1 GENERAL
EM210F-1
1-1
The JEM-2100F is a high resolution analytical electron microscope in the van of the new
era accomplished by further improving the JEM-2101F field emission electron
microscope that had a ultra high image quality and resolution in 200 kV class electron
microscopes. The various optional attachments such as a scanning image acquirement
unit are provided for the JEM-2100F to give full play to the microscope performance
over the application especially in the material, biological and medical fields.
The following are the main features of the JEM-2100F.
·
New control system
The built-in computer assures the programmed control of the microscope operation
and centralized various attachments. The optimum lens data and beam deflector
data are collectively managed to ease the reproduce the lens condition on the GUI
instantly enabling everyone to use such data in anytime. The conventional micros-
copy while observing the image on the fluorescent screen is possible.
·
Newly developed goniometer
The use of a new servomotor improves the specimen stage driving circumstances.
The image shifting in high magnification will be further eased when a piezo-drive
mechanism (on optional attachment) is employed.
·
New column basement
The microscope column supporting point is located near the column barycenter and
passive air-mounts are used to improve the mechanical stability affected mainly by
external vibration. Inconsequence of the above improvements, microscope installa-
tion room restriction is relaxed. Only this passive air-mounts can be used instead of
the large-scale vibration-prove system required for the original microscope column
frame.