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GR716-DS-UM, May 2019, Version 1.29
81
www.cobham.com/gaisler
GR716
7.3.2
Memory Test
All memory entities have a build-in test structure for automatic testing. The automatic testing is trig-
gered from software and can only be enabled when the external DSU_EN signal is high. The test is
destructive and all memory contents will be overwritten.
The memory test algorithm used is a March C- (evolved March C). The advantage of using the March
C- test algorithm is that the algorithm covers many faults models without knowing the internal struc-
ture or the layout of the memory. The covered fault models includes Stuck-At, Transition, Coupling,
Neighborhood Sensitivity and Address decoding fault.
The disadvantage of using the March C- algorithm is that it is very time consuming due to its nature of
checking bit by bit multiple times.
March C- algorithm implemented
{↑(w0);↑(r0,w1);↑(r1,w0);↓(r0,w1);↓(r1,w0);↓(r0)}
Notation of the algorithm:
Table 60.
External access of integrated Analog digital configuration and status signals
Pin
Mode
Functional description
GPIO[0-36]
Analog
Mode
GPIO[0] - ADC Select internal reference (active high) input
GPIO[1] - ADC Start conversion (active high) input
GPIO[2] - ADC Clock input
GPIO[3] - ADC enable (active high) input
GPIO[4] - ADC Pre-AMP Bypass input
GPIO[5] - ADC Select single ended mode (active high) input
GPIO[7:6] - ADC Pre-AMP Pair select input
GPIO[9:8] - ADC Pre-AMP Gain select input
GPIO[10] - ADC Pre-AMP Cross
GPIO[11] - ADC Pre-AMP Select On Chip Temperature sensor
GPIO[22:12] - ADC digital output
GPIO[23] - ADC End of conversion output
User
Mode
User IO
GPIO[37-48]
Analog
Mode
When external access to analog digital control and status signals are enabled the mixed
GPIO signals are used as analog inputs and outputs to the integrated ADC and DAC.
Analog values inserted should respect the limits specified in chapter 52. GPIO[37-44]
are used as ADC inputs and GPIO[45-48] are used as DAC outputs.
Internal test buffers can be enabled on following pins in analog mode:
GPIO[39] - Test buffer 1 output (Internal test bus 1)
GPIO[40] - Test buffer 2 output (Internal test bus 2)
GPIO[42] - Test buffer 3 output (Internal test bus 3)
GPIO[48] - Test buffer 4 output (Internal test bus 4)
External test voltage references can be enabled on following pins in analog mode:
GPIO[44] - Analog test input reference voltage for ADC domain
GPIO[47] - Analog test input reference voltage for IO and Core domain
User
Mode
Mixed Analog Digital user GPIO.
GPIO[49-63]
Analog
Mode
Internal test buffer can be enabled on following pins in analog mode:
GPIO[49] - Test buffer 5 output
External test voltage reference can be enabled on following pins in analog mode:
GPIO[50] - Analog test input reference voltage for PLL domain
User
Mode
User GPIO pin 63. Note that the GPIO pin #63 can only be configured as output