Hioki RM3542, Instruction Manual, Page: 53 / 218

4.5 Improving Probe Contact (Contact Improver Function)
47
4
Probe contacts can be improved by applying current from the POT to the CUR probes before mea-
suring.
The current used for the Contact Improver functions can be selected as follows.
17 mA, 25 mA, 35 mA (default), 50 mA
Higher current provides more effective contact improvement, but at the cost of faster probe deterioration.
Contact Improver current can be set to be disabled (OFF), enabled (ON), or PULSE.
The PULSE setting applies the contact improvement current for about 100 µs immediately before measure-
ment. The PULSE setting is usefull to decrease Joule heating if the DUT is susceptible to its current.
*: It takes several microseconds for the DUT current to reach the steady-state value. Until the steady-state
value is reached, a transient current that is approximately equal to the contact improvement current setting
(default setting: 35 mA) will flow.
4.5 Improving Probe Contact (Contact Improver
Function)
The Contact Improver function applies voltage to the sample. Be careful when measuring
samples with characteristics that may be affected.
100 m

-range to 100 k

-range 1 M

to 100 M

-range
DUT current * 2mA max. 60 mA max.
DUT voltage 20 V max. 15 V max.
OFF setting
ON setting
PULSE setting
* Internal delay is different for
each range.
Measurement
Measuring
Start
TRIG
Internal
delay *
Internal
delay *
Internal
delay *
Approx.
100

s
Measuring
Measuring
Start
TRIG
Start
TRIG
Measurement
Measurement
Contact Improver current: Off
Contact Improver current: On
Contact Improver current: Pulse
Probe Contact
Condition
Probe Contact
Condition
Probe Contact
Condition
Stable Contact
Stable Contact
Stable Contact
Timing Chart
(Contact Improver Function)
DELAY 2
DELAY 1
DELAY 2
DELAY 1
DELAY 2 DELAY 1
*1 Steady state value.
A rush current of approximately
100 mA flows for 100µs, when a
probe came in contact with DUT.