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Section 6 ROM
Rev. 6.00 Sep 12, 2006 page 110 of 526
REJ09B0326-0600
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Avoid touching the socket adapter or chip while programming, since this may cause contact
faults and write errors.
6.3.3
Reliability of Programmed Data
A highly effective way to improve data retention characteristics is to bake the programmed chips
at 150°C, then screen them for data errors. This procedure quickly eliminates chips with PROM
memory cells prone to early failure.
Figure 6.5 shows the recommended screening procedure.
Program chip and
verify programmed data
Bake chip for 24 to 48 hours
at 125 C to 150 C
with power off
Read and check program
Install
Figure 6.5 Recommended Screening Procedure
If a group of programming errors occurs while the same PROM programmer is in use, stop
programming and check the PROM programmer and socket adapter for defects, using a
microcomputer with on-chip EPROM in a windowed package, etc. Please inform Renesas
Technology of any abnormal conditions noted during or after programming or in screening of
program data after high-temperature baking.
Summary of Contents for F-ZTAT H8/3642A Series
Page 6: ...Rev 6 00 Sep 12 2006 page iv of xx ...
Page 8: ...Rev 6 00 Sep 12 2006 page vi of xx ...
Page 22: ...Rev 6 00 Sep 12 2006 page xx of xx ...
Page 124: ...Section 5 Power Down Modes Rev 6 00 Sep 12 2006 page 102 of 526 REJ09B0326 0600 ...
Page 188: ...Section 6 ROM Rev 6 00 Sep 12 2006 page 166 of 526 REJ09B0326 0600 ...
Page 190: ...Section 7 RAM Rev 6 00 Sep 12 2006 page 168 of 526 REJ09B0326 0600 ...
Page 298: ...Section 9 Timers Rev 6 00 Sep 12 2006 page 276 of 526 REJ09B0326 0600 ...
Page 378: ...Section 12 A D Converter Rev 6 00 Sep 12 2006 page 356 of 526 REJ09B0326 0600 ...
Page 446: ...Section 13 Electrical Characteristics Rev 6 00 Sep 12 2006 page 424 of 526 REJ09B0326 0600 ...