5 Commissioning and First Operating Steps | 5.4 Acquiring an Image
ZEISS
5.4.6.2 Setting a Fast Scan Speed
Procedure
1. In the SEM Controls panel, select the Scanning tab.
2. From the
Scan Speed
drop-down list, select a
fast scan speed, e.g.
Scan Speed = 3
.
INFO:
The lower the scan speed number, the
faster the electron beam scans across the speci-
men. Scan Speed = 3 allows you to get an im-
age quickly.
5.4.6.3 Setting a Low Magnification
Procedure
1. In the
Toolbar
, select the MAGFOC icon.
à
In the
Status Bar
, the current magnification
and working distance are displayed.
2. Hold down the left mouse button and drag the mouse within the
Image Area
to adjust the
magnification to 500 x.
3. Hold down the mouse wheel and drag the mouse within the
Image Area
to adjust the
working distance and focus the image.
5.4.6.4 Setting a Long Working Distance
Procedure
1. In the
Status Bar
, click
.
à
The
WD
window is displayed.
2. In the
WD
input field, enter
10
.
3. Click
OK
.
à
The working distance is set to
WD = 10 mm
.
5.4.6.5 Adjusting Brightness and Contrast
Procedure
1. In the SEM Controls panel, select the Detectors tab.
2. In the
Signal Adjust
section, use the scroll
bars to adjust brightness and contrast.
5.4.6.6 Visualizing Details on the Specimen Surface
Procedure
1. Select a detail on the specimen surface.
2. Verify the
Magnification/Focus
function is activated.
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Instruction Manual ZEISS SIGMA series | en-US | Rev. 7 | 352102-9344-006