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Appendices
Glossary
A
A-5
offset error
Same as zero error. The reading shown on a meter when an input value of zero is applied
is its offset or zero error.
parameters
Independent variables in a measurement process such as temperature, humidity, test lead
resistance, etc.
precision
The precision of a measurement process is the coherence, or the closeness to the one
result, of all measurement results. High precision, for example would result in a tight
pattern of arrow hits on a target, without respect to where on the target the tight pattern
falls.
predictability
A measure of how accurately the output value of a device can be assumed after a known
time following calibration. If a device is highly stable, it is also predictable. If a device is
not highly stable, but its value changes at the same rate every time after calibration, its
output has a higher degree of predictability than a device that exhibits random change.
primary standard
A standard defined and maintained by some authority and used to calibrate all other
secondary standards.
process metrology
Tracking the accuracy drift of calibration and other equipment by applying statistical
analysis to correction factors obtained during calibration.
random error
Any error which varies in an unpredictable manner in absolute value and in sign when
measurements of the same value of a quantity are made under effectively identical
conditions.
range
The stated upper end of a measurement device’s span. Usually, however, a measurement
device can measure quantities for a specified percentage overrange. (The absolute span
including overrange capability is called “scale.”) In the 5820A, however, range and scale
are identical.
reference amplifier
DC voltage references developed for the 5820A. These are 6.9 V devices consisting of a
zener diode and a transistor. These reference amplifiers exhibit extremely low uncertainty
and drift, and are superior to zener diode or temperature-compensated zener diode
voltage references.
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