Hioki MEMORY HiCORDER 8855, Инструкция по эксплуатации

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APPENDIX 7
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Appendix 3 Reference
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Appendix 3.3 Measurement Limit Frequency
3
2
1
23
24
25
TIME/DIV
(s/DIV)
Sampling period
(s)
Measurement
limit frequency
(Hz)
5 µ s/DIV
10 µ s/DIV
20 µ s/DIV
50 µ s/DIV
100 µ s/DIV
200 µ s/DIV
500 µ s/DIV
1 ms/DIV
2 ms/DIV
5 ms/DIV
10 ms/DIV
20 ms/DIV
50 ms/DIV
100 ms/DIV
200 ms/DIV
500 ms/DIV
1 s/DIV
2 s/DIV
5 s/DIV
10 s/DIV
30 s/DIV
1 min/DIV
2 min/DIV
5 min/DIV
50 ns
100 ns
200 ns
500 ns
1 µ s
2 µ s
5 µ s
10 µ s
20 µ s
50 µ s
100 µ s
200
µ
s
500
µ
s
1 ms
2 ms
5 ms
10 ms
20 ms
50 ms
100 ms
300 ms
600 ms
1.2 s
3 s
800 kHz
400 kHz
200 kHz
80 kHz
40 kHz
20 kHz
8 kHz
4 kHz
2 kHz
800 Hz
400 Hz
200 Hz
80 Hz
40 Hz
20 Hz
8 Hz
4 Hz
2 Hz
0.8 Hz
0.4 Hz
0.13 Hz
0.067 Hz
0.033 Hz
0.013 Hz
As a general rule, to ensure that sampling catches the peaks of a typical sine
wave input on the display, more than 25 samples are required for each input
cycle.
The measurement limit frequency changes depending on the time axis range.