Tektronix TDS 500C, Performance Verification Manual

Page: 143 / 148

Typical Characteristics
TDS 500C, TDS 600B & TDS 700C Performance Verification and Specifications
2–27
Table 2–16: Typical characteristics — Signal acquisition system (cont.)
Name Description
Effective Bits — TDS 520C & 724C Sample rate
The chart on the right gives the typical
e e ti e its o a si e a e a
ste
Input frequency
1 GS/s 10 MS/s & HiRes
effective bits for a sine wave adjusted
to
i isio s at MH m / i
1 MHz – 9.2 divs 6.8 bits 9.7 bits
to 9.2 divisions at 1 MHz, 50 mV/div @
25
°
C.
490 MHz – 6.5 divs 6.5 bits N/A
Effective Bits — TDS 540C & 754C
p re e c
Sample rate
The chart on the right gives the typical
e e ti e its o a si e a e a
ste
Input frequency
2 GS/s 10 MS/s & HiRes
effective bits for a sine wave adjusted
to
i isio s at MH m / i
1 MHz – 9.2 divs 6.8 bits 9.7 bits
to 9.2 divisions at 1 MHz, 50 mV/div @
25
°
C. 500 MHz 6.8 bits N/A
Effective Bits — TDS 784C
p re e c
Sample rate
The chart on the right gives the typical
effective bits for a sine wave adjusted
to
i isio s at MH m / i
Input frequency
4 GS/s 10 MS/s & HiRes
e e ti e its o a si e a e a ste
to 9.2 divisions at 1 MHz, 50 mV/div @
°
1 MHz – 9.2 divs 6.6 bits 9.7 bits
25
°
C.
1 GHz – 6.5 divs 5.5 bits N/A
Frequency Limit, Upper, 250 MHz
Bandwidth Limited 250 MHz
Frequency Limit, Upper, 20 MHz Bandwidth
Limited 20 MHz
Step Response Settling Errors
l iv e i S ep ampli e
Settling error (%)
3
at
Volts/Div setting
±
Step amplitude 20 ns 100 ns 20 ms
1 mV/div – 100 mV/div
≤
2 V
≤
0.5%
≤
0.2%
≤
0.1%
101 mV/div – 1 V/div
≤
20 V
≤
1.0%
≤
0.5%
≤
0.2%
1.01 V/div – 10 V/div
≤
200 V
≤
1.0%
≤
0.5%
≤
0.2%
1
The limits given are for the ambient temperature range of 0
_
C to +30
_
C. Reduce the upper bandwidth frequencies by
5 MHz for the TDS 600B or by 2.5 MHz for the TDS 500C/700C for each
_
C above +30
_
C.
2
The numbers given are valid 0
_
C to +30
_
C and will increase as the temperature increases due to the degradation in
bandwidth. Rise time is calculated from the bandwidth. It is defined by the following formula:
Note that if you measure rise time, you must take into account the rise time of the test equipment (signal source, etc.) that
you use to provide the test signal. That is, the measured rise time (RT
m
) is determined by the instrument rise time (RT
i
) and
the rise time of the test signal source (RTgen) according to the following formula:
TDS 600B Rise Time (ns)
+
450
BW (MHz)
RT
m
2
+
RT
i
2
)
RT
gen
2
TDS 500C
ń
700C Rise Time (ns)
+
400
BW (MHz)
3
The values given are the maximum absolute difference between the value at the end of a specified time interval after the
midlevel crossing of the step and the value one second after the midlevel crossing of the step, expressed as a percentage
of the step amplitude.