932502G / 0618
1. INTRODUCTION
manual adjustments and is capable of computing the statistical uncertainty of the corrected
spectrum. See Section 1.6.
SMART-1
®
Support
Detectors equipped with the SMART-1 technology have their recom-
mended bias values preset at the factory. No more shuffling through paperwork or looking for
tags on the detector to find the right bias setting. Simply turn on the electronics and the
SMART-1 detector senses the detector temperature and applies the right high-voltage bias.
These detectors allow modern instruments like the DSPEC 50 to monitor and display detector
state of health (SOH) during acquisition, including detector temperature, preamplifier power,
bias overrange, and bias on/off state. This continuous SOH monitoring ensures the integrity of
the acquired data. A quick check of the SOH flag in the SMART-1 detectors shows if any para-
meter deviated from specification during the measurement. This is vitally important for environ-
mental samples that must be counted for long periods of time and regulatory-driven samples
where chain-of-custody integrity means everything.
List Mode
In List Mode, the DSPEC 50 records and stores the pulse value with a time-stamp
for every pulse generated by the detector. With List Mode, you can write your own programs
that can reconstruct histograms for any time segment without dead time between histograms, or
make histograms for overlapping time slices. Data can be stored easily for reconstruction of any
time frame needed. In addition, MAESTRO v7 supports our List Mode MCBs with menu and
toolbar commands, as well as commands in our automated JOB streams. If your application
requires
real
real-time monitoring, no other instrument comes close for HPGe applications. See
Appendix E.
Sample Changer Connections and Controls
The DSPEC 50 connects easily to many types of
automatic sample changers. The DSPEC 50A and 502A (Advanced) have configuration options
to output TTL pulses of varying widths from the Change Sample port based on the Input Count
Rate, SCA (pulses within a specified region of interest), and when the ADC Gate is active in
addition to the standard Change Sample output option. The Sample Ready and Gate ports on the
Advanced models are also used for counters.
Standard DSPEC-Family Features
The DSPEC 50 also offers the InSight™ Virtual Oscillo-
scope, which allows you to optimize detector performance for a given application from the
computer; our easy automatic pole zero adjustment
4
and automatic baseline restorer
5
; and the
highly accurate Gedcke-Hale extended live-time correction method.
6
4
Patent number 5,872,363.
5
Patent number 5,912,825.
6
Ron Jenkins, R. W. Gould, and Dale Gedcke,
Quantitative X-Ray Spectrometry
(New York: Marcel Dekker,
Inc.), 1981, pp. 266–267.
3
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