ZEISS
3 Product and Functional Description | 3.1 System Overview
Optional
Components and
Accessories
A range of options and accessories is available for the microscope. Examples of available options
and accessories are the following:
Detectors
BSD detectors for high efficiency and angle selective material charac-
terization.
CL detector for the analysis of cathodoluminscent materials
STEM detector for transmission imaging of ultrathin sections
C2D detector
Specimen Current Detector (SCD)
Stage accessories
Coolstage
Faraday cup
Right-hand tilt (Sigma 300)
Further options
Additional chamberscope, stubscope, and external navigation camera
Column maintenance kit, O-ring kit
Airlock for quick specimen transfer without breaking the system vac-
uum
Plasma cleaner for the decontamination of specimens and the speci-
men chamber
Using the Optional Plasma Cleaner [
Raman spectroscopic microscope for material characterization
Using the Optional Raman Spectroscopic Microscope [
Dual joystick for stage control and specimen navigation
Control panel that allows direct access to the most frequently used
functions
Software add-ins and enhancements
For full details about the available options and accessories, please contact your local ZEISS service
representative, or sales representative.
Instruction Manual ZEISS SIGMA series | en-US | Rev. 7 | 352102-9344-006
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