000 Series Tester 6 3 2 1 6 Gate Max Current The 10A selection is standard select 50A if the 50A Low Source Option is in the STI 5000 ...

Страница 78: ...his menu item provides a sub menu Set Default Names loads the default device test names for use Load User Names loads from file previously saved device test names Edit Current Names o Opens a dialog box with a list of the devices o Double click on the desired device to list the current test names o Double click on the test name to edit the test name appears in the Edit box o Click the Update butto...

Страница 79: ...he USB Serial Adaptor and baud rate Note the default baud rate of 38 4K baud should be maintained change in this item will require a equivalent change in the STI 5000 Series Tester baud rate 6 3 3 2 Default Paths Set the starting search path for STI Test Programs data files and lot summary files 6 3 3 3 Password Use the password to protect the Test Program Generator and Mainframe Configuration fro...

Страница 80: ...display showing the same indications as when the tester is first powered on NOTE if the display on the STI 5000 Series Tester shows STI Download when the tester is turned on use this selection to reload the operating firmware into the tester or see Section 7 1 4 6 3 3 6 About Provides PCW Version and copyright information Click on the Release info line to display custom options installed 6 3 3 7 P...

Страница 81: ...ult the current date and time are stamped in the START field if a new datalog information file is being created Note double click within either the START or STOP fields stamps the current date and time in that field NOTE Any test data displayed in the Exact Value window prior to selecting Capture will not be written to the file 6 4 2 Update Display Toggles the displaying of datalog data to the win...

Страница 82: ...Every Nth Sort 1 Datalog in go no go mode only except every nth Sort 1 qualifying part datalog exact value 6 4 4 5 Datalog if Sort Datalog exact value only if specified sort qualifies all others datalog in go no go mode 6 4 4 6 Datalog if Not Sort Datalog exact value only if qualified sort not the one specified 6 4 5 Start Issues a start test sequence command to the STI 5000 Series Tester 6 4 6 Me...

Страница 83: ...sent directly to the Excel workbook sheet 1 Column headings are added as required Single test measure data is sent directly to the Excel workbook and is placed in sheet 2 of the workbook 6 4 11 Print Selected Text Using the mouse highlight the area of the Exact Value window desired and then select this option to send the highlighted text to the printer 6 4 12 Copy to Clipboard Copies the highlight...

Страница 84: ... speed buttons are provided for commonly used functions They are Send Button Sends the test program in memory to the STI 5000 Series Tester NOTE after the test program is successfully sent the Exact Value window will be opened or brought to the front if already open Save Button Saves the test program in memory The default file name is the one used when the test program was first opened or last sav...

Страница 85: ...ally updated to reflect the insertion or deletion If the step being deleted is referenced by a calculation step an error message is displayed indicating that the step cannot be deleted until the reference is changed or the calculation step deleted Figure 6 9 Test Program Test Step Tab 6 6 1 1 Device Test Step Figure 6 10 Test Program Device Test Edit Window ...

Страница 86: ... A may be entered as o 0 455 o 455 o 455m The entry made is stored internally as a 12 bit DAC value and range which may result in some rounding differences between the value entered and the value displayed Other entries are radio buttons allowing the choice of one of several possibilities Parameter substitution of either Bias 1 or Bias 2 is allowed Use the key to toggle between bias entry value an...

Страница 87: ...ected constant if selected is inserted into the expression at the cursor location Similarly the text of the selected function if selected is inserted into the expression at the cursor location with the required leading parenthesis The list of functions also shows the required number of arguments Each function argument is separated by The IF x y z function is specifically implemented for parameter ...

Страница 88: ...uto range AR Auto range Down Only AR D or no Auto range Press the F4 key to toggle the Auto range between Auto range AR Auto range Down Only AR D or Auto range Off If Auto range is off the test is performed at the programmed entries and if the answer is out of range an over under range is reported If Auto range Down Only is selected then the tester will only auto range down to obtain an answer and...

Страница 89: ...erted or added with the appropriate step editor is invoked for each copied test 6 6 2 Options Tab Allows for the selection of various global options to be selected Figure 6 12 Test Program Options Tab 6 6 2 1 Bin Mode Selects the desired Binning mode to be used see Section 6 6 3 for complete details 6 6 2 2 A K Short Bin At the start of each test sequence the tester checks for any shorts between t...

Страница 90: ...sequence and if failed the test sequence is aborted the selected Kelvin Bin is asserted at the handler and the message KELVIN is displayed at the front panel of the STI 5000 Series Tester Default is Kelvin off 6 6 2 4 1 Kelvin Bin Selects the Handler Bin desired if a kelvin test fails The default kelvin bin is eight 6 6 2 4 2 Kelvin Limit Selects the limit to use to determine the kelvin failure Th...

Страница 91: ...ssociated with any sort As an example the following Sorts and Bins are programmed Sort 1 Bin 2 Sort 2 Bin 3 Sort 3 Bin 4 Sort 4 Bin 2 Sort 5 Bin 5 Sort 6 Bin 2 Sort 7 Bin 4 Sort 8 Bin 6 The above example would provide the following decision sequence If Sort 1 qualifies report Sort 1 Bin 2 Else If Sort 4 qualifies report Sort 4 Bin 2 Else If Sort 6 qualifies report Sort 6 Bin 2 Else If Sort 2 quali...

Страница 92: ...d SORT FAIL is displayed at the front panel If the Multiple Bins item is selected then all possible bin assignments that correspond to a qualifying sort are sent to the handler or prober 6 6 3 4 The STI Bin Sort mode functions as follows RUNS ONLY THOSE TESTS REQUIRED TO QUALIFY TO A SORT NO TESTS ARE RE RUN The sort with lowest sort number and lowest bin number is selected first Each programmed t...

Страница 93: ...ick to edit the qualify assignments By default any new test step entered will have the Sort 1 qualifier set to Pass P Possible qualifiers are P for Pass F for Fail and for Ignore 6 6 3 9 EOP EOF Assignments Double click to edit the EOP EOF assignments An X signifies a test to End on Pass or Fail 6 6 3 10 Multiple Bins Specifies the multiple bin option If checked all valid sorts with a bin assignme...

Страница 94: ...in Module set the relay plan automatically when a test is created or edited If for any reason another relay is set or reset manually this manual operation must be re done every time the test is edited 6 6 5 Extended Relay Plan Tab Requires the STI EXT 100 option The External test step requires this option 6 6 5 1 Relay Name Double click to enter or edit a relay name The name may be any combination...

Страница 95: ...200MHZ 6 7 4 Real Time SPC This option provides for the collection of SPC data in real time Requires that Qualitran SPC PI software be installed and the hardware firmware and software of the STI Series 5000 Tester be upgraded Refer to STI Application Note APP 003 for details in using this option 6 8 Communicating With STI 5000 Series Tester 6 8 1 Serial Communications The STI 5000 Series Tester us...

Страница 96: ...ables Test Fail counts in Live Lot Summary E NULL NULL NULL Resets System Top Menu M NULL NULL DATALOG OFF Toggles datalog off M NULL NULL DATALOG ALL Toggles datalog on M NULL NULL DATALOG EVERY number Datalog only every Nth part M NULL NULL DATALOG IF BIN sort Datalog only if Sort specified qualifies M NULL NULL DATALOG IF NOT BIN sort Datalog only if Sort specified does not qualify N NULL NULL ...

Страница 97: ...ULL NULL D Prepare to load new firmware A486 CPU only U NULL NULL E Customer Specific U NULL NULL F Customer Specific U NULL NULL G Reserved U NULL NULL H sta Set the specified multiplex station as current U NULL NULL I Customer Specific U NULL NULL J bin count Set the specified alarm bin must be exactly 2 characters e g 04 to the specified count U NULL NULL K rate Set the system to the specified ...

Страница 98: ... M sta DATALOG EVERY number Datalog every Nth part for specified station X M sta DATALOG IF BIN sort Datalog only if specified sort qualifies for specified station X M sta DATALOG IF NOT BIN sort Datalog only if specified sort does not qualify for specified station X R sta A T60 program binary to follow for the specified station and unsigned long checksum Sends back the character M X T sta GO NOGO...

Страница 99: ... NULL 0x00 All characters must be upper case and exactly as shown including spaces Numbers if required must follow the COMMAND STRING without any spacing in ASCII format Checksum must be computed as follows must have the CRC Table available from Scientific Test Inc void init_crc32 unsigned long crc crc 0xffffffff void update_crc32 unsigned long crc unsigned char ch int k k crc ch 0x000000ffL crc c...

Страница 100: ...Active Multiplex Station 0 indicates no multiplex o Program Name up to 8 characters o 0x03 Self test data from the STI 5000 Series Tester is as follows o 0x07 o Self Test result in ASCII e g CHECK OUT GOOD o 0x03 Live Lot Summary Data is as follows o 0x02 o 0x04 o Program Name o unsigned long Kelvin count o unsigned long total count o unsigned long total fail count o 0x03 o 0x02 o 0x06 o integer S...

Страница 101: ...acter These control characters are 0x01 Multiplex Control followed by the multiplex station ASCII All data following this control character and station number is associated to the specified multiplex station 0x02 All data between this control character and 0x03 is Lot Summary Data 0x03 Special Data End control character 0x04 All data between this control character and 0x03 is System Configuration ...

Страница 102: ...6 PC SOFTWARE 6 38 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 103: ...ux 7 1 3 Run Self Test Every Usage On power up system self test and Lo Current Deck self test if applicable should be run This will verify tester is operating properly See section 7 2 for system self test and section 8 4 for Lo Current Deck self test 7 1 4 Firmware Software Update Tester execution software is stored on flash memory located on the CPU board This software can be updated via the PCW ...

Страница 104: ...k can be run Refer to the troubleshooting section 7 3 for additional information if an error occurs It is recommended that the self test routine be run for an extended period 5 minutes to overnight to check for intermittent operation of relays Click the Repeat Single button on STI Front Panel window to toggle from single mode to repetitive mode and then click the Start button on the System Self Te...

Страница 105: ... panel select Runtime Self Test LED Test menu The 32 LED s will be turned on and then off in sequence and then all turned on and then off until the menu item is selected again 7 3 Troubleshooting This section will assist you in locating and repairing a failure as reported from the system self test error code Before proceeding with troubleshooting it is recommended that you read section 3 0 Theory ...

Страница 106: ...atics diagnose the problem and replace repair parts as required If you have a spare board complement substitute boards one by one until the problem clears Repair or return the faulty board to the factory for repair 7 3 1 Extender Board and Cables Individual PC boards may be extended above the card cage for troubleshooting Included with the 5000 Series Tester is an extender board and extension cabl...

Страница 107: ...older a new component onto the remaining leads of the old one is not recommended as it is likely to cause poor mechanical and electrical joints 7 3 3 Block Tests The mainframe self test consists of blocks each of which can produce one or more error codes To run an individual self test block Runtime Self Test System Block menu Enter the desired block number or use Up Down arrow keys Click the Start...

Страница 108: ...astrophic protection 7 3 5 External Relay Driver Handler Board Jumper Settings The following tables show the required jumper selections for the External Relay Driver board NOTE the jumper settings are dependent upon the type of adaptor being controlled If problems controlling a specific adaptor occur verify these settings EXTERNAL RELAY DRIVER BOARD Board For JP 1 JP 2 JP 3 JP 4 JP 5 JP 6 MOV2500 ...

Страница 109: ...inates the need for manual calibration in most cases Calibration consists of measuring and adjusting if necessary 1 DC power supply voltages and 2 precision voltage levels on the PC boards A four digit DVM of 0 1 or better accuracy is required for the voltage measurements calibrated and traceable to standards Allow system to warm up for at least 15 minutes before calibrating 7 4 1 Power Supply Vol...

Страница 110: ...e leads to be connected to each other even if a load is not required That is connect G to GS K to KS and A to AS If a Scientific Test fixture is used these connections are made If a load is required for the calibration step connect the load to the fixture be sure the correct fixture is used that is A K or G K It is not recommended that these calibration steps be made without using the proper fixtu...

Страница 111: ...elay R86 TP 1 0 1 V TP 1 GS 0 5 mV None CAL SYS 25 Relay R82 TP 2 0 1 V TP 2 GS 2 0 5 mV None CAL SYS 26 Relay R83 TP 3 0 1 V TP 3 AS 2 0 5 mV None CAL RMS 27 2 Relay R121 U103 6 0 1 V 0 00 V 0 1 mV None Run Test 3 28 2 Relay R104 READ DISPLAY 3 0 005 Max 4 N A Short A K Run Test 3 29 2 Analog R32 READ DISPLAY 3 1 00 Ω 0 01 Ω 1Ω A K OR 10 0 Ω 0 1 Ω 10 Ω A K CAL SYS 30 Lo Source R18 GS 0 1 V 100 1 ...

Страница 112: ... Step 2 VD 90 0V 6 100K A K 39 Lo Source N A Display NPN Transistor VBESAT 9 0V IB 900µA IC 1 0mA Step 3 VBESAT 9 00 V 0 09 V 10K G K 40 Lo Source N A Display PNP Transistor VBESAT 9 0V IB 900µA IC 1 0mA Step 4 VBESAT 9 00V 0 09 V 10K G K 41 Relay N A Display NPN Transistor BVCE 90V IC 900µA Step 5 BVCEO 90 0 V 1 0 V 100K A K 42 Relay N A Display PNP Transistor BVCE 90V IC 900µA Step 6 BVCEO 90 0 ...

Страница 113: ... LCD HCD Hi Current Deck front panel LCD attached between tester and HCD Handler Cable End of handler cable Attach 100 MΩ 1 resistor between A AS and K KS terminals Use Axial Diode fixture if available Enter DIODE IR test VR 200V IR 2 µA Measure IR and adjust R36 on Relay Board for IR 2 00µA 0 2µA R36 on the Relay Board is located in the upper right hand corner of the board It is not necessary to ...

Страница 114: ...0KΩ A K 2 9 1mA 89 10V 90 90V 1 100KΩ A K 2 10 1mA 89 10V 90 90V 1 100KΩ A K 2 11 1mA 89 10V 90 90V 1 100KΩ A K 2 12 1mA 89 10V 90 90V 1 100KΩ A K 2 13 10mA 49 50V 50 50V 1 10KΩ A K 3 14 10mA 49 50V 50 50V 1 10KΩ A K 3 15 10mA 4 950V 5 050V 1 1KΩ A K 4 16 10mA 4 950V 5 050V 1 1KΩ A K 4 17 100mA 29 70V 30 30V 1 1KΩ A K 4 18 100mA 29 70V 30 30V 1 1KΩ A K 4 19 1A 0 984V 1 016V 1 6 1 0Ω A K 5 20 1A 0 ...

Страница 115: ...1 5 1MΩ G K 2 4 10μA 1 97μA 2 03μA 1 5 1MΩ G K 2 5 100μA 19 7μA 20 3μA 1 5 1MΩ G K 2 6 100μA 19 7μA 20 3μA 1 5 1MΩ G K 2 7 1mA 8 87V 9 13V 1 5 10KΩ G K 3 8 1mA 8 87V 9 13V 1 5 10KΩ G K 3 9 10mA 14 8V 15 2V 1 5 10KΩ G K 3 10 10mA 14 8V 15 2V 1 5 10KΩ G K 3 11 100mA 1 97V 2 03V 1 5 100Ω G K 4 12 100mA 1 97V 2 03V 1 5 100Ω G K 4 13 1A 14 8V 15 2V 1 5 100Ω G K 4 14 1A 14 8V 15 2V 1 5 100Ω G K 4 15 10A...

Страница 116: ...ircuit 06 HS F2 F4 K16 K1 U5 U15 07 Self Test Block 3 RB K18 K27 K106 HS K1 08 RB S1 09 Self Test Block 4 RB K3 K5 K6 K7 K17 10 Self Test Block 5 RB U34 11 RB K15 K24 K25 K37 12 Self Test Block 6 RB K27 U5 13 RB K2 K16 K101 F1 14 1 Self Test Block 7 RB K33 K34 R15 15 RB K18 S2 16 Self Test Block 8 RB R15 17 RB K20 K21 Q1 Q2 HS K10 18 Self Test Block 9 See Block 19 RB K2 K17 20 Self Test Block 10 S...

Страница 117: ... K13 R21 U29 RB S2 43 Shutdown 44 Self Test Block 23 HS K14 R23 45 HS K13 R23 46 N A 47 Self Test Block 24 HS R28 48 HS R28 49 HS K12 50 Self Test Block 25 HS R27 51 HS R27 52 HS K11 U29 53 Self Test Block 26 HS R26 54 HS R26 55 HS K10 56 Self Test Block 27 HS R24 57 HS K8 K9 R24 58 See Block 59 Self Test Block 28 HS K6 K7 R22 60 RB K20 K21 HS K6 K7 R22 61 See Block 62 Self Test Block 29 HS K16 R2...

Страница 118: ... See Block 83 Self Test Block 34 See Block 84 See Block 85 Self Test Block 35 HS U3 U28 CR11 86 Self Test Block 36 HS U2 U28 CR10 87 88 Self Test Block 37 RB S2 U29 U30 K14 89 Self Test Block 38 RB S1 S2 U29 U30 90 Self Test Block 5 HS U27 91 Self Test Block 39 HS U9 Q25 92 See Block 93 Self Test Block 40 Shutdown 94 HS U29 95 Self Test Block 35 Shutdown 96 Self Test Block 36 Shutdown 97 Self Test...

Страница 119: ...Self Test Block 57 LS K11 C4 Self Test Block 58 LS K10 C5 Self Test Block 59 LS K8 K9 C6 Self Test Block 60 LS K6 K7 C7 Self Test Block 61 LS K4 K5 C8 Self Test Block 61 Self Test Block 78 LS U26 C9 Self Test Block 78 LS K2 K3 Lo Source 50A Option Only CA Self Test Block 80 LS K14 D0 Self Test Block 55 LS K1 K14 R23 RB K3 K20 D1 LS K13 CR7 CR8 R127 RB K23 D2 Self Test Block 56 LS K12 R28 RB K12 K2...

Страница 120: ...ock F0 Self Test Block 67 LS U29 Q25 F1 See Block F2 Self Test Block 68 HS CR27 F3 HS CR27 F4 Self Test Block 69 HS CR24 F5 HS CR24 F6 Self Test Block 71 RB K31 F7 Self Test Block 72 RB K32 F8 ADC Check FE 2 Self Test Block 70 RB K22 LS K1 K15 K17 U2 U3 FF 2 RB K101 R33 LS K1 U29 C69 101 Self Test Block 90 HS C5 102 NB K2 HS K2 103 HS C68 K15 104 NB K2 HS C68 U2 U3 105 NB C104 K2 106 NB C104 107 S...

Страница 121: ... NB K5 S2 122 Self Test Block 95 NB S2 123 Self Test Block 95 NB K5 124 Self Test Block 84 RB U102 S101 K102 125 RB K102 126 Self Test Block 96 ER K1 K2 127 Self Test Block 98 ER K2 128 Self Test Block 99 ER K4 129 Self Test Block 97 ER K7 K8 130 ER K8 131 ER K7 132 Self Test Block 100 ER K3 133 ER K3 Table 7 15 Self Test Error Codes 110 123 NOTES 1 Leakage under RB K13 2 This block may be duplica...

Страница 122: ...ollowing block diagrams provide simplified circuits of the portion of the tester being checked waveforms and fault conditions to help troubleshoot error codes that occur during self test The limits shown are for the standard 5000 Series tester 1KV 50V Anode 20V Gate All relays are shown as positioned to pass ...

Страница 123: ...tuck Pos Reg Voltage Hi When running System Test if Block 1 fails and not EC 01 or 02 then block is re run with the following changes to determine if EC 03 or 04 The Hi Src 10mA range is on 1mA range is off 03 VAK 0 3V Front Panel Interlock OpenK1 K16 Stuck U110 U111K2 welded fuse F3 on Hi Src except with Electronic K2 J5 Connector misaligned U3 U22 U29 12V Power Supply U29 K4 Stuck NO 04 VAK 53V ...

Страница 124: ... 1 2 J5 1 2 J6 5 6 J5 5 6 8V Pulse F B K16 K3 5 6 7 17 RL IHI 1mA 10mA RANGE R1 VAK 60V 60V 0 IN BUS J1 31 U17 60V ERROR FAULT RELAY BOARD HI SRC 05 VAK 75V Negative Reg Voltage Hi 06 VAK 53V F2 F4 Open K16 Open K1 Short U5 U15 This test uses the negative rail of the Hi Src to confirm correct Hi Src pre regulation voltage Items in parentheses are for 100V Hi Src Option ...

Страница 125: ...INBUS V AK 20 2 5V U1 J6 1 2 J5 1 2 J6 5 6 J5 5 6 5V Pulse F B K16 K3 5 6 7 17 RL IHI 1mA 10mA RANGE R14 F B 10 R13 K1 VAK 50V 50V 0 IN BUS J1 31 U17 ERROR FAULT RELAY BOARD HI SRC 07 VAK 52V K18 K27 Open K106 Stuck K1 Open 08 VAK 48V S1 Trace Voltage Path A positive 50V is programmed at the Anode terminal Confirms Gain of 10 operation ...

Страница 126: ...LAY BD A G K INBUS V AK 20 0V U1 J6 1 2 J5 1 2 J6 5 6 J5 5 6 F B K16 K3 5 6 7 17 RL IHI 1mA 10mA RANGE R14 F B 10 VAK 0V IN BUS J1 31 U17 5V Pulse 50V ERROR FAULT RELAY BOARD HI SRC 09 VAK 1 4V K3 K5 K6 K7 K17 Shorted High Resistance Leakage K4 Stuck This test applies 50V ahead of load relays Confirms load relays are open ...

Страница 127: ... 25 37 30V J1 25 26 K11 12 13 ERROR FAULT RELAY BOARD HI SRC 10 IHI 0 03mA U34 11 IHI 0 03mA K15 K24 K25 Shorted K37 Shorted both NO NC If Block 5 fails running System Test and EC is not 90 the block is re run to determine EC 10 or 11 with the following changes The Hi Src 1mA 100μA ranges instead of 10μA range and RGK Ext is not in 90 Shutdown U27 output low A 30V pulse is applied ahead of the Lo ...

Страница 128: ... AK 20 3 25V VAK 65V U1 J6 1 2 J5 1 2 J6 5 6 J5 5 6 F B K2 BOOSTER NC K16 RL IHI 1mA 10mA RANGE F B 10 R14 IN BUS J1 31 65V 0V U17 BLOCK 6 K27 NO F1 ERROR FAULT RELAY BOARD HI SRC 12 VAK 70V K27 Stuck U5 not Operated 13 VAK 60V K2 Open K16 Stuck F1 Open K101 Open A positive 65V is programmed Checks functionality of booster and associated relays ...

Страница 129: ...V 700V U1 J6 1 2 J5 1 2 J6 5 6 J5 5 6 F B BOOSTER NC K16 RL IHI 1mA 10mA RANGE K33 K34 100 F B 100 R14 K19 IN BUS J1 31 350V 700V 0V U17 BLOCK 7 R13 ERROR FAULT RELAY BOARD HI SRC 14 VAK 360V 720V K33 Shorted K34 Open R15 Low 15 VAK 340V 680V K18 Shorted S2 A positive 350V is programmed Checks Gain of 100 and monitor divide by 200 Items in parentheses are for 2KV Option ...

Страница 130: ... 6 J5 5 6 F B BOOSTER NC K16 RL IHI 1mA 10mA RANGE F B 10 IN BUS J1 31 900V 1800V 0V U17 BLOCK 8 R13 K20 K21 ERROR FAULT RELAY BOARD HI SRC 16 VAK 920V 1840V Trace voltage path recheck Block 7 EC 14 R15 low 17 VAK 850V 1700V K20 Stuck K21 Breakdown Leakage Q1 Q2 K10 Open A positive 900V pulse is programmed Checks circuitry and relays for breakdown and leakage Items in parentheses are for 2KV Optio...

Страница 131: ...ELAY BD A G K U1 J6 1 2 J5 1 2 J6 5 6 J5 5 6 F B K16 RL 0 IHI 1mA 10mA RANGE R14 F B 10 IN BUS J1 31 U17 5 0V Pulse INBUS V AK 20 2 5V VAK 50V 50V 0V K17 ERROR FAULT RELAY BOARD HI SRC 18 VAK 53V Trace voltage path Re check Block 3 EC 07 19 VAK 45V K17 Open K2 shorted to NO A positive 50V is programmed Checks K17 operation ...

Страница 132: ...BLOCK 10 HI SRC BD RELAY BD A G K U1 J6 1 2 J5 1 2 J6 5 6 J5 5 6 F B K16 RL 12 IHI 1mA 10mA RANGE R14 F B 10 IN BUS J1 31 U17 5 0V Pulse INBUS V AK 20 2 5V VAK 50V 50V 0V K5 ERROR FAULT RELAY BOARD HI SRC 20 VAK 52V Re check Block 3 EC 07 21 VAK 45V K5 Open A positive 50V is programmed Checks K5 operation ...

Страница 133: ...BLOCK 11 HI SRC BD RELAY BD A G K U1 J6 1 2 J5 1 2 J6 5 6 J5 5 6 F B K16 RL 30 IHI 1mA 10mA RANGE R14 F B 10 IN BUS J1 31 U17 5 0V Pulse INBUS V AK 20 2 5V VAK 50V 50V 0V K6 ERROR FAULT RELAY BOARD HI SRC 22 VAK 52V Re check Block 3 EC 07 23 VAK 45V K6 Open A positive 50V is programmed Checks K6 operation ...

Страница 134: ...LOCK 12 HI SRC BD RELAY BD A G K U1 J6 1 2 J5 1 2 J6 5 6 J5 5 6 F B K16 RL 100 IHI 1mA 10mA RANGE R14 F B 10 IN BUS J1 31 U17 5 0V Pulse INBUS V AK 20 2 5V VAK 50V 50V 0V K7 ERROR FAULT RELAY BOARD HI SRC 24 VAK 52V Re check Block 3 EC 07 25 VAK 45V K7 Open A positive 50V is programmed Checks K7 operation ...

Страница 135: ... B 10 IN BUS J1 31 U17 5 0V Pulse INBUS V AG 20 13V VAG 2 6V 2 6V 0V K3 500 55 5K S 50 U15 K26 NO ERROR FAULT RELAY BOARD HI SRC EXTD RNG 26 VAG 10V Re check Block 4 EC 09 27 VAG 1 5V K3 Open K26 Not Operated K27 Stuck K7 Stuck A positive 50V is programmed Checks K3 and K26 operation EC 27 will occur if Self Test Fixture is not installed this the first block that requires the Self Test Fixture Sel...

Страница 136: ...100mA RANGE 5V F B 1 IN BUS J1 31 U17 5 0V Pulse INBUS V AG 2 1 25V VAG 2 5V 2 5V 0V K7 K20 K4 K21 R1 100 K19 K35 S ERROR FAULT RELAY BOARD HI SRC 28 VAG 2V K4 K35 Shorted 29 VAG 3V K19 K20 K21 Open A positive 5V is programmed R7 and ANET External R1 of Self Test Fixture create a divide by 2 network Checks operation of ANET and divide by 1 relays and that K4 and K35 are open Self Test Fixture ...

Страница 137: ...K16 RL 100 IHI 10mA 100mA RANGE 5V F B 1 IN BUS J1 31 U17 5 0V Pulse INBUS V AG 2 0V VAG 0V K7 K4 R1 100 S K32 100 K31 10 ERROR FAULT RELAY BOARD HI SRC 30 VAG 0 3V K4 Open K31 K32 Shorted K20 Hi Resistance A positive 5V is programmed Checks operation of K4 Also checks for incorrect closure of divider relays in return side of monitor networks K31 and K32 Self Test Fixture ...

Страница 138: ... SRC BD RELAY BD A G K U1 J6 1 2 J5 1 2 J6 5 6 J5 5 6 F B K16 RL 100 IHI 10mA 100mA RANGE 5V F B 1 IN BUS J1 31 U17 5 0V Pulse INBUS V AG 2 2 5 VAG 5V K7 R1 100 K20 5V 0V ERROR FAULT RELAY BOARD HI SRC 31 VAG 4 8V K20 Shorted A positive 5V is programmed across A to G terminals unless K20 is shorted Self Test Fixture ...

Страница 139: ...5 5 6 F B K16 RL 100 IHI 10mA 100mA RANGE 5V F B 1 IN BUS J1 31 U17 5 0V Pulse INBUS V AK 2 1 25 VAK 2 5V K7 R1 100 K21 2 5V 0V K22 K36 K13 K26 K MONITOR ERROR FAULT RELAY BOARD HI SRC 32 VAK 2 0V K13 Shorted K26 K36 Stuck Operated U11 33 VAK 3 0V K22 Open A positive 5V is programmed to the Anode The Gate is tied to the Anode Checks relays shown Self Test Fixture ...

Страница 140: ... 1 2 J5 1 2 J6 5 6 J5 5 6 F B K16 R3 10M R L IHI 1mA 10mA RANGE 50V F B 10 IN BUS J1 31 U17 5 0V Pulse INBUS V AK 2 6 5V VAK 13V 13V 0V K3 K22 K11 K12 ERROR FAULT RELAY BOARD HI SRC 34 VAK 4 5V K11 K12 K22 Shorted U34 A positive 50V is programmed across the Anode the Gate is tied to the Anode Confirms K11 K12 and K22 are open Self Test Fixture ...

Страница 141: ...J6 5 6 J5 5 6 F B K16 R4 R5 R L 12 IHI 100mA 1A RANGE F B 1 IN BUS J1 31 U17 5 0V Pulse INBUS V AK 2 0 15V VAK 0V 0V 0V K5 K20 K13 K4 K MONITOR K36 ERROR FAULT RELAY BOARD HI SRC 35 VAK 0 3V K13 K36 Open K4 K20 High Resistance A positive 5V is programmed across the Anode the Gate Cathode and Anode are tied together Confirms operation of identified relays ...

Страница 142: ... J5 5 6 F B K16 RL 100 IHI 10mA 100mA RANGE F B 1 IN BUS J1 31 U17 5 0V Pulse INBUS V AK 2 2 25V VAK 4 54V 4 54V 0V K7 K11 R8 1K 5V ERROR FAULT RELAY BOARD HI SRC 36 VAK 4 65V K11 Open 37 VAK 4 45V Re check Blocks 17 and 18 Trace path using Block 20 repetitively A positive 5V is programmed across the Anode Divider is formed by operation of K11 Self Test Fixture ...

Страница 143: ...0V K3 R5 18M RGK 6 96V 50mS R6 1 5M K21 K23 ERROR FAULT RELAY BOARD HI SRC 38 VAK 6 0V K23 Open If Block 21 fails running System Test and EC is not 38 then block is re run with the following changes The Hi Src is set to the 10mA range from the 1A range 39 2 1V VAK 1 5V Possible board leakage Clean board 40 VAK 1 5V K21 Shorted A positive 7V is programmed across high value external loads Checks for...

Страница 144: ...S J1 31 U16 3 2V Pulse INBUS I HI 2 1 6 IHI 3 2uA K3 K13 R21 10μA Range ERROR FAULT RELAY BOARD HI SRC 41 42 IHI 4 0μA S2 K13 Open R21 High U29 43 Shutdown A positive 32V is programmed across the 10MΩ resistor to produce 3 2μA Confirms operation of the 10μA range IHI 3 0μA automatically sequences to block 23 and continues through block 30 to check for shorted range relays when running System Test ...

Страница 145: ...R L IHI 1uA RANGE F B 1 IN BUS J1 31 U16 5 0V Pulse INBUS I HI 2 2 5 IHI 0 5uA K3 K14 R23 AC 1μA Range ERROR FAULT RELAY BOARD HI SRC 44 IHI 0 8μA K14 Open R23 High 45 IHI 0 4μA K13 Shorted R23 Low 68 IHI Passes after failing Block 22 K14 Shorted R21 Low Calibrate 46 N A A positive 5V is programmed across the 10MΩ resistor and to produce 0 5μA Confirms the 1μA range Self Test Fixture ...

Страница 146: ... B K16 R6 1 5M IHI 100uA RANGE F B 1 IN BUS J1 31 U16 2 5V Pulse INBUS I HI 2 2 5 IHI 50uA K12 R28 75V 100μA Range ERROR FAULT RELAY BOARD HI SRC 47 IHI 53μA R28 High 48 IHI 45 μA R28 Low 69 IHI Passes after failing block 23 U13 K12 Shorted 49 Shutdown K12 Open A positive 75V is programmed across the 1 5MΩ resistor to produce 50μA Confirms 100μA range Self Test Fixture ...

Страница 147: ...K16 RL 0 IHI 1mA RANGE F B 1 IN BUS J1 31 U16 0 5V Pulse INBUS I HI 2 2 5 IHI 0 5mA K17 K11 R27 0 5V R8 1K RLY BD 1mA Range ERROR FAULT RELAY BOARD HI SRC 50 IHI 0 53mA R27 High 51 IHI 0 44mA R27 Low 70 IHI Passes after failing Block 24 K11 Shorted 52 Shutdown K11 Open U29 Check Daughter Board A positive 0 5V is programmed across the 1KΩ to produce 0 5mA Confirms 1mA range ...

Страница 148: ...5 5 6 F B K16 RL 0 IHI 10mA RANGE F B 1 IN BUS J1 31 U16 5 0V Pulse INBUS I HI 2 2 5 IHI 5mA K17 K10 R26 5 0V R8 1K RLY BD 10mA Range ERROR FAULT RELAY BOARD HI SRC 53 IHI 5 3mA R26 High 54 IHI 4 4mA R26 Low 71 IHI Passes after failing Block 25 K10 Shorted 55 Shutdown K10 Open A positive 5V is programmed across the 1KΩ resistor to produce 5mA Confirms 10mA range ...

Страница 149: ... RANGE F B 10 IN BUS J1 31 U16 1 5V Pulse INBUS I HI 2 2 5 IHI 50mA K7 K9 R24 R1 100 R2 100 K8 U5 100mA Range ERROR FAULT RELAY BOARD HI SRC 56 IHI 53mA R24 High 57 IHI 44mA R24 Low K8 K9 Open 72 IHI Passes after failing Block 26 K8 K9 Shorted 58 Shutdown Incorrect shutdown trace path A positive 15V is programmed across the 300Ω resistor to produce 50mA Confirms 100mA range Self Test Fixture ...

Страница 150: ... U16 2 5V Pulse INBUS I HI 2 1 25V IHI 0 5A K17 K7 R22 R2 100 K6 U5 25V 1A Range ERROR FAULT RELAY BOARD HI SRC 59 IHI 0 53A R22 High K6 K7 Open simultaneously 60 IHI 0 44A K20 K21 High Resistance R22 Low K6 K7 Open 73 IHI Passes after failing Block 27 K6 K7 Shorted 61 Shutdown Incorrect shutdown trace path A positive 25V is programmed across the 100Ω resistor to produce 0 25A Confirms 1A range Se...

Страница 151: ...E F B 10 IN BUS J1 31 U16 2 79V Pulse INBUS I HI 2 1 3V IHI 2 6A K5 K7 K5 R20 K4 U5 27 9V 10A Range ERROR FAULT RELAY BOARD HI SRC 62 IHI 2 8A R20 High K16 Shorted 63 IHI 2 24A K4 K13 K20 High Resistance R20 Low K4 K5 Open 74 IHI Passes after failing Block 28 K4 K5 Shorted 64 Shutdown Incorrect shutdown trace path A positive 27 9V is programmed across the 10 7Ω resistor to produce 2 6A Confirms 10...

Страница 152: ...IHI 50A RANGE F B 10 IN BUS J1 31 U16 2 79V Pulse INBUS I HI 10 0 26V IHI 2 6A K5 K7 K2 R19 K3 U5 27 9V 50A Range ERROR FAULT RELAY BOARD HI SRC 65 IHI 3A R19 High 66 IHI 2 1A R19 Low K2 K3 Open 75 IHI Passes after failing Block 29 K2 K3 Shorted 67 Shutdown Incorrect shutdown trace path 76 U16 U29 U5 A positive 27 9V is programmed across the 10 7Ω resistor to produce 2 6A Confirms 50A range ...

Страница 153: ...1 31 U16 3 0V Pulse INBUS I HI 2 3 75V IHI 75mA K7 R1 100 CLAMPED AT 15V ERROR FAULT RELAY BOARD HI SRC 77 IHI 85mA Clamp high or not functional Check clamp network U15 Q26 R18 Open U29 U16 U20 U21 R121 Low 78 IHI 65mA Trace path R121 High 97 Shutdown Incorrect shutdown trace path A positive 30V is programmed across the 200Ω resistor current limit should occur at 75mA reducing the voltage to 15V S...

Страница 154: ...16 RL 100 IHI 10mA RANGE F B 1 IN BUS J1 31 U16 3 0V Pulse INBUS I HI 2 6 25V IHI 12 5mA K7 R1 100 CLAMPED AT 2 5V ERROR FAULT RELAY BOARD HI SRC 80 IHI 0 9mA Clamp too low Trace path U29 R152 High 98 Shutdown Incorrect shutdown trace path A positive 3V is programmed across the 200Ω resistor current limit should occur at 12 5mA reducing the voltage to 2 5V Self Test Fixture ...

Страница 155: ...A G K INBUS V AK 20 2 5V U1 J6 1 2 J5 1 2 J6 5 6 J5 5 6 5 0V Pulse F B K16 K17 RL 0 IHI 10mA RANGE VAK 50V 50V 0 IN BUS J1 31 U17 50V ERROR FAULT RELAY BOARD HI SRC 81 VAK 52V Trace Path 82 VAK 48V Trace Path A negative 50V is programmed across the Anode Confirms negative voltage operation at a gain of 10 Block 33 is the reverse of Block 3 ...

Страница 156: ...5 1 2 J6 5 6 J5 5 6 F B K16 R6 1 5M IHI 100uA RANGE F B 1 IN BUS J1 31 U16 7 5V Pulse INBUS I HI 2 2 5V IHI 50uA K12 R28 75V ERROR FAULT RELAY BOARD HI SRC 83 IHI 53μA Trace Path 84 IHI 45μA Trace Path A negative 75V is programmed across the 1 5MΩ at the Anode Confirms negative voltage operation Block 34 is the reverse of Block 24 Self Test Fixture ...

Страница 157: ...5 1 2 J6 5 6 J5 5 6 F B K16 IHI 100uA RANGE F B 1 IN BUS J1 31 U16 5 0V Pulse INBUS I HI 2 K17 K17 IHI SHUTDOWN ERROR FAULT RELAY BOARD HI SRC 85 95 Positive Shutdown Failed U3 U28 Trace Path CR11 A positive 5V is programmed with loads open The load relay K17 is closed through a short circuit producing a shutdown Confirms positive shutdown operation ...

Страница 158: ...5 1 2 J6 5 6 J5 5 6 F B K16 IHI 100uA RANGE F B 1 IN BUS J1 31 U16 5 0V Pulse INBUS I HI 2 K17 K17 IHI SHUTDOWN ERROR FAULT RELAY BOARD HI SRC 86 96 Negative Shutdown Failed U2 U28 Trace Path CR10 A negative 5V is programmed with loads open The load relay K17 is closed through a short circuit producing a shutdown Confirms negative shutdown operation ...

Страница 159: ...US J1 31 U16 7 5V Pulse INBUS I HI 2 2 5V IHI 50uA K12 R23 ERROR FAULT RELAY BOARD HI SRC 87 88 Offset voltage from terminal K not functional K14 S2 U29 U30 A negative 75V is programmed through the 1 5MΩ resistor The voltage at the K terminal is offset by the drop across the resistor If not functional the total voltage across A to K will be in error producing an error in the monitored current Self...

Страница 160: ...VAK 350V 700V U1 J6 1 2 J5 1 2 J6 5 6 J5 5 6 F B BOOSTER NC K16 RL IHI 10mA RANGE K33 K34 100 F B 100 R14 K19 IN BUS J1 31 350V 700V 0V U17 BLOCK 38 R13 ERROR FAULT RELAY BOARD HI SRC 89 Offset voltage from K terminal not functional S1 S2 U29 U30 Checks offset voltage in the negative polarity Block 38 is the reverse of Block 7 Items in parentheses are for 2KV Option ...

Страница 161: ...U1 J6 1 2 J5 1 2 J6 5 6 J5 5 6 F B K16 RL 100 IHI 100mA RANGE F B 10 IN BUS J1 31 U16 3 0V Pulse INBUS I HI 2 3 75V IHI 75mA K7 R1 100 CLAMPED AT 15V ERROR FAULT RELAY BOARD HI SRC 91 IHI 85mA Clamp High Clamp Network U9 Q25 92 IHI 65mA Trace Path Confirms negative clamp on the 100mA range This is the reverse of Block 31 Self Test Fixture ...

Страница 162: ... J5 1 2 J6 5 6 J5 5 6 F B K16 RL 100 IHI 10mA RANGE F B 1 IN BUS J1 31 U16 3 0V Pulse INBUS I HI 2 6 25V IHI 12 5mA K7 R1 100 CLAMPED AT 2 5V ERROR FAULT RELAY BOARD HI SRC 93 Shutdown Incorrect shutdown trace path 94 IHI 9mA Clamp low U29 trace path Confirms negative clamp on the 10mA range This block is the reverse of Block 32 Self Test Fixture ...

Страница 163: ...BD RELAY BD A G K U1 J6 1 2 J5 1 2 J6 5 6 J5 5 6 F B K16 RL 0 IHI 10mA RANGE F B 10 IN BUS J1 31 U16 2 5V Pulse INBUS I HI 2 1 25V VAK 25V PULSE K17 K20 K12 K4 R9 10K IHI 2 5mA ERROR FAULT RELAY BOARD HI SRC 79 IHI 2mA K11 K12 K13 K20 K10 A positive 25V is programmed across RGK 10KΩ Confirms operation of Relay Board K12 ...

Страница 164: ... GAIN SETTING 10 IN BUS J1 31 1 5V 4 7V DIFF U10 1 U21 BUFFERED K S U21 U34 K29 K30 KS GS 11 1K 11 1K 11 1K K28 K15 NC RGS 0 K10 K37 100K VGK 30V 90V ERROR FAULT RELAY BOARD LO SRC A0 VGK 38V 100V K29 A1 VGK 22V 80V K10 K14 K28 Stuck S1 Broken Wire J5 2 K16 Open U29 U1 U4 A positive 50V is programmed which drives the Lo Src to 28V Confirms Lo Src positive power supply Items in parentheses are for ...

Страница 165: ... x10 2 GAIN SETTING 10 IN BUS J1 31 1 5V 4 7V DIFF U10 1 U21 BUFFERED K S U21 U34 K29 K30 KS GS 11 1K 11 1K 11 1K K28 K15 NC RGS 0 K10 K37 100K VGK 30V 90V CR13 CR14 ERROR FAULT RELAY BOARD LO SRC A2 VGK 44V 100V K29 A3 VGK 22V 80V S2 CR13 CR14 Negative voltage low CR11 U2 A negative 50V is programmed which drives the Lo Src to 28V Confirms Lo Src negative power supply This block is the reverse of...

Страница 166: ... 27 J1 28 ILO 100uA 1mA RANGE x10 2 GAIN SETTING 10 IN BUS J1 31 DIFF U10 1 U21 BUFFERED K S U21 U34 K29 K30 KS GS 11 1K 11 1K 11 1K K28 K15 NC RGS 0 K10 K37 100K VGK 20V 1 0V ERROR FAULT RELAY BOARD LO SRC A4 VGK 25V K28 K37 Open U19 K1 K17 K16 Open A5 VGK 18V R21 High R16 Low C41 leaking U29 A positive 20V is programmed Confirms positive gain of 10 operation 5300HS only ...

Страница 167: ... BD RELAY BD A G K U1 J1 25 26 F B 2V INBUS V GK 20 J1 27 J1 28 ILO 100uA 1mA RANGE x10 2 GAIN SETTING 10 IN BUS J1 31 DIFF U10 1 U21 BUFFERED K S U21 U34 K29 K30 KS GS 11 1K 11 1K 11 1K K28 K15 NC RGS 0 K10 K37 100K VGK 20V 1 0V ERROR FAULT RELAY BOARD LO SRC A6 VGK 22V U1 A7 VGK 18V Block 45 is the reverse of Block 44 ...

Страница 168: ... 25 26 F B 5V INBUS V GK 2 J1 27 J1 28 ILO 100uA 1mA RANGE x1 2 GAIN SETTING 10 IN BUS J1 31 DIFF U10 1 U21 BUFFERED K S U21 U34 K29 K30 KS GS 11 1K 11 1K 11 1K K28 K15 NC RGS 0 K10 K37 100K VGK 5V 2 5V ERROR FAULT RELAY BOARD LO SRC A8 VGK 5 3V S1 K28 Open A9 VGK 4 5V K29 Stuck A positive 5V is programmed Confirms positive gain of 1 operation ...

Страница 169: ...RC BD RELAY BD A G K U1 J1 25 26 F B 5V INBUS V GK 2 J1 27 J1 28 ILO 100uA 1mA RANGE x1 2 GAIN SETTING 10 IN BUS J1 31 DIFF U10 1 U21 BUFFERED K S U21 U34 K29 K30 KS GS 11 1K 11 1K 11 1K K28 K15 NC RGS 0 K10 K37 100K VGK 5V 2 5V ERROR FAULT RELAY BOARD LO SRC B0 VGK 5 3V B1 VGK 4 5V Block 47 is the reverse of Block 46 ...

Страница 170: ... 28 ILO 10mA 100mA RANGE x1 GAIN SETTING IN BUS J1 31 U17 1 U21 BUFFERED K S 11 1K 11 1K 11 1K K28 K10 RGS 2 2K K14 K37 100K VAK 0 56V 0 28V 200 R8 1K S1 1 ON A G SHORT ERROR FAULT RELAY BOARD LO SRC B2 VAK 0 6V K37 U110 CR13 CR14 R10 R90 K5 U111 K15 Stuck U12 K14 K8 K9 K10 B3 VAK 0 43V K10 K14 Open S1 A positive 1 6V is programmed Confirms Pulse BV path and associated components ...

Страница 171: ... A G K U1 J1 25 26 F B 1 6V INBUS V AK 2 J1 27 J1 28 ILO 100uA 1mA RANGE x1 GAIN SETTING IN BUS J1 31 U17 1 U21 BUFFERED K S 11 1K 11 1K 11 1K K28 K10 RGS 2 2K K14 K37 100K VAK 0 11V 0 05V 200 R8 1K S1 1 ON A G SHORT ERROR FAULT RELAY BOARD LO SRC B4 VAK 0 1V K14 K10 Stuck Block 49 is a repeat of Block 48 with Pulse BV relays open ...

Страница 172: ...D RELAY BD A G K U1 J1 25 26 F B 1 6V INBUS V AK 2 J1 27 J1 28 ILO 100uA 1mA RANGE x1 GAIN SETTING IN BUS J1 31 U17 1 U21 BUFFERED K S 11 1K 11 1K 11 1K K28 K10 RGS 2 2K K14 K37 100K VAK 0 11V 0 05V 200 R8 1K S1 1 OFF A G SHORT ERROR FAULT RELAY BOARD LO SRC B5 VAK 0 1V S1 Block 50 is repeat of Block 48 with Pulse BV open ...

Страница 173: ...D RELAY BD A G K U1 J1 25 26 F B 10V INBUS V AK 2 J1 27 J1 28 ILO 100uA 1mA RANGE x1 GAIN SETTING IN BUS J1 31 U17 1 U21 BUFFERED K S 11 1K 11 1K 11 1K K28 RGS 1K K25 K37 100K VAK 5V 2 5V R8 1K A G SHORT K11 ERROR FAULT RELAY BOARD LO SRC B6 VAK 4 4V K25 Open U111 A positive 10V is programmed Confirms path K25 through 1KΩ ...

Страница 174: ...RELAY BD A G K U1 J1 25 26 F B 5V INBUS V AK 2 J1 27 J1 28 ILO 10mA 100mA RANGE x1 GAIN SETTING IN BUS J1 31 U17 1 U21 BUFFERED K S 11 1K 11 1K 11 1K K28 RGS R4 3 3K K24 K37 100K VAK 5V 2 5V A G SHORT ERROR FAULT RELAY BOARD LO SRC B7 VAK 4 4V K24 Open A positive 5V is programmed Confirms path through K24 Self Test Fixture ...

Страница 175: ...53 LO SRC BD RELAY BD A G K U1 J1 25 26 F B 5V INBUS V AK 2 J1 27 J1 28 ILO 10mA 100mA RANGE x1 GAIN SETTING IN BUS J1 31 U17 1 U21 BUFFERED K S 11 1K 11 1K 11 1K K28 K15 K37 100K VAK 5V 2 5V A G SHORT ERROR FAULT RELAY BOARD LO SRC B8 VAK 4 4V K15 Open K37 A positive 5V is programmed Confirms path through K15 ...

Страница 176: ...4V ILO 3 43uA 1 4 14 1 5M U4 U5 U10 10μA Range ERROR FAULT RELAY BOARD LO SRC B9 ILO 5 0μA R21 High U29 K11 If Block 54 fails and not EC B9 the block is re run to determine EC C0 with the following changes Monitor IHI Hi Src 10μA range and RGK Ext from monitor ILO Lo Src 10μA range RL Ext and no RGK C0 ILO 2 37μA K13 Open R21 Low K11 A positive 1V is programmed through the 1 5MΩ to the Hi Src to c...

Страница 177: ...RC K11 DIFF R6 1 5M 9V K24 RGS R5 18M U4 U5 U10 1μA RANGE ERROR FAULT RELAY BOARD LO SRC C1 Passes Block 55 after failing Block 54 U13 check for open wire 7B to K15 K14 Stuck R127 High open D0 ILO 0 8μA K3 Stuck K20 slow opening R23 High K14 Open K1 Stuck D1 ILO 0 4μA K23 Open K13 Stuck R127 R23 Low CR7 CR8 Lo Src K11 is energized near the end of the test verify that no ringing occurs after K11 is...

Страница 178: ...B 0 55V INBUS I LO 2 J1 27 J1 28 ILO 50uA K12 100uA RANGE x1 GAIN SETTING 1 U21 BUFFERED K S 11 1K 11 1K 11 1K K28 K15 NC K37 100K 2 5V K11 IN BUS J1 31 LO SRC K11 DIFF R9 10K K25 RGS 1K U4 U5 U10 100μA Range ERROR FAULT RELAY BOARD LO SRC C2 Passes Block 56 after failing Block 54 K12 Stuck D2 ILO 53μA K12 K25 Open K12 Open R28 High D3 ILO 45μA R28 Low ...

Страница 179: ... A G K U1 J1 25 26 F B 5V INBUS I LO 2 J1 27 J1 28 ILO 0 5mA K11 1mA x1 GAIN SETTING 1 U21 BUFFERED K S 11 1K 11 1K 11 1K K28 K15 NC K37 100K 2 5V IN BUS J1 31 DIFF R9 10K RGS U4 U5 U10 1mA Range ERROR FAULT RELAY BOARD LO SRC C3 Passes Block 57 after failing Block 54 K11 Stuck D4 ILO 0 53mA K11 Open R27 High D5 ILO 0 45mA R27 Low ...

Страница 180: ... G K U1 J1 25 26 F B 5V INBUS I LO 2 J1 27 J1 28 ILO 5mA K10 10mA RANGE x1 GAIN SETTING 1 U21 BUFFERED K S 11 1K 11 1K 11 1K K28 K15 NC K37 100K 2 5V IN BUS J1 31 DIFF R9 10K RGS U4 U5 U10 10mA Range ERROR FAULT RELAY BOARD LO SRC C4 Passes Block 58 after failing Block 54 K10 Stuck D6 ILO 5 3mA K10 Open R26 High D7 ILO 4 5mA R26 Low ...

Страница 181: ...US I LO 2 J1 27 J1 28 ILO 50mA K8 K9 100mA RANGE x1 GAIN SETTING 1 U21 BUFFERED K S 11 1K 11 1K 11 1K K28 K15 NC K37 100K 2 5V IN BUS J1 31 DIFF R2 100 RGS U4 U5 U10 100mA Range ERROR FAULT RELAY BOARD LO SRC C5 Passes Block 59 after failing Block 54 K8 K9 Stuck D8 ILO 53mA K21 High Resistance F1 F3 R24 High D9 ILO 45mA R24 Low K9 Open K8 U1 Self Test Fixture ...

Страница 182: ...K U1 J1 25 26 F B 2V INBUS I LO 2 J1 27 J1 28 ILO 0 5A K6 K7 1A RANGE x1 GAIN SETTING 1 U21 BUFFERED K S 11 1K 11 1K 11 1K K28 K37 100K 2 5V IN BUS J1 31 DIFF RGS 3 3 U4 U5 U10 K24 1A Range ERROR FAULT RELAY BOARD LO SRC C6 Passes Block 60 after failing Block 54 K6 K7 Stuck DA ILO 520mA K16 Stuck R22 High DB ILO 480mA K6 K7 Open R22 Low ...

Страница 183: ...26 F B 6V INBUS I LO 2 J1 27 J1 28 ILO 1 5A K4 K5 10A RANGE x1 GAIN SETTING 1 U21 BUFFERED K S 11 1K 11 1K 11 1K K28 K37 100K 0 75V IN BUS J1 31 DIFF RGS 3 3 U4 U5 U10 K24 10A Range ERROR FAULT RELAY BOARD LO SRC C7 Passes Block 61 after failing Block 54 K4 K5 Stuck DC ILO 1 9A R20 High DD ILO 1 2A K4 K5 Open C8 Fails all Blocks 54 through 61 U26 ...

Страница 184: ... Test Block 62 BLOCK 62 LO SRC BD RELAY BD A G K U1 J1 25 26 F B 6V INBUS I LO 2 J1 27 J1 28 ILO 1 5A K4 K5 10A RANGE x1 GAIN SETTING 1 U21 BUFFERED K S 11 1K 11 1K 11 1K K28 K37 100K 0 75V IN BUS J1 31 DIFF RGS 3 3 U4 U5 U10 K24 ERROR FAULT RELAY BOARD LO SRC E0 ILO 1 9A E1 ILO 1 2A F2 F4 ...

Страница 185: ...BLOCK 63 LO SRC BD RELAY BD A G K U1 J1 25 26 F B 5V INBUS I LO 2 J1 27 J1 28 ILO 1 5A K11 1mA x1 GAIN SETTING 1 U21 BUFFERED K S 11 1K 11 1K 11 1K K28 K15 NC K37 100K 2 5V IN BUS J1 31 DIFF R9 10K RGS U4 U5 U10 ERROR FAULT RELAY BOARD LO SRC E2 ILO 0 53mA E3 ILO 0 45mA Block 63 is the reverse of Block 57 ...

Страница 186: ...I LO 2 J1 27 J1 28 ILO 75mA K8 K9 100mA RANGE x1 GAIN SETTING 1 U21 BUFFERED K S 11 1K 11 1K 11 1K K28 K15 NC K37 100K 3 75V IN BUS J1 31 DIFF R2 100 RGS U4 U5 U10 K22 ERROR FAULT RELAY BOARD LO SRC E4 ILO 85mA K18 Open K8 K9 U29 U6 U14 R121 E5 ILO 65mA U29 R121 A positive 7 5V is programmed across the 100Ω G K load Confirms Lo Src positive clamp Self Test Fixture ...

Страница 187: ... BD A G K U1 J1 25 26 F B 1 6V INBUS I LO 2 J1 27 J1 28 ILO 8mA K10 10mA RANGE x1 GAIN SETTING 1 U21 BUFFERED K S 11 1K 11 1K 11 1K K28 K15 NC K37 100K 6 0V IN BUS J1 31 DIFF R2 100 RGS U4 U5 U10 ERROR FAULT RELAY BOARD LO SRC E6 ILO 7mA U29 R152 E7 ILO 9mA U29 R152 Confirms Lo Src positive clamp at 10mA range Self Test Fixture ...

Страница 188: ... ILO 100mA RANGE x10 2 GAIN SETTING 10 IN BUS J1 31 4 5V DIFF U10 1 U21 BUFFERED K S U21 U34 K29 K30 KS GS 11 1K 11 1K 11 1K K28 K15 NC RGS K37 100K VGK 9 0V ILO 90mA R2 100 ERROR FAULT RELAY BOARD LO SRC E8 VGK 9 4V K21 High Resistance U29 Check drive circuit E9 VGK 8 6V Check drive circuit Confirms Lo Src positive current drive Confirms VOUT of U20 R105 R104 Self Test Fixture ...

Страница 189: ... K U1 J1 25 26 F B INBUS V GK 2 J1 27 J1 28 ILO 100mA RANGE x10 2 GAIN SETTING 10 IN BUS J1 31 4 5V DIFF U10 1 U21 BUFFERED K S U21 U34 K29 K30 KS GS 11 1K 11 1K 11 1K K28 K15 NC RGS K37 100K VGK 9 0V ILO 90mA R2 100 ERROR FAULT RELAY BOARD LO SRC F0 VGK 9 4V U29 Q25 check drive circuit F1 VGK 8 6V Check drive circuit Self Test Fixture ...

Страница 190: ... J5 5 6 F B K16 RL 0 IHI 100mA RANGE F B 1 IN BUS J1 31 U17 INBUS V AK 2 2 5V VAK 5V 5 0V 0V K17 R1 100 5V I CLAMP Q26 CR27 ERROR FAULT RELAY BOARD HI SRC F2 VAK 5 9V Check CR27 and clamp network F3 VAK 4 8V Check CR27 and clamp network Clamped I drive is set to a positive 50μA across 100Ω ANET load Confirms positive clamped I drive operation Self Test Fixture ...

Страница 191: ... J5 5 6 F B K16 RL 0 IHI 100mA RANGE F B 1 IN BUS J1 31 U17 INBUS V AK 2 2 5V VAK 5V 5 0V 0V K17 R1 100 5V I CLAMP Q25 CR24 ERROR FAULT RELAY BOARD HI SRC F4 VAK 5 9V Check CR24 and clamp network F5 VAK 4 8V Check CR24 and clamp network Clamped I drive is set to a negative 50μA across 100Ω ANET load Confirms negative clamped I drive operation Self Test Fixture ...

Страница 192: ...2 BOOSTER NC K16 RL 0 IHI 1A RANGE F B 10 R14 IN BUS J1 31 40V 0V U17 BLOCK 70 K27 NO F1 K17 U5 IMON K22 R1 100 R2 100 200mA I DRIVE ERROR FAULT RELAY BOARD HI SRC FE VAK 37 0V K22 K1 K17 K15 Shorted U2 U3 FF VAK 42 6V K101 Stuck R33 U29 C69 K1 Shorted Hi Src I drive is set to a positive 200mA and passed through ANET and GNET loads to develop 40V A K Confirms I drive operation Self Test Fixture ...

Страница 193: ...RELAY BD A G K INBUS V AK 20 3 75V VAK 75V U1 J6 1 2 J5 1 2 J6 5 6 J5 5 6 F B BOOSTER NC K16 RL 0 IHI 100uA RANGE F B 10 IN BUS J1 31 75V 0V U17 BLOCK 71 K17 R6 1 5M ERROR FAULT RELAY BOARD HI SRC F6 VAK 7 25V K31 Open A positive 75V is programmed across the 1 5MΩ resistor Confirms VAK divide by 10 operation Self Test Fixture ...

Страница 194: ... 0 75V 1 5V VAK 150V U1 J6 1 2 J5 1 2 J6 5 6 J5 5 6 F B BOOSTER NC K16 RL 0 IHI 1mA RANGE F B 100 IN BUS J1 31 150V 300V 0V U17 BLOCK 72 K17 R6 1 5M ERROR FAULT RELAY BOARD HI SRC F7 VAK 145V 290V K32 Open A positive 150V is programmed across the 1 5MΩ resistor Confirms VAK divide by 100 operation Self Test Fixture Items in parentheses are for 2KV Option ...

Страница 195: ... ILO 75mA 100mA RANGE x10 2 GAIN SETTING 10 IN BUS J1 31 3 75V DIFF U10 1 U21 BUFFERED K S U21 U34 K29 K30 KS GS 11 1K 11 1K 11 1K K28 K15 NC RGS 3 3 K24 K37 100K VGK 7 5V R2 100 HI SRC 50A RANGE ERROR FAULT RELAY BOARD LO SRC 115 VGK 8 5V Check I drive 114 VGK 6 5V Check I drive A positive 75mA is generated across the 100Ω G K load Confirms Lo Src positive I drive Self Test Fixture ...

Страница 196: ...27 J1 28 ILO 75mA 100mA RANGE x10 2 GAIN SETTING 10 IN BUS J1 31 3 75V DIFF U10 1 U21 BUFFERED K S U21 U34 K29 K30 KS GS 11 1K 11 1K 11 1K K28 K15 NC RGS 3 3 K24 K37 100K VGK 7 5V R2 100 ERROR FAULT RELAY BOARD LO SRC 117 VGK 8 5V Check I drive 116 VGK 16 5V Check I drive A negative 75mA is generated across the 100Ω G K load Confirms Lo Src negative I drive Self Test Fixture ...

Страница 197: ... 0 9V VAK 20V U1 J6 1 2 J5 1 2 J6 5 6 J5 5 6 F B K2 NC K16 RL 0 IHI 100mA RANGE F B 10 R14 IN BUS J1 31 20V 0V U17 BLOCK 75 K106 NC F1 K17 K27 NO R8 1K ERROR FAULT RELAY BOARD HI SRC 118 VAK 28V K106 Stuck 119 VAK 8V K101 Stuck Gate Protect A positive 65V is programmed A to G is shorted and RGK of 1KΩ Confirms K106 is energized and K101 is not energized ...

Страница 198: ...E HI SRC BD RELAY BD A G K INBUS V AK 20 0 06V VAK 1 25V U1 J6 1 2 J5 1 2 J6 5 6 J5 5 6 F B K2 NC K16 RL 0 IHI 100mA RANGE F B 10 R14 IN BUS J1 31 1 25V 0V U17 BLOCK 76 K106 NC F1 K17 K27 NO R8 1K ERROR FAULT RELAY BOARD HI SRC 11A VAK 10V K101 K106 Stuck Block 76 is a repeat of Block 75 Confirms K101 is energized ...

Страница 199: ...5 6 J5 5 6 F B NC K16 RL 0 IHI 100mA RANGE F B 10 IN BUS J1 31 50V 0V U17 BLOCK 77 K17 K105 NO 10 R15 500K ERROR FAULT RELAY BOARD HI SRC 11B VAK 70V K105 Block 77 is a repeat of Block 9 with K105 energized which causes the divider to drive the divide by 20 to the rail The actual voltage at the Anode is 50V the apparent voltage at the 1N135 is greater than 100V Confirms K105 operation ...

Страница 200: ...K3 50A RANGE x1 GAIN SETTING 1 U21 BUFFERED K S 11 1K 11 1K 11 1K K28 K37 100K 0 5V IN BUS J1 31 DIFF RGS R4 3 3 U4 U5 U10 K15 50A Range ERROR FAULT RELAY BOARD LO SRC C9 Passes Block 78 after failing Block 54 K2 K3 Stuck DE ILO 8 1A R20 High DF ILO 3 0A K2 K3 Open C8 Fails all Blocks 54 through 61 and 78 U26 Block 78 is only valid if 50A Lo Source Option has been installed Self Test Fixture ...

Страница 201: ...1 J6 1 2 J5 1 2 J6 5 6 J5 5 6 F B K16 R3 10M R L IHI 1uA RANGE F B 1 IN BUS J1 31 U16 5 0V Pulse INBUS I HI 1 6 0V A 5V PULSE K3 5V IHI 0 8uA K14 ERROR FAULT RELAY BOARD HI SRC 6A IHI 0 8μA K14 Shorted R23 High A positive 5V is programmed across the 10MΩ resistor with all current ranges open Confirms 1μA range K14 is open Self Test Fixture ...

Страница 202: ... 27 J1 28 ILO 0 8uA K14 1uA RANGE x1 GAIN SETTING 1 U21 BUFFERED K S 11 1K 11 1K 11 1K K28 K15 NC 100K 6V K11 IN BUS J1 31 LO SRC K11 DIFF RGS R5 18M U4 U5 U10 ERROR FAULT RELAY BOARD LO SRC CA ILO 0 8μA K14 Stuck Confirms 1μA range relay opens The Lo Src K11 is energized towards the end of the test verify that no ringing occurs after K11 is de energized Self Test Fixture ...

Страница 203: ...J5 1 2 F B 7V PULSE INBUS I AUX 2 J5 3 4 K6 K7 1A RANGE 200K 10K 0 7V IN BUS J1 31 DIFF U10 K4 VO 140V 140V 0 U16 1K 100 ERROR FAULT RELAY BOARD AUX SRC 11C IAUX 100mA K4 K6 K7 11D IAUX 180mA K4 K6 K7 A negative 140V is programmed to AUX Bd resistor current flow confirms operation This Block is used with the Auxiliary Source Option ...

Страница 204: ...J5 1 2 F B 7V PULSE INBUS I AUX 2 J5 3 4 K6 K7 1A RANGE 200K 10K 0 7V IN BUS J1 31 DIFF U10 K4 VO 140V 140V 0 U16 1K 100 ERROR FAULT RELAY BOARD AUX SRC 11E IAUX 100mA K4 K6 K7 11F IAUX 180mA K4 K6 K7 A positive 140V is programmed to AUX Bd resistor current flow confirms operation This Block is used with the Auxiliary Source Option ...

Страница 205: ... 83 BLOCK 83 AUX LO SRC BD U1 J5 1 2 F B 7V PULSE INBUS I AUX 2 J5 3 4 K6 K7 1A RANGE 200K 10K 0V IN BUS J1 31 DIFF U10 K4 VO 140V 140V 0 U16 1K 100 ERROR FAULT RELAY BOARD AUX SRC 120 IAUX 100mA K4 A negative 140V is programmed Confirms K4 operation This Block is used with the Auxiliary Source Option ...

Страница 206: ... 1 23 MODEL 5000 SERIES MANUAL ERROR FAULT RELAY BOARD HI SRC 124 VAK 4 3V U102 S101 K102 Open 125 VAK 4 7V K102 Confirms operation of the gain of 10 VAK RDSON circuit This Block is used with the improved VAK RDSON Figure 7 85 Self Test Block 84 ...

Страница 207: ...OF THREE 26V PULSES K17 K15 NORMALIZE BD K2 C5 C68 C104 ERROR FAULT NORMALIZE BOARD HI SRC NO CAP 101 VAK 32V C5 Low 102 VAK 20V K2 Stuck K2 Stuck SLOW CAP 103 VAK 33V C68 Low K15 104 VAK 21V K2 Stuck C68 High U2 U3 NORM CAP 105 VAK 32V C104 Low K2 106 VAK 20V C104 High A voltage is programmed to Hi Src input to clock ramp ratios of 3 separate compensation conditions Timing is such that each group...

Страница 208: ...I 1mA 10mA RANGE F B 10 IN BUS J1 31 U17 8 0V Pulse INBUS V AK 20 1 25V VAK SERIES OF THREE 26V PULSES K17 K15 NORMALIZE BD K2 C5 C68 C10 ERROR FAULT NORMALIZE BOARD HI SRC NO CAP 107 VAK 32V C5 Low 108 VAK 20V K2 Stuck K2 Stuck SLOW CAP 109 VAK 33V C68 Low K15 U2 10A VAK 21V K2 Stuck C68 High U2 U3 NORM CAP 10B VAK 32V C104 Low K2 10C VAK 20V C104 High Block 91 is reverse of Block 90 ...

Страница 209: ...L 0 IHI 100mA RANGE F B 1 IN BUS J1 31 U17 5 0V Pulse INBUS V AK 2 2 5V VAK 5V K17 K14 R2 100 5V 1 KHZ I 50mA 10 RMS 1 KHZ ERROR FAULT RELAY BOARD HI SRC 10D ZZ 95Ω Trace ZZ circuitry K104 U110 K20 Trace ZZ circuitry K17 10E ZZ 108Ω Trace ZZ circuitry Trace ZZ circuitry K17 A negative 50mA I drive is modulated at 1KHz 10 RMS to confirm Zener impedance circuitry Self Test Fixture ...

Страница 210: ...A K13 10uA RANGE 11 1K 2 77V IN BUS J1 31 DIFF RGS R8 1K U4 U5 U10 10 U9 CIRCUIT NORMALIZE BD 1 111 K3 NORMALIZE BD IHI 5 55mA HI SRC 10mA RANGE ERROR FAULT NORMALIZE BOARD LO SRC 110 IHI 5 388mA K3 Open Check circuit K17 etch cut 111 IHI 5 722mA Check ILO 10 circuit A programmed 5mA pseudo I drive results in 5 555mA of current 5300HS Model check for jumper to J1 29 Normalize Board ...

Страница 211: ...26 5V INBUS I HI 2 J1 29 ILO 5 55uA K13 10uA RANGE 11 1K 2 77V IN BUS J1 31 DIFF RGS R8 1K U4 U5 U10 10 U9 CIRCUIT NORMALIZE BD 1 111 K3 NORMALIZE BD IHI 5 55mA HI SRC 10mA RANGE ERROR FAULT NORMALIZE BOARD LO SRC 112 IHI 5 388mA K3 Open Check circuit K17 etch cut 113 IHI 5 722mA Check ILO 10 circuit Block 94 is reverse of Block 93 Normalize Board ...

Страница 212: ...GE F B 1 IN BUS J1 31 U16 2 5V Pulse INBUS I HI 2 2 5 IHI 0 5A K17 K11 R27 R8 1K K5 0 5V S2 NORMALIZE BD 2 5 75 VAK 0 5V 0 5 ERROR FAULT NORMALIZE BOARD HI SRC 121 IHI 0 44mA K5 or S2 Open 122 IHI 0 44mA S2 Shorted 123 IHI 0 44mA K5 Shorted Three positive 0 5V pulses are applied across the 1K resistor to produce 0 5mA Confirms operation of K5 and S2 on Normalize Board Auxiliary Charging Range ...

Страница 213: ... SERIES MANUAL Version 1 23 7 111 Figure 7 92 Self Test Block 96 ERROR FAULT RELAY BD EXTD RANGE Bd 126 VAK 40V K1 stuck NC K2 stuck NO A positive rail voltage is applied of approximately 60V K1 is energized Confirms K1 is on and K2 is not on ...

Страница 214: ...D EXTD RANGE Bd 129 ILO 400uA K7 K8 failed to operate 130 ILO 400uA K8 failed to release 131 ILO 400uA K7 failed to release Gate is connected to drive A A series of three 3 6 5V pulses are applied Relays K7 and K8 are energized as shown in table to confirm operation Figure 7 93 Self Test Block 97 ...

Страница 215: ...rsion 1 23 7 113 Figure 7 94 Self Test Block 98 ERROR FAULT RELAY BD EXTD RANGE Bd 127 VAK 40V K2 stuck NC Block 98 is similar to Block 96 K2 is energized Confirms K2 operates NOTE On Relay Bds Without R11 if fault will result in approximately 0V on the INBUS ...

Страница 216: ...MANUAL Figure 7 95 Self Test Block 99 ERROR FAULT RELAY BD EXTD RANGE Bd 128 VAK 40V K4 failed to open Block 99 is similar to Block 96 A positive rail voltage of approximately 60V is applied Relay K4 is energized A is shorted to K Current clamps VAK at approximately 0V ...

Страница 217: ...96 Self Test Block 100 ERROR FAULT RELAY BD EXTD RANGE Bd 132 VAK 5 9V K3 failed to operate 133 VAK 5 9V K3 failed to release Gate is connected to A Two 2 6 5V pulses are applied Relay K3 is operated for the first pulse and released for the second pulse Relays K1 and K7 are energized ...

Страница 218: ...7 MAINTENANCE TROUBLESHOOTING 7 116 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 219: ... 5000 Series Tester In both case the 50 Pin connector connects from the back panel of 5000 Series Tester and the Low Current Deck NOTE Substantial force is required to plug the Low Current Deck directly into the panel of the 5000 Series tester This assures good connection Use the supplied shielded cable to connect the front panel of the 5000 Series Tester to the back of the Low Current Deck The le...

Страница 220: ...to the back of the 5000 Series Tester marked LCD and the other end to the back of the Low Current Deck This cable supplies the control signals and voltages to the Low Current Deck If a handler is used connect a handler control cable from the back of the 5000 Series Tester marked Handler to the handler To gain access to the printed circuit boards in the Low Current Deck remove the top cover screws ...

Страница 221: ...est time is longer than in the average mode but shorter than in the integrate mode Note The zero crossing detector is included on the Control Board in the 5000 Series Tester If the detector malfunctions the tester will appear to have locked up as it waits for the zero cross signal Power the 5000 Series Tester off and correct this malfunction before continuing testing 8 2 2 Soak Time Soak time can ...

Страница 222: ...h must be on or the test step must be edited to increase the entries to at least 100ηA Operation with the handler is the same as with the 5000 Series Tester Make connection as described in Section 2 2 of this manual Set the Remote Local switch to Remote for the handler to initiate the start test 8 3 3 Calibration Calibration of the Low Current Deck is accomplished by nulling the offset of two ampl...

Страница 223: ...f Test Fixture to the Low Current Deck panel jacks From the PCW software select the Runtime Self Test LCD Test menu item Click the Start button Successful Low Current Deck self test will display LODECK OK It is common after first receiving the Low Current Deck that an error code will result from self test due to the mercury relays not being settled If an error occurs confirm all cable connections ...

Страница 224: ...8 LOW CURRENT DECK 8 6 Version 1 23 MODEL 5000 SERIES MANUAL It is good practice to run both the 5000 Series Tester self test and Low Current Deck self test at least on every system power up ...

Страница 225: ...5 K7 stuck 04 K4 K5 open K9 05 K5 K3 K4 stuck K7 open 06 K4 open 07 K5 K8 open 08 K6 open 09 K1 stuck K7 stuck K2 U1 10 K6 stuck K1 K3 K6 K7 open K18 11 K6 12 K8 stuck 13 K8 open 14 15 16 K9 K11 open 17 K12 open U3 K8 U1 18 K1 K13 stuck K2 K9 open K8 U1 U3 19 K13 open K9 U2 20 K12 stuck K3 open 21 22 K14 23 Cal G K Board 25 K3 stuck HI SRC F1 F3 K9 Table 8 1 Low Current Deck Self Test Error Codes ...

Страница 226: ...8 LOW CURRENT DECK 8 8 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 227: ...from the 5000 Series Tester and the High Current Deck will not operate without these cables Make these connections only with the 5000 Series Tester power switch OFF Connect the Control and Control Power 26 pin cables between the 5000 Series Tester and High Current Deck using the connections labeled on both rear panels Use the cable with box banana jacks on one end and 14 pin circular connector on ...

Страница 228: ...th the gate base drive as shown schematically on the front panel If using a test fixture that already has an oscillation suppression network built into the fixture then use a shorting bar across the gate base drive jacks All device testing can be performed at the High Current Deck The High Current Deck is a pass through except for those tests that are programmed above 50 amps 9 2 Attachment to Low...

Страница 229: ... for 100 200 300 400 and 500 amps Measure the on state voltage of 1 00 2 00 3 00 4 00 and 5 00 volts Readings should be within 2 if the High Current Deck is operating properly Repeat for higher currents if the 1000 amp Option is installed 9 3 2 Calibration Procedure Place the High Current Deck PA Board 1 2 3 4 or 5 to be calibrated on the supplied Extender Board Attach all cables using the supplie...

Страница 230: ...R value while the VCESAT test is generally more stable with a lower parallel R value A compromise value is attainable The installed components are usually satisfactory for both tests For devices under 100 amps standard STI TO 3 fixtures are usually adequate as noted in Section 9 1 For higher current devices a pair of high current jacks is included with the High Current Deck Attach leads as noted i...

Страница 231: ...1A Simplified Schematic 10 1Installation The ADP401A 8 16 is provided with the following External Relay Driver Board ER 100 If the Pin Programmable Scanner was not part of the original equipment this card will have to be installed into 5000 Series Tester small card cage and the 26 Pin Header to 25 Pin D Sub cable connected to the 5000 Series Tester rear panel 25 Pin D Sub M F Control Cable HCB 200...

Страница 232: ...ck the ADP 401 Scanner Plan Tab to view the current scanner settings Select the AP 401A 8 or ADP 401A 16 in the ADP 401 Style Box Save the STI Configuration see Section 6 3 3 4 This setting will then become the default setting each time a test program is opened or created Double click the desired test step to open the Pin Configuration box see Figure 10 3 For each device pin select the signal to b...

Страница 233: ...tem main menu Runtime Self Test ADP401A Click the Start button at the bottom of the PCW main window The 5000 Series Tester will then perform a complete check of all the relays in the Pin Programmable Scanner note the 5000 Series Tester automatically detects if 1 or 2 Scanner Boards are installed in the ADP 401A Scanner If all of the relays test good the 5000 Series Tester will display ADP401A GOOD...

Страница 234: ...10 PIN PROGRAMMABLE SCANNER 10 4 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 235: ...per DUT Control cable 25 pin D Sub Place the Model 6010 Scanner next to the 5000 Series Tester and connect the front panel device cable from the Model 6010 Scanner to the 5000 Series Tester The cable is approximately three feet long and has a connector box with banana jacks at each end See Figure 11 1 Figure 11 1 Model 6010 Installation Diagram If the 5000 Series Tester is setup for Multiplex oper...

Страница 236: ...sing the up or down arrow keys or mouse click and then press the F3 key or right mouse click and select Set Scan from the menu A Set Scan dialog window is opened select the desired scan index by typing using the up or down arrow keys or clicking on the up or down arrows in the window Click the Accept button to set the scan index into the test plan Note a scan index value of zero means no scans wil...

Страница 237: ... the 5000 Series Tester Two 25 pin D Sub cables connect from the Multiplex Adaptor to the Multiplex Adaptor Control connectors on the rear panel of the 5000 Series Tester Additionally a device cable from the Multiplex Adaptor to the station and a 25 pin D Sub Multiplex Station Control from the rear panel of the 5000 Series Tester to the station are required for each station See Figure 12 1 CABLE C...

Страница 238: ...The test program for each Multiplex Station must be sent individually the Station Select box will be activated when Send is activated Each Multiplex Station has its own Exact Value Lot Summary window and is controlled from the PC via this window 12 4Self Test of the Multiplex System Remove the Multiplex Adaptor Device Cable from the front panel of the 5000 Series Tester Run the 5000 Series Tester ...

Страница 239: ...tem is not functioning properly 12 5Multiplex Error Messages Self Test Errors If there are any Manual Stations attached to the Multiplex Adaptor the following error messages may displayed during normal operation M1 K2 SHORT FAIL M2 K2 SHORT FAIL M3 K2 SHORT FAIL M4 K2 SHORT FAIL M1 K2 OPEN FAIL M2 K2 OPEN FAIL M3 K2 OPEN FAIL M4 K2 OPEN FAIL These messages indicate that the shorting relay K2 insid...

Страница 240: ... close after opening 3 103 K25 failed to close after opening 4 103 K27 failed to close after opening 1 4 K22 failed to open 2 4 K24 failed to open 3 4 K26 failed to open 4 4 K28 failed to open 1 104 K22 failed to close after opening 2 104 K24 failed to close after opening 3 104 K26 failed to close after opening 4 104 K28 failed to close after opening 1 5 K9 failed to open 2 5 K11 failed to open 3 ...

Страница 241: ...00 SERIES MANUAL Version 1 23 13 1 13 APPENDICES The following appendices provide information concerning the various adaptors that can be used with the STI 5000 Series Tester to extend the device families that can be run ...

Страница 242: ...APPENDICES 13 2 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 243: ... other tests where a voltage of several volts or more is applied to the anode observation at the anode is representative of the voltage from AS to KS because the voltage at the KS terminal is usually less than one volt For high current on state tests where the expected AS to KS voltage is low accurate observation of the waveform can be obtained by using two scope probes and subtracting the two tra...

Страница 244: ...APPENDIX A 13 4 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 245: ...ls on the test fixture correlate to the regulator terminals as follows Fixture Regulator A AS VIN G GS VO K KS ADJ Table 13 1 Regulator Terminal Designations The regulator load can either electronic or resistive Electronic selection allows the load current to be programmed between 100μA and 9 9A If resistive the load is programmed internally as either 1K 10K Open or Short An external load RGK EXT ...

Страница 246: ...APPENDIX B 13 6 Version 1 23 MODEL 5000 SERIES MANUAL Figure 13 1 Regulator Adaptor K A G ADJ OUT IN OUT G K A ADJ IN Gs As Ks K G A R1 R2 V V G IN O As A Gs G K Ks LOAD SELECT ...

Страница 247: ...lator Adaptor Step 2 Regulated Voltage Out VOUT MIN and MAX Test The following two tests check VOUT min max for the regulator with a 1KΩ load Exact values may also be measures Additional tests can be entered to test the regulator under other load conditions Use RGK load on the 5000 Series Tester front panel for any loads not supplied internally To test VO of 5V with a 5mA load make the following e...

Страница 248: ... LOAD 1KΩ internal or program electronic load 5mA Note The IMAX entry will include the regulator load current The quiescent no load current can be tested by programming the load to open circuit Step 4 Load Regulation Test 4 VOUT 5 1V IMAX 800mA VIN 10V LOAD 500mA electronic load Test 5 Reg 5 Load Regulation calculation Reg 100 S4 S2 S2 Note S4 Test 4 is VOUT 500mA and S2 Test 2 is VOUT 5mA Step 5 ...

Страница 249: ... fixtures are required to plug into the Opto Adaptor so that the proper pin connections can be made Figure 13 3 Opto Adaptor Schematic E B C Cs Es K A K2 K1 RELAY 1 RELAY 2 12V Ks EMMITTER K COLLECTOR A As Gs K2 K1 100 L1 GND BASE G FRONT OF ADAPTOR USE ONLY EXACT REPLACEMENT RELAYS TRANSISTOR OPTO ADAPTOR JACKS 5000 SERIES FRONT PANEL OPTO ADAPTOR ENCLOSURE ...

Страница 250: ...APPENDIX C 13 10 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 251: ... mainframe A Kelvin test is performed by completing a path through all drive and sense leads as follows Figure 13 4 Kelvin Test Adaptor One volt is applied from A to K If the device under test is properly connected a path will be completed across the device leads The minimum required current to pass the Kelvin test is programmable 100mA to 900mA in 100mA increments to allow for cable lengths Binni...

Страница 252: ...APPENDIX D 13 12 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 253: ...rd SWITCH DESCRIPTION OFF Standard ON 1 Not Used 2 Display Type Segment Dot Matrix 3 Kelvin Test external Disabled Enabled 4 Low Current Deck Disabled Enabled 5 High Current Deck Limit 500A 1000A 6 High Current Deck Disabled Enabled 7 High Source Limit 1000V 2000V 8 Not Used Table 13 2 Options Dipswitch Settings Hardware must also be installed for selected options ...

Страница 254: ...APPENDIX E 13 14 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 255: ... can be much higher than the true ICEO value and will probably occur at a decade boundary i e 9 9μA 99 9μA 0 99mA etc This condition can be eliminated if an ICER ICES or ICEV test is used The base lead cannot float under these conditions and the test result is consistent and accurate Most power transistor specifications list at least one of these tests These tests program the same as an ICEO test ...

Страница 256: ...tter to an open base emitter with a specified inductive load at the specified collector current By performing the test in this way the energy to the device is limited and as the breakdown voltage increases the applied pulse narrows making the pulse width variable Pulses are often as short as 10μS with vendor specified inductances The 5000 Series Tester Model 5300HX can perform this test using the ...

Страница 257: ...alues of VAK This can be seen by visualizing a vertical load line RL 0 and reducing VAK until the vertical line is tangent to the thyristor characteristic The holding current is highest under this condition The holding current then does vary somewhat with anode load but then anode loads vary with applications It may be important in some cases to test holding current with the anode load used in a s...

Страница 258: ...APPENDIX F 13 18 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 259: ... Logic devices The following tests are provided VF IR VOH VOL IFON IFOFF Hysteresis calculation Figure 13 6 Opto Logic Adaptor Schematic Figure 13 6 illustrates the basic operation of the Opto Logic Adaptor with a Series 5000 Tester An external load RL Ext is programmable In Out and the 5 Volt bias supply is normally On Figure 13 7 Opto Logic IFON and IFOFF ...

Страница 260: ... 5V Bias On VOL Test The VOL test measures the low output voltage Off Positive Logic On Negative Logic See Figure 13 6 for details VOL Limit Entry IOL Bias Entry RL Ext On Off Logic Pos Neg IF Entry Enabled if Negative Logic Disabled if Positive Logic 5V Bias On IFON Test IFON is the current required to cause the device output to change from OFF to ON IFON is determined by ramping the current up u...

Страница 261: ... the device is turned ON IFOFF is determined by ramping the current down until the device turns OFF after first turning the device on see Figure 13 7 Logic Pos Neg 5V Bias On RL EXT On Off Entries o IFOFF limit o VOL and IOL Pos Logic o VOH and IOH Neg Logic Hysteresis Calculation Hysteresis is the computed value of IFON divided by IFOFF HYST IFON IFOFF ...

Страница 262: ...APPENDIX G 13 22 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 263: ...ositive tests are described reverse tests are performed identically with negative polarity All tests can be run go no go or measured values 13 1 6 VCLAMP VCLAMP test measures the device voltage at a programmed current drive level If the device does not fire on the measured level will be high conversely if the device does fire on the measured value will be low This test can be used to confirm the d...

Страница 264: ...e test is to be used to determine the peak voltage prior to firing use the IBO test to confirm the device fires at the programmed IBO level Note also that some devices exhibit a negative resistance characteristic prior to firing VBO therefore is not the firing voltage for this kind of device Refer to manufacturers specifications Figure 13 10 SSOVP VBO TEST 13 1 9 IH The IH test confirms the device...

Страница 265: ...the source as a source limited only by the series RGS Simply set the IH limit to a value above the current that can be obtained with the RGS and programmed compliance voltage Select the RGS value prudently To obtain measured values the RGS value should not be set so high that the entire compliance voltage drop is used by IH x RGS Allow at least 25 headroom i e 20V for an 80 Volt source Normally se...

Страница 266: ...e programmed IT current value The IT pulse is then applied for a period of 300 μSecs at the end of which the VT measurement is made Figure 13 13 SSOVP VT TEST Circuit Diagram Figure 13 14 SSOVP VT Test Waveform 13 1 11 VZ This is a zener test that provides measurement of the zener voltage of the device at the programmed current level 13 1 12 ID This is a leakage test that provides measurement of t...

Страница 267: ...or Connect the 25 pin D Sub control cable from the 5000 Series Tester rear panel labeled Handler Prober to the rear panel of the adaptor J3 Connect the 9 pin D Sub control cable from the 5000 Series Tester front panel labeled Adaptor Control to the rear panel of the adaptor J1 If the adaptor is to be used for manual testing connect the manual fixture device cable to the rear panel of the adaptor o...

Страница 268: ...APPENDIX H 13 28 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 269: ...pendix H are described below The STI 5000 Series Interface software automatically sets the appropriate Relays in the test program Relay Plan Impulse Reset Test This test confirms the device will release reset after being fired on and subjected to a 500 μSec pulse of current programmed up to 50A 200A with High Current Deck Figure 13 15 and Figure 13 16 describe the circuit diagram and waveform of t...

Страница 270: ...igure 13 17 VL Breakdown Circuit Diagram and Waveform SET UP LO AUX SRC S SET UP RL1 or RL2 IBO to FIRE ON ENABLE LO AUX SRC S RELEASE LO HI SRC S START TIMER I DECISION V OFF T to RESET RELEASE AUX SRC T NOTES 1 LO SRC 80V WITH 1A CLAMP 2 AUX SRC TO PROGRAMMED VOLTAGE V CONFIRM V 24 K33 K31 820 015uF SET TO 1800V A K PEAK DET FIRE SET UP PK DET CLOSE K31 START 100V uS EDGE DET EXPANDED 100V uS AT...

Страница 271: ...a triple ramp is used with each succeeding ramp applying a slower final ramp rate as shown in Figure 13 19 Figure 13 18 VB Breakdown Test Circuit Diagram Figure 13 19 VB Breakdown Test Waveform Continuity Test Access Test A continuity test is available as a resistance test from TIP to RING Figure 13 20 shows the circuit diagram for this test A K K1 VB READING TRIPLE RAMP SET UP K1 TRIPLE ...

Страница 272: ... the heater coil resistance and the answer is returned in ohms Figure 13 21 shows the circuit diagram for this test Figure 13 21 Coil Resistance Test Circuit Diagram Note See Appendix H for details of the other tests defined in the 5 Pin Module device family K A K19 J9 A To TIP J9 B To RING User Attached or cable to test shoe 80V I TIP RING S K27 K29 COMPLIANCE ...

Страница 273: ...ons of these test are provided in this section Interconnect Configuration A AS G GS K and KS leads are connected with a provided cable to the ADP 340 5G adaptor The adaptor fans out connections for COM A G1 G2 K1 and K2 so that a single dual or quad device can be tested 5000 SERIES TESTER A G K ADP 340 5G A COM K1 SIDE1 RING K2 SIDE2 TIP G1 G2 Figure 13 22 ADP 340 5G Interconnect Note 1 Negative R...

Страница 274: ... RAIL G2 SIDE 1 COM SIDE 2 G1 A Negative Rail K Positive Rail A1 Positive Rail K1 Negative Rail K2 Negative Rail A2 Positive Rail Figure 13 25 Complementary Dual Connection Note In order to test all four devices shown in Figure 13 25 it is necessary to test the following combinations G1 K1 G1 K2 G2 K2 G2 K1 The PCW software defaults the connections to G1 K1 and G2 K2 when a new test is entered The...

Страница 275: ...00V Figure 13 26 Gated IGT Test VGT VGT to 20V 80V Opt VGG to 600V Figure 13 27 Gated VGT Test POSITIVE RAIL NEGATIVE RAIL RL K VGG Negative VT A G IGT Ref RL K VGG Positive VT A G IGT Ref POSITIVE RAIL NEGATIVE RAIL RL K VGG Negative VT A G VGT Ref RL K VGG Positive VT A G Ref VGT ...

Страница 276: ... to 9 999V IF to 50A Figure 13 28 Gated VF Test ID ID to 200mA VDRM to 2KV Figure 13 29 Gated ID Test POSITIVE RAIL K VF A G Ref Negative IF NEGATIVE RAIL K VF A G Ref Positive IF POSITIVE RAIL K VDRM A G Ref Positive ID NEGATIVE RAIL K VDRM A G Ref Negative ID ...

Страница 277: ...A VGA GK to 600V Figure 13 30 Gated VBO Test IG IG to 200mA VGK GA to 2KV Figure 13 31 Gated IG Test POSITIVE RAIL K VBO A G Ref Positive IBO 100 DRIVE 220nF VGK NEGATIVE RAIL K VBO A G Ref Negative IBO 100 DRIVE 220nF VGA POSITIVE RAIL K A G IG Ref VGA NEGATIVE RAIL K A G IG Ref VGK ...

Страница 278: ...GK GA to 2KV Figure 13 32 Gated IGAS IGKS Test IBO IBO to 1A VGK GA to 600V Figure 13 33 Gated IBO Test POSITIVE RAIL K A G IGAS Ref VGA NEGATIVE RAIL K A G IGKS Ref VGK POSITIVE RAIL K VT A G Ref IBO 100 DRIVE 220nF VGK NEGATIVE RAIL K VT A G Ref IBO 100 DRIVE 220nF VGA 10 20V 10 20V ...

Страница 279: ...re 13 34 Gated IH Test VT VT to 9 999V IT to 49 9A IBO to 900mA VGK GA to 600V Figure 13 35 Gated VT Test POSITIVE RAIL K A G Ref IBO VGK NEGATIVE RAIL K A G Ref IBO VGA 10 VBIAS 10 VBIAS IH IH POSITIVE RAIL K VT A G Ref IBO 100 220nF VGK NEGATIVE RAIL K VT A G Ref IBO 100 220nF VGA 10 20V 10 20V IT IT ...

Страница 280: ...ENDIX I 13 40 Version 1 23 MODEL 5000 SERIES MANUAL IR IR to 200mA VR to 2KV VGK GA to 600V Figure 13 36 Gated IR Test POSITIVE RAIL K A G Ref VGK NEGATIVE RAIL K A G Ref VGA VR Negative IR VR Positive IR ...

Страница 281: ...the required holding current see Figure 13 37 This current is selectable in the test program see Figure 13 38 The device is monitored to confirm it recovers to its off state within the specified time limit 30mS max The reported parameter is the time in mS to recover If the device recovers within a time less than the specified limit the test passes Figure 13 37 10x1000 Simplified Schematic Figure 1...

Страница 282: ...P 340 5G self test use the Runtime Self Test Adaptor ADP 340 4 or ADP 340 5 or ADP 340 5G or ADP 340 4 5 5G Block menu selection This opens the Adaptor Self Test Box Be sure the ADP 340 4 5 5G Self Test Fixture is installed and the ADP 340 4 5 5G is connected correctly to the STI 5000 Series Tester Press the Start button on the 5000 Series Tester Note Blocks 1 23 except Blocks 12 through 17 test t...

Страница 283: ...operation of K on Dual OVP Board 8 11 K10 K34 both stuck NC 12 K10 K34 either stuck NC K14 stuck NC K9 stuck NO Confirms operation of K10 K34 on Dual OVP Board 9 13 K36 stuck NO 14 K35 stuck NO K14 stuck NO Confirms operation of K35 on Dual OVP Board 10 15 K14 stuck NO Confirms operation of K14 on Dual OVP Board 11 16 K35 stuck NC 17 K14 stuck NC Confirms operation of K14 K35 on Dual OVP Board 12 ...

Страница 284: ...rd 29 38 K8 stuck NC Confirms operation of K8 on Gated Board 30 39 K9 stuck NC Confirms operation of K9 on Gated Board 31 40 K24 stuck NO Confirms operation of K24 on Gated Board 32 41 K24 stuck NC Confirms operation of K24 on Gated Board 33 42 K2 stuck NC 43 K3 stuck NC Confirms operation of K2 K3 on Gated Board 34 44 K5 stuck NC Confirms operation of K5 on Gated Board 35 45 K22 stuck NC Confirms...

Страница 285: ...ck NO R3 Hi Confirms operation of K19 K20 on Gated Board 46 56 K20 stuck NC Confirms operation of K20 on Gated Board 47 57 K19 stuck NO Confirms operation of K19 on Gated Board 48 58 K28 stuck NC Confirms operation of K28 on Gated Board 49 59 K28 stuck NO Confirms operation of K28 on Gated Board 50 60 C1 or C2 bad Confirms value of C1 C2 on Gated Board 51 61 C3 bad Confirms value of C3 on Gated Bo...

Страница 286: ...ated 77 109 K2 stuck closed Confirms K2 not operated 78 110 K9 stuck NC D3 bad R11 R14 Hi L1 bad 111 R11 R14 Low Confirms K9 operated and D3 79 112 K9 stuck NO D4 bad Confirms K9 not operated and D4 80 113 D4 bad Confirms D4 81 114 D3 shorted Confirms D3 82 115 K12 K15 stuck open K13 stuck NO D6 bad 116 R11 low Confirms K12 K15 operated and K13 not operated 83 117 K15 stuck closed Confirms K15 not...

Страница 287: ... K5 K6 K7 or K8 stuck closed Confirms K4 K5 K6 K7 and K8 not operated 92 126 K4 stuck open R1 R6 High Confirms K4 operated 93 127 K5 stuck open R2 R7 High Confirms K5 operated 94 128 K6 stuck open R3 R8 High Confirms K6 operated 95 129 K7 stuck open R4 R9 High Confirms K7 operated 96 130 K8 stuck open R5 R10 High Confirms K8 operated Table 13 7 10x1000 Self Test Blocks 89 96 ...

Страница 288: ... through a 200 Ohm 0 1 resistor on the 10x1000 board both in the Positive and Negative directions The offset corrections are displayed 10 Amp Peak Pulse Current o Click the CAL 10x1000 button The peak current is measured and if necessary corrected automatically to 10 2 Amps minimum The peak current is displayed Loads o Select which load to calibrate and click the CAL xxxmA button o The selected lo...

Страница 289: ...APPENDIX I MODEL 5000 SERIES MANUAL Version 1 23 13 49 Figure 13 39 10x1000 Pulse Option Calibration Screen ...

Страница 290: ...APPENDIX I 13 50 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 291: ...programmed IZ current 10 RMS at 1 KHz The resultant 1 KHz voltage across the zener is extracted amplified and filtered to obtain the reported measurement The measurement is made by sampling the 1KHz voltage resultant and computing the RMS value An exact value is thereby obtained in a single test application test time is approximately 14 mSecs Figure 13 40 Zener Impedance Test 1 KHZ DETECT IZ 1 KHz...

Страница 292: ...APPENDIX J 13 52 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 293: ...es controls for use with auxiliary equipment in conjunction with the 5000 Series Tester The controls are activated using an EXTN external test programmed in the STI 5000 Series Interface software The Pass Fail result returned from the auxiliary equipment can be used in the Bin Sort Plan of the test program Figure 13 41 EXT 100 Schematic Diagram ...

Страница 294: ...ovide 12V Controls 6 and 7 when closed provide ground 12V return Start Test when closed provides 12V EOT The auxiliary equipment must supply drive for the EOT relay coil After receiving the Start Test the auxiliary equipment must set the EOT high relay off and then when the auxiliary equipment is finished must set the EOT low relay on this transition indicates the end of test low level must sink a...

Страница 295: ...The Pass Fail signal if used must be valid prior to the EOT transition and remain valid for at least 3 milliseconds A low level relay on capable of sinking at least 35 mA will be interpreted as a Fail and a high level relay off will be interpreted as a Pass ...

Страница 296: ...APPENDIX K 13 56 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 297: ...d a second VBO at finer resolution is determined The third ramp using the second VBO value determines the final high resolution answer This triple ramp method is fast requiring approximately 25 milliseconds and accurate using a 14 bit resolution A D converter IBO is computed by using the VG that occurred at VBO The applied VG is recorded at each step just as the trigger voltage was to determine VB...

Страница 298: ... specified current Valley voltage is measured using a separate standard test A math step is then used to subtract the valley voltage from the VBO IH VD ID VTM All of these Triac tests are included as standard tests in the 5000 Series Tester Figure 13 44 Quadrac Diac ADP 350 Adaptor S G BO V 200K 3K G T MT2 MT1 ADP 350 ADAPTOR ...

Страница 299: ...e unipolar as shown Other devices are bi directional Provision is made for both polarities of all tests parameters A multi ramp algorithm similar to the diac VBO test algorithm described above is used to determine VS A voltage is applied to the device in test through the 200K resistor in the ADP 350 Adaptor The voltage across the device is sampled and stored The resulting curve is examined to dete...

Страница 300: ... in the STS device complement 13 1 15 IB Tests Use IEBO NPN for positive blocking and IEBO PNP for negative blocking leakage current tests 13 1 16 VF Tests Use VBESAT NPN for positive VF and VBESAT PNP for negative VF tests 13 1 17 VS1 VS2 Compute this value using the equation VS1 VS2 ABS VS VS ...

Страница 301: ...at IBB typically 100μA IH Holding Current VT On Voltage VS Voltage Just Prior to Firing IS Current at which Device Fires RS Switching Resistance Figure 13 46 Sidac Characteristic VBO Test A stepped voltage ramp is applied to the Sidac device through a resistor in two successive applications in a manner similar to that used in the Diac device VBO test see Appendix L Figure 13 43 The maximum current...

Страница 302: ...test differs from the SSOVP test in that the applied current begins at 250 mA and is reduced in 1 mA steps until the device drops out it is a single test measure method VS Test VS is the device voltage just prior to the device firing on Current is applied at 80 of the measured IS value the minimum allowable current is 2 5mA The resulting measured voltage is VS IS Test IS is the current at which th...

Страница 303: ...y results Because IS values below 10mA result in an out of range RS value IS is limited to 2 5mA in the RS calculation see Figure 13 47 Figure 13 47 shows a typical Sidac test program Step 1 the IS test is run Step2 the IS test result is then limited to 2 5mA by calculation Step 3 80 if the IS result is calculated Step4 The VS test is run using the result of Step 3 Step 5 the VBO test is run Step ...

Страница 304: ...APPENDIX M 13 64 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 305: ...2 to the ADP 390 Control 1 and Control 2 via the two 25 pin to 25 pin D Sub cables provided Device Connector Pin Assignments One mating connector is provided with the Adp 390 it consists of Connector Cannon DL3 60P Backshell 249 2060 000 Locking Arm 204 0016 000 and pins 030 2415 003 Pin assignments are as in Table 12 xxx Pole 1 Com Drive ComK E2 Com Sense Cs1 D2 NC Drive NC1 F5 NC Sense NC1s F6 N...

Страница 306: ...he voltage steps time between steps percentage of Limit for starting voltage and percentage of limit for ending voltage Go No Go Test Sequence Check that all contacts are in the non operate position Drive relay coil to voltage specified in Limit entry Wait specified Step time Check that all contacts are in the operate position Datalog Measure Sequence Check that all contacts are in the non operate...

Страница 307: ... reached Report the voltage at which all of the contacts have switched back to the non operate position RCONT Test The RCONT test measures the contact resistance An A Form relay contact resistance is measured by first applying the VCOIL voltage then applying the contact current ICONT A C Form relay contact resistance is measured in the non operated position first then the VCOIL voltage is applied ...

Страница 308: ...APPENDIX N 13 68 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 309: ...Pin D Sup Control Cable External Relay Driver Board Energy Storage Inductor 25mH The ADP 410 provides a means to test VCESUS VCERSUS VCEVSUS as well as ICEV Sustaining tests require an energy storage inductor in series with the DUT charged to a specified current The inductor kicks back into the collector of the DUT when the base is opened or has reverse bias applied The adaptor is shown schematica...

Страница 310: ...t exceed the programmed IC 13 1 18 2VCEOSUS RBE OPEN Rev Bias OFF 13 1 18 3VCERSUS RBE EXT 1K or 10K Rev Bias OFF 13 1 18 4VCEVSUS RBE OPEN Rev Bias ON Note Maximum available reverse bias base current is the same as the IB test entry Be certain sufficient IB current is programmed to adequately drive the reverse bias condition 13 1 19 ICEV Use the ICEV test in the Transistor Device family This test...

Страница 311: ...s plus the RL EXT The adaptor is shipped with a 400 ohm RL EXT The following apply when using the ADP 100V AT VD 100V RL minimum must be 500 ohms Damage can result otherwise RL RL EXT 100 ohms applies to entire VD range when the ADP 100V is installed At VD 100V no internal RL s are available 100V Hi Source Option is required The ADP 100V is detected when installed If not installed programmed VD of...

Страница 312: ...APPENDIX P 13 72 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 313: ...ns A simplified schematic is shown in Figure 13 49 Device pins are assigned in the test program on a test by test basis See Section 6 6 6 for more information Pins may be assigned as follows Figure 13 49 ADP 401 Simplified Schematic G Pins 1 8 15 16 A Pins 9 16 K Pins 8 16 GND Pins 1 8 As an example for a quad opto coupler pins would be assigned as follows see Figure 13 50 Figure 13 50 Quad Opto S...

Страница 314: ...APPENDIX Q 13 74 Version 1 23 MODEL 5000 SERIES MANUAL Tests on first Opto Coupler o G Pin 1 o GND Pin 2 o A Collector Pin 16 o K Emitter Pin 15 ...

Страница 315: ...DEL 5000 SERIES MANUAL Version 1 23 14 1 14 APPLICATION NOTES The following application notes provide the user details about using the STI 5000 Series Tester and STI 5000 Series Interface software to accomplish various tasks ...

Страница 316: ...14 APPLICATION NOTES 14 2 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 317: ...DRM at 901 volts Test step 2 is the actual Triac VD test desired The voltage limit is unimportant as this step will not be used in the sorting The limit should be set to something close to the actual value to minimize autoranging time Test step 3 does the real work This is a calculation that actually works as follows Test step 1 is run and the result compared to in this case 1mA 0 001 If the resul...

Страница 318: ...APP 001 14 4 Version 1 23 MODEL 5000 SERIES MANUAL Figure 14 2 APP 001 Test Screen ...

Страница 319: ...APP 001 MODEL 5000 SERIES MANUAL Version 1 23 14 5 Figure 14 3 APP 001 Bin Sort Screen Figure 14 4 APP 001 Calculation Screen ...

Страница 320: ...APP 001 14 6 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 321: ...tilizes the ADP360 adaptor and can utilize the 5 Pin Module Kelvin test to eliminate the possible damage to the STI Tester caused by the handler accidentally not connecting the A and AS Refer to the figures below to accomplish this Step 1 Use the 5 Pin Module II test group as shown in below Note that Tip Common is the default which also sets all the correct relays for the SSOVP tests using the ADP...

Страница 322: ...APP 002 14 8 Version 1 23 MODEL 5000 SERIES MANUAL Figure 14 6 APP 002 Bin Sort Screen ...

Страница 323: ... cut and paste desired data into the SPC software Using the STI Datalog Capture to Excel method o Set up the STI PCW software to datalog and capture directly into Excel use the One Key Macro menu selection o Cut and paste desired data into the SPC software Using the STI PCW software and the Qualitran SPC PI software to collect data in real time o Requires STI SPC Real Time option o Use the STI PCW...

Страница 324: ...APP 003 14 10 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 325: ...ted are created Figure 14 7 APP 004 Data Information Screen The information in this file is typically initiated when the Exact Value window is opened and datalog data is set to capture All of the fields are free form entries The Start and Finish fields can easily be set to the current date and time by double clicking the mouse in the field The STI Lot Summary file can also include this Data Inform...

Страница 326: ...APP 004 14 12 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 327: ...ed to confirm the device is functional Note in this mode test step 1 is set for EOF If test step 1 fails the test sequence is aborted and Sort Fail is reported If test step 1 passes all of the remaining test steps in the test sequence are run The qualifying sort is determined and reported Figure 14 11 shows the data logged results Figure 14 10 shows the Bin Sort plan using the STI Sort mode Note t...

Страница 328: ...APP 005 14 14 Version 1 23 MODEL 5000 SERIES MANUAL Figure 14 9 APP 005 Bin Plan Screen Figure 14 10 APP 005 Sort Plan Screen ...

Страница 329: ...only the Sort Bin result is reported All every device is data logged and all tests are measured and reported along with the Sort Bin result Every Nth only every Nth specified by operator is data logged all the other devices are tested but only the Sort Bin result is reported Every Nth Sort 1 only every Nth specified by operator Sort 1 is data logged all other devices are tested but only the Sort B...

Страница 330: ... result is reported Using a right mouse click in the right pane will open the popup menu for lot summary data Clicking on the Lot Summary item will load the lot summary data and display it Left in this mode the lot summary pane will be updated after each test sequence Note this can dramatically reduce test throughput and is not recommended when the STI Tester is connected to a handler or prober ...

Страница 331: ... 6APP 006 Opto Switch The STI test program shown in Figure 14 13 provides an example of using the STI 5000 Series Tester to test opto switch devices such as those shown in Figure 14 14 Figure 14 13 Opto Switch Test Program Figure 14 14 Typical Opto Switch ...

Страница 332: ...APP 006 14 18 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 333: ... was it will indicate INVALID PROGRAM Execute an STI Go NoGo sequence o Command Tz GNG z Multiplex Station 0 indicates non multiplex example T0 GNG o Returns nothing o Data format after start SORT xx BIN yy where xx is the Sort number 1 99 and yy is the Bin 1 16 and or FAIL or EOP or EOF or KELVIN Execute an STI Datalog sequence o Command Tz DTA z Multiplex Station 0 indicates non multiplex exampl...

Страница 334: ... example D0 EVERY 15 o Returns nothing STI Bin counters o Command Bz xxxxx yy z Multiplex Station 0 indicates non multiplex xxxxx Bin counter function CLEAR BIN FAIL yy Bin 1 16 17 fail 18 kelvin for BIN or Test 1 96 for FAIL commands example B0 BIN 2 o Returns nothing for CLEAR command BIN command Program Name Total Count Total Fail Count Kevin Count Short Count Specified Bin Count FAIL command T...

Страница 335: ...ove Find the device o ibdev 0 7 0 13 1 0 Send a valid STI 5000 Series Test Program o ibwrt S0 o ibwrtf test program name and path o The front panel of the STI 5000 Series Tester will display RECEIVING PROGRAM and then PROGRAM RECEIVED Set the STI 5000 Series Tester to Go No Go mode o ibwrt T0 GNG Send the START command to the STI 5000 Series Tester o ibwrt T0 START Read and clear the IEEE 488 Serv...

Страница 336: ...APP 007 14 22 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 337: ...e PCW main window when a valid unused port is selected Confirm operation o Place the STI Self Test Fixture on the STI 5000 Series Tester o Click the Self Test button found on the lower left section of PCW Software main window task bar o Confirm the STI 5000 Series Tester display indicates SYSTEM TEST o Click the Start button located to the left of the self Test button on the STI PCW Software Mark ...

Страница 338: ...APP 008 14 24 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 339: ...iteria of the STI 5000 Series Tester Test Program and were greater than range The only information that can be determined is that the value is greater than not what the actual test value might be An Excel Macro STIStatsModule bas is included on the CD shipped with the STI 5000 Series Tester or may be obtained by contacting the factory This macro will create a simple statistics page using the data ...

Страница 340: ...APP 009 14 26 Version 1 23 MODEL 5000 SERIES MANUAL ...

Страница 341: ...MJE4353 TIP36C or E 4 TIP112 1 TIP117 1 TIP142 1 TIP147 1 DAC709 Burr Brown 1 V12R15 5 Reliability Inc 1 VJ247 VJ447 1 Component Level Spares Kit Designation Manufacturer Qty 1N914 4 1N4003 4 1N4754 1 1N5225 2 1N5402 2 1N4735 2 2N2222 1 2N2907 1 2N6071B 72B 73B 74B 75B 2 LTL 307E LED Lite On 5 Keyboard Switch blank Marquardt 6450 001 2 7 Amp picofuse Hi Src 4 5 Amp picofuse Lo Src 4 2 Amp AGC fuse...

Страница 342: ...Rose Enclosures 03050704 Large Test Fixture Enclosure 3 14 x 3 22 x 2 16 polycarbonate Rose Enclosures 03080806 Banana Jacks E F Johnson Concord 108 2303 621 01 2310 1 02 Suppression Coil Scientific Test FX COIL Ferrite Beads Allen Bradley F1832 1 06 Manufacturer s Addresses Textool 1001 Fountain Parkway Grand Prairie TX 75050 214 647 0392 Loranger 817 Fourth Ave Warren PA 16365 814 723 2250 Compo...

Страница 343: ...LEX 09 50 3061 1 L1 L2 27MH INDUCTOR 2 R20 27 OHM 1 4W 1 R19 470 OHM 1 4W 1 R8 1 5K 1 4W 1 R6 R7 2 2K 1 4W 2 R3 4 7K 1 4W 1 R5 5 6K 1 4W 1 R1 R2 R4 R15 R16 R17 10K 1 4W 6 R18 47K 1 4W 1 R10 249 OHM 1 1 R12 750 OHM 1 1 R13 3 29K 1 1 R9 41 2K 1 1 U1 74LS245 1 U2 74LS32 1 U3 74LS04 1 U4 74LS30 1 U5 74LS138 1 U6 U11 U16 P8255 3 U7 U8 U9 U10 U12 U13 7404N 6 U14 P8279 1 U15 74LS156 1 U18 TL497N 1 U17 LM...

Страница 344: ...F 100V NPO 6 C69 470PF 100V NPO 1 C5 560PF 100V NPO 1 C19 C62 C63 C65 1000PF 100V STABLE 4 C46 C47 C68 1200PF 100V NPO 3 C15 C23 2700PF100V STABLE 2 C50 5600PF 100V STABLE 1 C9 C10 01MF 100V STABLE 2 C64 033MF 100V STABLE 1 C56 C57 C58 C59 1MF 50V STABLE 4 C6 C7 C8 C11 C12 C16 C17 C18 C20 C21 C22 C24 C25 C26 C27 C28 C29 C30 C31 C32 C33 C34 C35 C36 C37 C38 C39 C40 C60 C61 C75 C76 1MF 50V BYPASS 32 ...

Страница 345: ...3 Q24 MJE4353 4 Q10 Q14 IRF610 2 Q11 Q15 IRF9610 2 Q12 Q13 Q18 Q19 2N6072B THRU 2N6575B 4 Q25 2N2222 1 Q26 2N2907 1 Q15 IRF9612 1 R12 R14 R16 R64 R66 R68 R70 R72 47 OHM 1 4W 8 R3 R4 R8 R9 R78 R79 R80 R81 R86 R87 R92 R95 R96 R97 R99 R102 R103 R106 R107 R108 R109 R110 R128 R129 100 OHM 1 4W 24 R88 R116 R138 R158 110OHM 1 4W 4 R7 R11 R160 200 ohm 1 4w 3 R1 R5 470 ohm 1 4w 2 R6 R10 R124 R148 R149 R154...

Страница 346: ...119 R120 SHORT 2 R141 R142 R143 10 POT TOP ADJ W 3 R153 25K POT TOP ADJ W 1 R18 100K POT TOP ADJ W 1 U5 U10 LF356N 2 U1 BURR BROWN 3583 1 U2 U3 4N38 2 U9 U15 U16 U17 U19 U20 LF411N 6 U7 U8 LF353N 2 U6 U32 74LS04 2 U12 U13 ULN2003A SN75468 2 U14 U31 74LS32 2 U18 8255 71055C 1 U21 U22 LF398N 2 U23 74LS245 1 U24 74LS138 1 U25 74LS365 1 U27 LM319N 1 U28 74LS00 1 U29 LMC13204 LF13202 1 6 PIN SOCKETS AM...

Страница 347: ... 35V TANTALALUM 4 C41 C42 01UF 200V POLY 2 C9 C10 C55 01UF 100V STABLE 3 C1 C2 1UF 100V BYPASS 2 C1 C2 C3 C4 C5 C10 C11 C12 C13 C14 C15 C24 C25 C26 C27 C28 C29 C34 C36 C68 C69 C70 C71 C72 C73 1N914 24 CR20 CR21 CR22 CR23 CR46 CR47 CR50 CR51 CR52 CR53 CR54 CR55 CR56 CR57 1N4003 14 CR1 CR6 CR35 CR45 1N5225 3 0V ZENER 4 CR9 1N4754 39V ZENER 1 CR48 CR49 1N4735 6 2V ZENER 2 CR7 CR8 NOT USED F1 F2 2 AMP...

Страница 348: ...R37 R38 20k 1 4w 1 6 R42 R42 30k 1 4w 1 2 R32 R33 51k 1 4w 1 2 R2 68k1 4w 1 1 R114 R115 100 1 4w 1 2 R35 R40 3 3M 1 2W 2 R20 1 OHM 25 4 LEAD 1 R22 1 OHM 1 TYPE 101 1 R2 10 OHM 1 TYPE 101 1 R26 100 OHM 1 TYPE 10 1 R27 R93 R104 R117 R139 1K 1 RN60 5 R28 R91 R94 R100 R101 R105 R118 R140 10K 1 RN60 8 R89 R90 20K 1 RN60 2 R21 100K 1 RN60 1 R23 1M 1 RN60 1 R130 R131 R134 R135 33 OHM 1W 4 R29 R30 300 OHM...

Страница 349: ...ty 80 VOLT LO SOURCE MODIFICATION TO REV E CHANGE THE VALUES OF C15 C23 2700PF 100V STABLE C5 560PF 100V NPO C9 C10 01UF 200V F3 F4 10AMP PICOFUSE Q7 Q8 MJE4343 Q21 Q22 MJE4353 Q10 MJE340 INSTALL WITH HEATSINK UP Q11 MJE350 INSTALL WITH HEATSINK UP R2 150K R18 100K POT CHAANGE JUMER TO 65 R123 470 OHM 1 4W 1 R124 1K 1 4W 1 R34 R41 11K 1 4W 1 R32 R33 200K 1 4W 1 R44 45 4K 2W SPACE OFF BOARD U1 U10 ...

Страница 350: ...R84 274K 1 4W 1 2 R15 R40 33 2K 1 4W 1 2 R83 1 8M 1 4W 1 1 R17 R18 R47 R101 R17 R18 MATCHED RO 01 10K 1 RN60C1002B 4 R28 R30 R42 R57 R58 20 K 1 RN60C2002B 5 R104 R115 49 9K 1 RNC55C4992BS 2 R100 100K 1 RN60C1003B 1 RP1 1K NETWORK DALE CSC10A01102G 1 R32 R114 2K POT BOURNS 3296W 1 202 TOP ADJ 2 R7 R13 R19 R70 R75 10K POT BOURNS 3296W 1 103 TOP ADJ 5 R63 R64 R85 R86 R106 100K POT BOURNS 3296W 1 104 ...

Страница 351: ...U3 U20 U21 U29 U30 U31 U32 U33 U35 U48 U2 U4 U5 LF356N OP AMP 11 U6 U7 U8 LF411CN OP AMP 3 U24 LF400 1 U23 U26 LM311 OP AMP 2 U18 U22 U25 LF398N SAMPLE HOLD 3 U13 U36 74LS32N 2 U39 74LS138N 1 U38 74LS04N 1 U11 U37 74LS04N 2 U9 DAC709KH BURR BROWN 1 U41 U42 NEC 8255AC 5 UPD 71055C 2 U40 U43 74LS245N 2 U10 74LS00N 1 U44 U47 OPA602BP BURR BROWN 1 U27 SHC5320 BURR BROWN SAMPLE AND HOLD 1 U28 ADC700KH ...

Страница 352: ...1 3 7 10 14 19 21 25 28 35 102 103 A FORM RELAY 12V ALEPH DA1A12DWD HAMLIN HE731A1210 27 K36 K37 C FORM RELAY 12V COTO 2721 12 0 2 K2 15 18 20 26 27 101 104 106 C FORMCLARE HGJM51111P00 12V 12 Q1 TIP147 1 Q2 TIP142 1 Q101 102 2N4117 2 Q107 110 2N3904 4 Q103 106 2N2222A 4 R91 10 1 4W 1 1 R25 30 37 38 42 45 47 50 52 53 59 60 62 63 71 74 85 113 118 125 125 27 1 4W 1 36 R111 112 100 1 4W 1 2 R24 31 56...

Страница 353: ...74LS245 2 U19 34 BURR BROWN OPA445BM NATIONAL LM343H 2 U102 112 PGA202 BURR BROWN 2 U107 74LS138 1 U101 103 OPA602 BURR BROWN 2 U28 LF353N 1 U32 105 74LS04 1 U108 75LS20 1 80 VOLT LO SOURCE OPTION C21 C22 1 MF 200V BYPASS 2 R86 100K POT W 1 U19 U34 SINGLE PIN SOCKETS CONCORD 09 9006 1 03 16 U19 U34 BURR BRN 3583 2 2000 VOLT HI SOURCE OPTION C40 100PF 200V NPO 1 F1 3 0 AMP AGC 1 R41 3 3 OHM 1 4W 1 ...

Страница 354: ... Panel Assembly Table 15 11 LCD Front Panel Assembly 15 11 2 Rear Panel Assembly Table 15 12 LCD Rear Panel Assembly 15 11 3 Base Plate Assembly Reference Designation Description Qty BANANA JACK CONCORD 09 9136 1 04410 16 PUSH BUTTON SWITCH ALCO MSPM 101C 1 1 PUSHBUTTON CAP ALCO C 23 2 RED 1 PUSH BUTTON GUARD ALCO G 13KA 1 TOGGLE SWITCH ALCO MTA 106 1 9 PIN D SUB SOCKET AMPHENOL 17 10090 1 WITH PI...

Страница 355: ...LE ANSLEY 171 50 7 BAIL MOUNT CLIP ANSLEY609 320 2 CARD GUIDE SUPPORT UNITRACK VL7500 4 CARD GUIDE UNITRACK RAD4125 4 BASE PLATE STI 500 102 1 Reference Designation Description Qty R1 3 3M 1 2W 1 R2 1K 1 4W 1 R4 10M 1 1 BANANA PLUG PCB CONCORD 01 2255 6 01 10 SPACER 1680 632 SS 5 SCREW 6 32 X SS 10 PLEXIGLASS COVER 510 009 LP 1 Reference Designation Description Qty C1 100PF 3000V 1 C2 047 UF 1600V...

Страница 356: ...C4 C5 C7 C8 C9 C10 C11 1UF 50V BYPASS 8 CR1 CR2 CR3 CR4 CR5 CR6 CR7 CR8 1N4003 8 K2 K3 K4 K5 K6 K7 K10 K11 K12 K13 K15 K16 K17 HAMLIN HE731A1210 A FORM 13 K9 K14 COTO 2721 12 0 OR 1 C FORM 2 K8 CLARE HGJM51111POO 1 K1 NOT USED R2 R6 1K POT X SIDE ADJUST 2 R29 100K POT X SIDE ADJUST 1 R1 R17 R18 R20 R21 R22 R23 R24 R25 R33 R36 100 OHM 1 4W 11 R28 110 OHM 1 4W 1 R12 3 3K 1 4W 1 R14 R19 4 7K 1 4W 2 R...

Страница 357: ...D GUIDE SCANBE 309 75 CARD GUIDE SCANBE T 309 60 SPACER 75 SCANBE T101 750 SPACER 50 SCANBE T101 500 SPACER 30 SCANBE T101 300 SPACER 25 SCANBE T101 250 SPACER 173 SCANBE T101 173 SPACER 10 SCANBE T101 100 MOUNTING FOOT SCANBE A 305 A 50 PIN CARD EDGE CONNECTOR VIKING 3VT50 2CNK5 12 PIN HOUSING SOCKET AMP 1 480709 0 MATE N LOK 2 PIN HOUSING SOCKET AMP 1 480699 0 MATE N LOK PIN PLUG AMP 350 690 3 8...

Страница 358: ...B BLANK 09 90 1081 1 6 PIN HOUSING MOLEX 09 50 3061 SRC OUT 4 GOLD HOUSING PINS MOLEX 08 56 0106 16 J4 J5 26 PIN PCB HEADER 609 2604E 2 K1 K2 K3 K4 K5 K6 K7 K8 K9 K10 K11 K12 K13 K14 K15 K16 K17 K18 CLARE HGJM51111P00 18 U1 RESISTOR NETWORK MDP1401 102G 1 U2 74LS138 1 U3 ULN2003 SN75468 1 U4 74LS379 1 U5 74LS365 1 14 PIN SOCKETS BURNDY DILB 14P 108 1 16 PIN SOCKETS BURNDY DILB 16P 108 4 SINGLE PIN...

Страница 359: ...12 1 Q15 TIP117 1 R12 R14 R16 R64 R66 R68 R70 R72 R123 47 OHM 1 4W 9 R3 R4 R80 R81 R99 R102 R103 R106 R128 R129 100 OHM 1 4W 10 R7 R11 200 OHM 1 4W 2 R1 R5 470 OHM 1 4W 2 R6 R10 R124 1K 1 4W 3 R62 R63 R125 R126 2 2K 1 4W 4 R60 R61 3 3K 1 4W 2 R31 R50 R52 R55 R57 R200 10K 1 4W 6 R53 R54 20K 1 4W 2 R58 R59 30K 1 4W 2 R48 R49 47K 1 4W 2 R2 68K 1 4W 1 R51 R56 3 3M 1 2W 2 R13 R15 R17 R65 R67 R69 R71 R7...

Страница 360: ...E340 1 Q3 Q4 MJE15031 2 Q5 Q6 MJE15030 2 Q7 Q8 Q9 Q20 TIP35B CUT TABS 4 Q21 Q22 Q23 Q24 TIP36B CUT TABS 4 R12 R14 R16 R64 R66 R68 R70 R72 R123 47 OHM 1 4W 9 R3 R4 R80 R81 R128 R129 100 OHM 1 4W 6 R7 R11 200 OHM 1 4W 2 R1 R5 470 OHM 1 4W 2 R6 R10 R124 1K 1 4W 3 R125 R126 2 2K 1 4W 2 R31 R200 10K 1 4W 2 R2 68K 1 4W 1 R13 R15 R17 R65 R67 R69 R71 R73 1 OHM 1 RS1A 8 R19 01 OHM 5 RIEDON SP1043 4 LEAD 1 ...

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