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3-203
Chapter 3 Troubleshooting
22
Binary/
Highlight PG
LUT: C-TRA
Off IOT Off
(Highlight gradation
check) Gradation
pattern for highlight
adjustment LUT:
C-TRA Off IOT Off
In the gradation
reproducibility of
Primary color/
Secondary color/
Tertiary color, the
highlight parts easily
varied can be checked
in details. For
checking TRC.
IPS
23
Binary/
Highlight PG
LUT: C-TRA
Off IOT On
(Highlight gradation
check) Gradation
pattern for highlight
adjustment LUT:
C-TRA Off IOT On
In the gradation
reproducibility of
Primary color/
Secondary color/
Tertiary color, the
highlight parts easily
varied can be checked
in details. For
checking TRC.
IPS
24
Binary/
Highlight PG
LUT: C-TRA
On IOT Off
(Highlight gradation
check) Gradation
pattern for highlight
adjustment LUT:
C-TRA On IOT Off
In the gradation
reproducibility of
Primary color/
Secondary color/
Tertiary color, the
highlight parts easily
varied can be checked
in details. For
checking TRC.
IPS
25
Binary/
Highlight PG
LUT: C-TRA
On IOT On
(Highlight gradation
check) Gradation
pattern for highlight
adjustment LUT:
C-TRA On IOT On
In the gradation
reproducibility of
Primary color/
Secondary color/
Tertiary color, the
highlight parts easily
varied can be checked
in details. For
checking TRC.
IPS
PG
No.
Pattern Name
Overview
Purpose
PG Built-in Location
26
IIT/FS Incre/
Gradation
(For separating
troubles) Fast Scan
direction gradation
YMC process BK
pattern
For development.
Determine the defect
locations when IPS
defect and ASIC poor
installation etc. has
occurred.
IPS
27
IIT/SS Incre/
Gradation
(For separating
troubles) Slow Scan
direction gradation
YMC process BK
pattern
For development.
Determine the defect
locations when IPS
defect and ASIC poor
installation etc. has
occurred.
IPS
28
Shading Data
Output
(For separating
troubles) Shading
RAM data output
pattern
For development.
Determine the defect
locations when IPS
defect and ASIC poor
installation etc. has
occurred.
IPS
29
COSAC Count
Mode/YMCK
Vertical Stripe
(For separating
troubles) 10.84 mm
width YMCK
Vertical Stripe Pattern
For separating
troubles. It
determines the
defective locations
when an error image
was output. Normal:
Pre IPS Asic onwards
can be determined as
normal.
IPS
30
COSAC Count
Mode/8
Gradation
Patch
(For separating
troubles)
21.67x10.84 mm 8
Gradation Patch
Pattern
For development.
Determine the defect
locations when IPS
defect and ASIC poor
installation etc. has
occurred.
IPS
PG
No.
Pattern Name
Overview
Purpose
PG Built-in Location
Summary of Contents for DP-C321
Page 4: ...This page is intentionally left blank ...
Page 5: ...Chapter 1 General ...
Page 22: ...1 16 Chapter 1 General 1 3 Type of Paper ...
Page 23: ...1 17 Chapter 1 General ...
Page 24: ...Chapter 2 Maintenance ...
Page 63: ...Chapter 3 Troubleshooting ...
Page 118: ...3 44 Chapter 3 Troubleshooting I F PWB PL9 1 MCU PWB PL13 1 ...
Page 445: ...Chapter 4 Parts List ...
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