Appendix L: Wafer-level reliability testing
Model 4200A-SCS Parameter Analyzer Reference Manual
L-14
4200A-901-01 Rev. C / February 2017
exit_mode
: Select:
•
0
: Specifies that oxide failure is determined by a measured current that exceeds the user
specified failure current (
fail_current
)
•
1
: Uses two criteria to determine oxide failure; the first criteria is the specified failure current
(
fail_current
); the second criteria is a slope of current measurement that is a factor
(
exit_slope_mult
) times the previous measured value; see JEDEC document JESD35-A and
Addenda (JESD35-1 and JESD35-2)
Because of noise considerations, the calculated failure current criteria is used only when the
measured current is 10 times the user-specified noise current. For measured currents below this
value, the
fail_current
is used as the exit criteria.
Notes on output variables
test_status
:
•
2
: No test errors (exit due to measured current > a factor of the previous measurement).
•
1
: No test errors (exit due to measured current slope > a factor of the previous slope).
•
0
: No test errors (exit due to measured current >
fail_current
ONLY).
•
1
: Failed pre-stress test.
•
-2
: Cumulative charge limit reached.
•
-3
: Voltage limit reached.
•
-4
: Maximum time limit reached.
•
-5
: Masked Catastrophic Failure.
•
-6
: Non-Catastrophic Failure.
•
-7
: Invalid specified
t_step
,
hold_time
, or
measure_delay
.
Invalid Test Result - Result = 1e21.