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WRXi-OM-E Rev B
Scan Histogram View
By enabling ScanHisto, a histogram corresponding to your search criteria is superimposed on the overlay trace. In
the example below, the Rise 10-90% parameter measurement has been applied, but only edges slower than
1.2 ns with a delta of 50 ps are accumulated in the histogram.
Another feature of WaveScan is that you can select a single bin of the histogram for analysis by touching or
clicking it. A confirmation pop-up button then appears:
After Find Feature is confirmed, only the single bin of the histogram remains and information about the contents of
the bin is displayed in the Filter Method area:
You can recall the original filter conditions by touching the
Undo
button at the top-right corner of the screen.