GE M
EDICAL
S
YSTEMS
PROPRIETARY TO GE
D
IRECTION
2294854-100, R
EVISION
3
LOGIQ™ 9 P
ROPRIETARY
M
ANUAL
7-30
Section 7-7 - Acquisition Diagnostics
7-7-4-8System-Level Analog Diagnostics
•
Power Supply Diag
: Tests the System voltages available on the EQ. This diagnostic tests the
following:
-
Power supply voltage rail generation.
-
Voltage rail loading by installed circuit boards (insomuch as there are no faults on these)
-
Pulser HV Level Select functionality, base on the Scan Bus tag
-
IIC functionality on the EQ.
The system's voltage rails are read from IIC-connected A/D converters on the EQ.
The system setup required for this test is shown in Figure 7-30.
•
Temperature Diag
: Tests the temperature of the system, wherever available.
This test will utilize the temperature sensing ability built into the IIC-connected A/D converters on
the TD, RF Amplifier, and EQ. These are the same A/D converters utilized in the Analog Reference
Diagnostic, Power Supply Diagnostic, and Analog TGC Diagnostic. Also, the probe temperature
sensing ability is tested.
The system setup required for this test is shown in Figure 7-31.
•
Noise Floor Diag
: Measures the noise floor of the System.
The entire system is required for this diagnostic. The noise floor will be calculated from IQ data
received without a signal source.
Figure 7-30 Power Supply System Setup Block Diagram
Figure 7-31 Probe Temperature Monitoring System Setup Block Diagram
XDIF/RF
TD’s
EQ
BMP
Scan Control Board
Host
PCI
PCI
PCI
IQ,
RxSYNC
BM
IQ
IIC
RF
Probe
RF
TD
CTRL
TxSYNC
RxSYNC
TxSYNC
TxSYNC
XDIF/RF
TD s
EQ
BMP
Scan Control Board
Host
PCI
PCI
PCI
IQ,
RxSYNC
BM
IQ
IIC
RF
Probe
RF
TD
CTRL
TxSYNC
RxSYNC
TxSYNC
TxSYNC