HP StorageWorks MSA 2/8 - SAN Switch, Reference Manual

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centralMemoryTest
91 Fabric OS Version 3.1.x/4.1.x Reference Guide
Subtest 6
The forced bad chip number error subtest verifies that the bad buffer number in
the data packet can be detected, its error flag and interrupt bits are set.
The test method is as follows:
1. Clear the error and interrupt bits of all ASICs.
2. Set up the hardware so that transmission of data includes a bad buffer number.
3. For each ASIC X in the switch, do:
For each of the 11 possible offsets, do:
a. Write a 64 byte pattern in the Central Memory.
b. Read X from all ASIC Y in the switch.
c. Check that all ASIC Y has its:
— Its interrupt status are set.
— An error type of chip number error.
— The port number in error is the receiver port (which is the base port of
asic Y).
d. Reading the error register clears the CMEM interrupt bit; ready for the
next offset to test.
Operands
This command has the following operands:
passcount
(V3.1.x only)
Specify the number of test passes to run. By default the
test will be run one time. The
passcount
parameter
may be used to run the specified number of passes.
datatype
(V3.1.x only)
Specify the type of data pattern to use. By default, type
9, QUAD_RAMP is used. For a complete list of
supported data patterns, run the
dataTypeShow
command. Some common settings are:
■
1 Byte fill pattern.
■
2 Word fill pattern.
■
3 Quad fill pattern.
■
9 Quad ramp (Addr=Data) pattern.
■
11 Random data.