Technical Data
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PC Cards cifX PCI, PCIe, Low Profile PCIe | Installation, Operation and Hardware Description
DOC120204UM46EN | Revision 46 | English | 2015-12 | Relelased | Public
© Hilscher, 2008-2015
CIFX 50E-2ASM
Parameter
Value
Data Access
DPM or DMA* (Direct Memory Access);
*beginning from Hardware Revision 4
Width for the data access to the
Dual-Port Memory (DPM)
32-Bit
AS-Interface
Communication
Supported communication
standard/ protocol (determined by
the loaded firmware)
AS-Interface Master
Transmission rate
166,67 kBit/s
Interface Type
2 *, acc. to IEC 364-4-41, refer to section
AS-Interface
Interface
, page 108.
Galvanic Isolation
optically isolated
Isolation Voltage
1000 VDC (tested for 1 minute)
AS-Interface Interface
Connector
CombiCon male Connector, 2 pin
SYS
System Status LED
COM1
LED channel X1 (duo LED)
COM2
LED channel X2 (duo LED)
Display LED
Display
Refer to ch.
LED Descriptions
, p. 80.
Supply Voltage
+3.3 V dc ±5 %, refer to section
Power Supply and Host
Interface
, page 34.
Maximum Current at 3.3 V
(typically)
800 mA
Power supply
Connector
Via PCI Express Bus
Operation
Rotary Switch Slot Number
(Card ID)
To set the Slot Number (Card ID)
Operating temperature range*
0 °C ... +55 °C
*Air flow during measurment
0,5m/s
Storage temperature range
0 °C ... +70 °C
Humidity
10 … 95% relative humidity, no condensation permitted
Environmental
Conditions
Environment
For UL compliant usage:
The device must be used in a pollution degree 2
environment.
Dimensions (L x W x H)
120 x 94,5 x 18,5 mm
Mounting/Installation
PCI Express x1 slot (3.3 V), refer to section
Slot for the PC
Cards cifX PCI, PCIe and Low Profile PCIe
, page 33.
Device
RoHS Yes
CE Sign
Yes
Emission
EN 55011:2009 + A1:2010, CISPR 11:2009, Class A
(Radio disturbance characteristics - Limits and methods of
measurement)
CE Sign
Immunity
EN 61000-4-2:2009 (Electrostatic discharge test)
EN 61000-4-3:2006 + A1:2008 + A2:2010 (Radiated,
radio-frequency, electromagnetic field test)
EN 61000-4-4:2004 + A1:2010 (Burst Electrical fast
transients/burst test)
EN 61000-4-5:2006 (Surge test)
EN 61000-4-6:2009 (to conducted disturbances, induced
by radio- frequency fields)
EN 61000-4-8:2010 (power frequency magnetic field test)
EN 61000-6-2:2005 + B1:2011 (for industrial
environments)
UL Certification
The device is certified according
to UL 508.
UL-File-Nr. E221530
