NimbleGen MS 200 Microarray Scanner Operator’s Manual v1.0
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Detector(s) Test
. Evaluates the detector’s noise. Data are acquired with closed
detector and gain set to defined values listed in the report.
Laser(s) Test
. Reviews the integrity of the laser light sources. For each laser,
the excitation light is reflected on the ILC slide, and the noise is measured
with the detector. Additionally, the laser light intensity is measured with a
reference photodiode.
Optical Alignment Test
. Verifies the alignment and stability of the optical
system. For this test, Z scans on a blank glass area are performed.
Autofocus Test
. Checks the reliability of the autofocus and the slide transport
subsystem while performing several Z scans using different parameters on
the ILC slide.
Optical Resolution Test
. Scans defined test structures (i.e. line gratings with
high-low reflectivity parallel to the X and Y axes) on the ILC slide to provide
information on optical resolution.
Sensitivity Tests
. Check the overall performance of components that are
relevant for sensitivity: electronics, detectors, lasers, alignment, and filter
blocking.
Positioning Test
. Verifies and, if necessary, recalibrates the position of the
slide transport (X and Y axes) relative to the measurement optics. Defined
position marks on the ILC slide are scanned.
Geometric Linearity Test
. Checks for X and Y axes and if necessary,
recalibrates (Y axis only) the image linearity within scanned images. Defined
straight line patterns on the ILC slide are scanned to evaluate the image
linearity in the X and Y directions.
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