GE Analytical Instruments ©2009
151 of 236
DLM 90488-01 Rev. A
• RSD for each standard (except the blank) is
≤
3%
• TOC % Diff is ±7% or less for a 500 ppb or 1 ppm TOC standard.
• TOC % Diff is ±5% or less for a 2, 5, 10, 25, or 50 ppm TOC standard.
• IC % Diff is
±7% or less for a 500 ppb or 1 ppm IC standard.
• IC % Diff is ±5% or less for a 2, 5, 10, 25, or 50 ppm IC standard.
If these conditions are not satisfied and verification fails, you may need to perform the
calibration and then the verification procedures again. However, first consult the chapter
called “Troubleshooting” on page 195 to determine if there is a problem with the Analyzer.
The % Difference value is calculated as follows:
The Expected TC Concentration equals the Certified TOC Concentration of the standard,
plus the measured TOC Concentration in the Calibration Blank.
The IC standards are measured with the UV lamp off. Under those conditions, the readings
of the TC channel are expected to match the readings of the IC channel. Therefore, the
Expected IC concentration equals the measurement made by the TC channel, while the
Measured IC concentration equals the measurement made by the IC channel.
12. Press the
OK
button to continue.
13. Remove the vial from the IOS System and slide the door closed.
14. If you have an ICR unit, return the lever to the
Inline
position.
15. If you use the Autoreagent feature, perform an Autoreagent calibration (proceed to
“Performing an Autoreagent Calibration” on page 153).
System Suitability Verification
The Sievers 900 On-Line TOC Analyzer is designed to make system suitability verification easy. The
Analyzer firmware performs all functions necessary to meet USP Chapter <643> or EP Chapter
2.2.44 specifications. The response efficiency and response limit are automatically calculated.
To perform the system suitability verification, follow this procedure:
% Diff = Measured Concentration - Expected Standard Concentration
Expected Standard Concentration
-----------------------------------------------------------------------------------------------------------------------------------------------------------------
100%
×
TOCexp = TOCblank
Summary of Contents for Sievers 900 Series
Page 10: ...GE Analytical Instruments 2009 10 of 236 DLM 90488 01 Rev A ...
Page 88: ...GE Analytical Instruments 2009 88 of 236 DLM 90488 01 Rev A ...
Page 122: ...GE Analytical Instruments 2009 122 of 236 DLM 90488 01 Rev A ...
Page 159: ...GE Analytical Instruments 2009 159 of 236 DLM 90488 01 Rev A ...
Page 161: ...GE Analytical Instruments 2009 161 of 236 DLM 90488 01 Rev A ...
Page 165: ...GE Analytical Instruments 2009 165 of 236 DLM 90488 01 Rev A ...
Page 167: ...GE Analytical Instruments 2009 167 of 236 DLM 90488 01 Rev A ...
Page 170: ...GE Analytical Instruments 2009 170 of 236 DLM 90488 01 Rev A ...
Page 194: ...GE Analytical Instruments 2009 194 of 236 DLM 90488 01 Rev A ...
Page 218: ...GE Analytical Instruments 2009 218 of 236 DLM 90488 01 Rev A ...
Page 235: ...Notes GE Analytical Instruments 2009 235 of 236 DLM 90488 01 Rev A 236 ...
Page 236: ...Notes GE Analytical Instruments 2009 236 of 236 DLM 90488 01 Rev A 236 ...