Keysight N5990A MIPI M-PHY Receiver Test User Guide
157
HS Tests
5
Procedure
The data generator sends Burst-mode CJTPAT signaling while the DUT is
configured for Terminated-mode. For eye-closure, this procedure uses
only the ISI channel and no additional jitter is injected to the signal.
In
Compliance Mode
, the data generator sets the calibrated accumulated
differential voltage to the target value (40mV) and the common mode level
to the nominal value (150mV) according to the specifications.
In
Expert Mode
, a sweep of the accumulated differential voltage is done
over the given range.
At each step the BER is measured and compared with the Target BER to
consider the pass/fail result.
This test is performed for all selected HS lanes and gears (see
). It
is only required for the Terminated case. In Unipro Test Mode, with the
option “Lane Test Mode” set to Simultaneously, the different lanes are
tested in parallel for each gear.
Connection Diagram
show the connection diagrams for the different
system configurations.
WARNING
During the Accumulated Differential Voltage Calibration, if the
Differential Voltage Start Value is increased to achieve the Minimum
Accumulated Differential Voltage (that is, 40 mV), it could happen that
the Differential Amplitude set during this test to achieve the required eye
opening is outside of the specification values and may damage the DUT.
NOTE
The connection diagrams shown are for Gear1. They are the same for
Gear2 and Gear3, but vary in the TTC value (G1: 250ps; G2: 125ps; G3
and G4: 60ps).
Summary of Contents for N5990A
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