Page 9 Leica EM TIC 3X Operating Manual 07/17
2.
Product description
2.1
Field of application and proper use
The Leica EM TIC 3X Triple Ion Beam Cutter system is used for precise processing
of samples for subsequent examination with an electron microscope (EM) or light
microscope (LM). For this purpose, a cross-section or ion beam polished surface of a
sample is created with the Leica EM TIC 3X Triple Ion Beam Cutter system.
The samples are processed with ion beams in a vacuum. The system generates ions
in the energy range from 1 keV to 10 keV.
A variety of sample preparation equipment (stages) can be used to adapt the Leica
EM TIC 3X
to the application needs (e.g. cryo stage). Hence, almost any material can
be processed, e.g. semiconductors, metals, rocks, ceramics, polymers, rubber,
paper, environment sensitive and even biological material.
Please refer to separate operating manuals of stages you ordered!
The ion energy causes the temperature of the sample to increase during processing.
The operator must ensure that this does not cause the sample's state of aggregation
to change. If so, using the cooling stage is recommended.
The Leica EM TIC 3X must not be used beyond the limits specified in its technical
data sheet.
An inert gas, preferably argon, is used as the working gas. If other gases are used for
reactive processing of samples, the appropriate safety measures (purging, removal of
exhaust air) must be put in place, not only for the working gas, but also for the
reaction by products created during processing. To make sure the system will be
suitable for other gases than argon please contact the Leica representative prior to
use.
When hazardous substances (e.g., radioactive, toxic or explosive substances) are
processed
the substance-specific safety precautions must
be implemented. It is
forbidden to process substances that release corrosive or poisonous gases when
they are cut with an ion beam. When hazardous substances have been processed
the system (chamber) must be decontaminated before servicing the instrument.
Applications other
than those described are inconsistent with proper use and are
therefore prohibited. If the system is used incorrectly, all claims under warranty will
be not accepted.
In cases of doubt, please consult your local Leica representative.
