Zeiss Axioskop 40, Руководство по эксплуатации, Страница: 127 / 146

Axioskop 40 OPERATION
Axioskop 40 FL Measuring lengths Carl Zeiss
B 40-810 e 12/01 3-53
After the stage micrometer has been exchanged
for the specimen to be measured, the measuring
distance of interest results from the number of
increments of the crossline micrometer (tenth
estimated), multiplied by the scale value k’.
Example:
L = 35.5 x 9.9 µm = 351.5 µm
Particularly large sample structures can also be
determined by using the vernier scale gradations
(0.1 mm) on the mechanical stage. Here, it might
be necessary to determine the distance to be
measured by calculating a combined x and y
measurement (Pythagoras).
Fig. 3-36 Length measurement using scale 1
on the stage micrometer (object)
and scale 2 on the crossline
micrometer (eyepiece)
1 2