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10–6
Chapter 10: JTAG Boundary-Scan Testing for Cyclone IV Devices
Boundary-Scan Description Language Support
December 2013
Altera Corporation
shows the JTAG chain of mixed voltages and how a level shifter is
inserted in the chain.
Boundary-Scan Description Language Support
The boundary-scan description language (BSDL), a subset of VHDL, provides a
syntax that allows you to describe the features of an IEEE Std. 1149.1/IEEE Std. 1149.6
BST-capable device that can be tested.
f
For more information about how to download BSDL files for IEEE Std.
1149.1-compliant Cyclone IV E devices, refer to
.
f
For more information about how to download BSDL files for IEEE Std.
1149.6-compliant Cyclone IV GX devices, refer to
.
f
You can also generate BSDL files (pre-configuration and post-configuration) for
IEEE Std. 1149.1/IEEE Std. 1149.6-compliant Cyclone IV devices with the Quartus
®
II
software version 9.1 SP1 and later. For more information about the procedure to
generate BSDL files using the Quartus II software, refer to
Figure 10–3. JTAG Chain of Mixed Voltages
Tester
Must
b
e
3.3-
V
tolerant
Must
b
e
1.8-
V
tolerant
Shift TDO to
le
v
el accepted
b
y
tester if necessary
Must
b
e
2.5-
V
tolerant
3.3-
V
V
CCIO
2.5-
V
V
CCIO
1.5-
V
V
CCIO
1.8-
V
V
CCIO
Le
v
el
Shifter
TDI
TDO
Summary of Contents for Cyclone IV
Page 10: ...x Chapter Revision Dates Cyclone IV Device Handbook March 2016 Altera Corporation Volume 1...
Page 14: ...I 2 Section I Device Core Cyclone IV Device Handbook March 2016 Altera Corporation Volume 1...
Page 274: ...vi Contents Cyclone IV Device Handbook February 2015 Altera Corporation Volume 2...
Page 440: ...iv Contents Cyclone IV Device Handbook December 2016 Altera Corporation Volume 3...
Page 442: ...vi Chapter Revision Dates Cyclone IV Device Handbook December 2016 Altera Corporation Volume 3...
Page 446: ......