NXP Semiconductors K32 L2A Series, Справочное руководство, Страница: 186 / 1379

ADCx_CFG2 field descriptions
Field Description
31–8
Reserved
This field is reserved.
This read-only field is reserved and always has the value 0.
7–5
Reserved
This field is reserved.
This read-only field is reserved and always has the value 0.
4
MUXSEL
ADC Mux Select
Changes the ADC mux setting to select between alternate sets of ADC channels.
0 ADxxa channels are selected.
1 ADxxb channels are selected.
3
ADACKEN
Asynchronous Clock Output Enable
Enables the asynchronous clock source and the clock source output regardless of the conversion and
status of CFG1[ADICLK]. Based on MCU configuration, the asynchronous clock may be used by other
modules. See chip configuration information. Setting this field allows the clock to be used even while the
ADC is idle or operating from a different clock source. Also, latency of initiating a single or first-continuous
conversion with the asynchronous clock selected is reduced because the ADACK clock is already
operational.
0 Asynchronous clock output disabled; Asynchronous clock is enabled only if selected by ADICLK and a
conversion is active.
1 Asynchronous clock and clock output is enabled regardless of the state of the ADC.
2
ADHSC
High-Speed Configuration
Configures the ADC for very high-speed operation. The conversion sequence is altered with 2 ADCK
cycles added to the conversion time to allow higher speed conversion clocks.
0 Normal conversion sequence selected.
1 High-speed conversion sequence selected with 2 additional ADCK cycles to total conversion time.
ADLSTS Long Sample Time Select
Selects between the extended sample times when long sample time is selected, that is, when
CFG1[ADLSMP]=1. This allows higher impedance inputs to be accurately sampled or to maximize
conversion speed for lower impedance inputs. Longer sample times can also be used to lower overall
power consumption when continuous conversions are enabled if high conversion rates are not required.
00 Default longest sample time; 20 extra ADCK cycles; 24 ADCK cycles total.
01 12 extra ADCK cycles; 16 ADCK cycles total sample time.
10 6 extra ADCK cycles; 10 ADCK cycles total sample time.
11 2 extra ADCK cycles; 6 ADCK cycles total sample time.
11.3.4 ADC Data Result Register (ADCx_Rn)
The data result registers (Rn) contain the result of an ADC conversion of the channel
selected by the corresponding status and channel control register (SC1A:SC1n). For
every status and channel control register, there is a corresponding data result register.
Memory map and register definitions
K32 L2A Reference Manual, Rev. 2, 01/2020
186 NXP Semiconductors