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3-204
Chapter 3 Troubleshooting
31
COSAC Solid
PG ALL AAh
(For development)
Entire Solid Data
Pattern.
For development.
Determine the defect
locations when IPS
defect and ASIC poor
installation etc. has
occurred.
IPS
32
AES L* Pass
Check
(For separating
troubles) 32.51 mm
Grey + 10.84 mm
White, Vertical Stripe
Pattern.
For development.
Determine the defect
locations when IPS
defect and ASIC poor
installation etc. has
occurred.
IPS
33
VIPER Grid/
4C
(For development)
10.84 mm Grid
Pattern.
For development.
Determine the defect
locations when IPS
defect and ASIC poor
installation etc. has
occurred.
IPS
34
VIPER Grid/
BW
(For development)
10.84 mm Grid
Pattern.
For development.
Determine the defect
locations when IPS
defect and ASIC poor
installation etc. has
occurred.
IPS
35
FSRE Count
Mode/Grid
(For separating
troubles)5.42 mm
YMCK Grid Pattern.
For separating
troubles. It
determines the
defective locations
when an error image
was output. Normal:
Pre IPS Asic onwards
can be determined as
normal.
IPS
PG
No.
Pattern Name
Overview
Purpose
PG Built-in Location
36
FSRE Count
Mode/Slanting
Grid
(For separating
troubles)5.42 mm
YMCK Slanting Grid
Pattern.
For development.
Determine the defect
locations when IPS
defect and ASIC poor
installation etc. has
occurred.
IPS
37
VIPER Fixed
Pattern Output/
BW Binary
(For separating
troubles) Connection
between IPS-
Controller CHK
Entire 2dot width
Horizontal Ladder
Pattern.
For development.
Determine the defect
locations when IPS
defect and ASIC poor
installation etc. has
occurred.
IPS
38
VIPER Fixed
Pattern Output/
4C Binary
(For separating
troubles) Entire 2 dot
width Horizontal
Ladder Pattern.
For development.
Determine the defect
locations when IPS
defect and ASIC poor
installation etc. has
occurred.
IPS
39
TAG Fixed
Binary COPY-
1
(For development)
TAG='0' Fixed COPY.
For development.
Determine the defect
locations when IPS
defect and ASIC poor
installation etc. has
occurred.
IPS
40
TAG Fixed
Binary COPY-
2
(For development)
TAG='1' Fixed
COPY.
For development.
Determine the defect
locations when IPS
defect and ASIC poor
installation etc. has
occurred.
IPS
PG
No.
Pattern Name
Overview
Purpose
PG Built-in Location
Summary of Contents for DP-C321
Page 4: ...This page is intentionally left blank ...
Page 5: ...Chapter 1 General ...
Page 22: ...1 16 Chapter 1 General 1 3 Type of Paper ...
Page 23: ...1 17 Chapter 1 General ...
Page 24: ...Chapter 2 Maintenance ...
Page 63: ...Chapter 3 Troubleshooting ...
Page 118: ...3 44 Chapter 3 Troubleshooting I F PWB PL9 1 MCU PWB PL13 1 ...
Page 445: ...Chapter 4 Parts List ...
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