Technical Specifications and Purchased Options
B-1
B
T
ECHNICAL
S
PECIFICATIONS
AND
P
URCHASED
O
PTIONS
DEKTAK 150 TECHNICAL SPECIFICATIONS
Table B-1: Dektak 150 Technical Specifications
SYSTEM
Measurement Technique
Stylus profilometry (contact)
Measurement Capability
Two-dimensional surface profile measurement (standard)
Sample Viewing (Camera and Optical
Assembly)
• 640 x 480-pixel (1/3 in.-format) color camera, USB
• Fixed magnification optics, 2.6 mm FOV (166X with 17 in. monitor)
• Optional manual zoom optics, variable 0.67 to 4.29 mm FOV (644X to
100X with 17 in. monitor)
Sample Illumination
Variable intensity white-light LED
Stylus Sensor
Low-Inertia Sensor (LIS 3)
Stylus Force
1 to 15 mg with LIS 3 sensor; 0.03 to 15 mg with
N
-Lite sensor option
Stylus Options
25
μ
m, 12.5
μ
m, 5
μ
m, 2.5
μ
m, 0.7
μ
m, 0.2
μ
m, 50 nm super sharp tip,
High Aspect Ratio (HAR) 2 x 10
μ
m, HAR 20 x 200
μ
m
Sample-Positioning Stage
• Standard manual X-Y/theta, 100 x 100 mm X-Y translation, 360-
degree rotation
• Manual leveling
• Two-point programmable or cursor software leveling
Automation Stage (Optional)
•Y auto stage, 100 mm (4 in.) travel, 5
μ
m repeatability, 0.5
μ
m
resolution
• X-Y auto stage, 150 mm (6 in.) travel, 5
μ
m repeatability, 0.5 nm
resolution
Summary of Contents for Dektak 150
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