ERR009218
Chip Errata for the i.MX 6Dual/6Quad and i.MX 6DualPlus/6QuadPlus, Rev. 6.1, 06/2016
NXP Semiconductors
97
Description:
During boundary scan test, a subset of the EIM signals will not be driven as outputs causing the
test to fail. The affected signals are: EIM_A[24:16], EIM_DA[15:0], EIM_EB[3:0], EIM_RW,
EIM_WAIT and EIM_LBA. This group of signals is incorrectly configured with a drive strength
value (DSE) of 3’b000, which causes the signals to be Hi-Z.
Projected Impact:
Boundary scan test will fail to drive outputs on the signals listed above. These signals can be tested
as input-only.
Workarounds:
Because the signals listed above cannot be driven as outputs, interconnect tests on these signals can
only be performed if the external devices connected to these pins can drive them as inputs. The
boundary scan test generation tool should be configured to test these signals as input-only, if
possible. Test of any of the signals that cannot be driven by an external device should be disabled
in the boundary scan test generation tool to prevent generation of an incorrect test pattern.
Proposed Solution:
No fix scheduled
Linux BSP Status:
Software workaround is not implemented because this erratum will never be encountered in normal
device operation.
ERR009218
EIM: Signals fail to drive as outputs during boundary scan test
