Appendix D: Using a Model 82 C-V System
Model 4200A-SCS Parameter Analyzer Reference Manual
D-34
4200A-901-01 Rev. C / February 2017
Details
This method can be used for minority carrier lifetime measurements using Zerbst plot.
The figure below shows the default parameters for the
ctsweep
UTM, which uses the
CtSweep82
user module. In this example, the Model 82 is set to first stress the DUT at +3 V for three seconds,
and then perform 100 capacitance measurements at
−
3 V using a 0.1 s time interval (see
(on page D-19)). For details on C-t measurements, refer to
(on page D-18).
Figure 605: CtSweep82 user module