Lexmark Pro5500 Series, Руководство по обслуживанию

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Diagnostic aids
3-10
4447-20x
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Manufacturing Test
Manufacturing Test is intended for use during machine manufacturing. If the serial number is disabled, this
menu is present by default. The firmware version of the printer appears in the title portion of the Manufacturing
Test menu.
To access the Manufacturing Test:
1.
Bring the printer up to Manufacturing mode. See “Accessing the service menus” on page 3-5 .
2.
From the home screen, touch > Manufacturing Test .
Available tests
The tests appear on the control panel in the order shown:
Tests
LCD Touch Panel Test See “LCD Touch Panel Test” on page 3-11 .
Show Strings See “Show Strings” on page 3-11 .
Align Printer See “Align Printer” on page 3-11 .
Clean Nozzles See “Clean Nozzles” on page 3-11 .
Single Test Page See “Single Test Page” on page 3-12 .
USB Serial Number
Manufacturing Mode See “Manufacturing Mode” on page 3-12 .
Auto Reboot See “Auto Reboot” on page 3-13 .
Media Test See “Media Test” on page 3-13 .
ADF 3 Page Test See “ADF 3 Page Test” on page 3-13 .
Scanner Life Test See “Scanner Life Test” on page 3-13 .
Timed Scanner Life Test See “Timed Scanner Life Test” on page 3-13 .
Card Reader Test See “Card Reader Test” on page 3-14 .
Print Purge Page See “Print Purge Page” on page 3-14 .
De-Prime PH See “De-Prime PH” on page 3-14 .
Ink Level Test See “Ink Level Test” on page 3-15 .
Tank Receiver Test See “Tank Receiver Test” on page 3-15 .
Printhead E-Test See “Printhead E-Test” on page 3-15 .
Tray 1 Paper Sensor Test See “Tray [x] Paper Low Sensor Test” on page 3-16 .
Tray 2 Paper Sensor Test See “Tray [x] Paper Low Sensor Test” on page 3-16 .
Tray 1 Paper Out Sensor Test See “Tray [x] Paper Out Sensor Test” on page 3-16 .
Tray 2 Paper Out Sensor Test See “Tray [x] Paper Out Sensor Test” on page 3-16 .
Calibrate ADF Scanner See “Calibrate ADF Scanner” on page 3-16 .
FACTORY SKEW ADJUST See “FACTORY SKEW ADJUST” on page 3-17 .
Cover and Door Sensor Tests See “Cover and Door Sensor Tests” on page 3-17 .
Fault HW Test See “Fault HW Test” on page 3-17 .