12-8
IM DLM3054-01EN
Cyclic Statistical Processing (Cycle)
In cyclic statistical processing, the instrument divides the displayed waveform by the period that it automatically
determines through calculation, and calculates statistics of the measured values in each period. The method of
determining the period is the same as the method for determining the Period measurement item.
This mode is effective for items, such as Rms or Avg, that may result in errors depending on the time range
setting.
The following measurement items cannot be selected.
Avg Freq (average frequency), Avg Period (average period), Pulse Count (pulse count), Edge Count (edge
count), Delta T, Delay
Cycle Trace (Cycle Trace)
Selects the source waveform used to determine the period.
• Own
The period is determined for each source waveform.
• CH1 to CH4/LOGIC (Bit0 to Bit7),* Math1 to Math4
The period is determined for the selected waveform, and that period is used on all source waveforms. If you
select LOGIC, select the source bit.
* CH4 or LOGIC, whichever the corresponding key is illuminated, can be selected.
Measures the items in ranges a, b, and c, and calculates
statistics on the items in the order a, b, and c.
The items of other channels are also measured in
ranges a, b, and c. If you select Own, the items are
measured automatically over each waveform’s period.
Example in Which Cycle Trace Is Set to CH2
c
b
a
CH2
CH1
Executing Statistical Processing (Exec)
Executes statistical processing. You can use this command when the statistical processing mode is set to Cycle
or History.
• The number of cycles being used for the cyclic statistical processing is displayed in the statistical display’s
Count column.
• The number of cycles that can be used in cyclic statistical processing varies depending on the number of
measured items that the instrument is calculating the statistics of.
100000/(the number of measured items that the instrument is calculating the statistics of)
• Cyclic statistical processing is performed only on the main window.
12 Automated Measurement of Waveform Parameters