TEST FEATURES
15-8
15.3.3
Boundary Scan Instruction Set
The i960 Jx processor supports three mandatory boundary scan instructions
bypass
,
sample
/
preload
and
extest
. The i960 Jx processor also contains two additional public instructions
idcode
and
runbist
.
Table 15-2
lists the i960 Jx processor’s boundary scan instruction codes.
15.3.4
IEEE Required Instructions
Table 15-2. Boundary Scan Instruction Set
Instruction Code
Instruction Name
Instruction Code
Instruction Name
0000
2
extest
1000
2
private
0001
2
sampre
1001
2
not used
0010
2
idcode
1010
2
not used
0011
2
not used
1011
2
private
0100
2
private
1100
2
private
0101
2
not used
1101
2
not used
0110
2
not used
1110
2
not used
0111
2
runbist
1111
2
bypass
Instruction
/ Requisite
Opcode
Description
extest
IEEE 1149.1
Required
0000
2
extest initiates testing of external circuitry, typically board-level interconnects
and off chip circuitry. extest connects the Boundary-Scan register between TDI
and TDO in the Shift_IR state only. When extest is selected, all output signal pin
values are driven by values shifted into the Boundary-Scan register and may
change only on the falling-edge of TCK in the Update_DR state. Also, when
extest is selected, all system input pin states must be loaded into the
Boundary-Scan register on the rising-edge of TCK in the Capture_DR state.
Values shifted into input latches in the Boundary-Scan register are never used
by the processor’s internal logic.
sampre
IEEE 1149.1
Required
0001
2
sample/preload performs two functions:
•
When the TAP controller is in the Capture-DR state, the sample instruction
occurs on the rising edge of TCK and provides a snapshot of the
component’s normal operation without interfering with that normal operation.
The instruction causes Boundary-Scan register cells associated with outputs
to sample the value being driven by or to the processor.
•
When the TAP controller is in the Update-DR state, the preload instruction
occurs on the falling edge of TCK. This instruction causes the transfer of
data held in the Boundary-Scan cells to the slave register cells. Typically the
slave latched data is then applied to the system outputs by means of the
extest instruction.
Содержание i960 Jx
Страница 1: ...Release Date December 1997 Order Number 272483 002 i960 Jx Microprocessor Developer s Manual ...
Страница 24: ......
Страница 25: ...1 INTRODUCTION ...
Страница 26: ......
Страница 35: ...2 DATA TYPES AND MEMORY ADDRESSING MODES ...
Страница 36: ......
Страница 46: ......
Страница 47: ...3 PROGRAMMING ENVIRONMENT ...
Страница 48: ......
Страница 73: ...4 CACHE AND ON CHIP DATA RAM ...
Страница 74: ......
Страница 85: ...5 INSTRUCTION SET OVERVIEW ...
Страница 86: ......
Страница 111: ...6 INSTRUCTION SET REFERENCE ...
Страница 112: ......
Страница 195: ...INSTRUCTION SET REFERENCE 6 83 6 Opcode mov 5CCH REG movl 5DCH REG movt 5ECH REG movq 5FCH REG See Also LOAD STORE lda ...
Страница 233: ...7 PROCEDURE CALLS ...
Страница 234: ......
Страница 256: ......
Страница 257: ...8 FAULTS ...
Страница 258: ......
Страница 291: ...9 TRACING AND DEBUGGING ...
Страница 292: ......
Страница 309: ...10 TIMERS ...
Страница 310: ......
Страница 324: ......
Страница 325: ...11 INTERRUPTS ...
Страница 326: ......
Страница 369: ...12 INITIALIZATION AND SYSTEM REQUIREMENTS ...
Страница 370: ......
Страница 412: ......
Страница 413: ...13 MEMORY CONFIGURATION ...
Страница 414: ......
Страница 429: ...14 EXTERNAL BUS ...
Страница 430: ......
Страница 468: ......
Страница 469: ...15 TEST FEATURES ...
Страница 470: ......
Страница 493: ...A CONSIDERATIONS FOR WRITING PORTABLE CODE ...
Страница 494: ......
Страница 502: ......
Страница 503: ...B OPCODES AND EXECUTION TIMES ...
Страница 504: ......
Страница 515: ...C MACHINE LEVEL INSTRUCTION FORMATS ...
Страница 516: ......
Страница 523: ...D REGISTER AND DATA STRUCTURES ...
Страница 524: ......
Страница 550: ......
Страница 551: ...GLOSSARY ...
Страница 552: ......
Страница 561: ...INDEX ...
Страница 562: ......
Страница 578: ......