EM TEST (Switzerland) GmbH
PFM 200N100.1
User’s Guide
Ver. 1.12
29 / 43
8.
E-13 Pin Interruption according to LV 124 (2013-02)
This test simulates interruptions that may occur on individual pins. The test must be performed in two
different operating states. Different pulse forms must be used, because the possible interruptions may
differ greatly regarding their duration (from loose contacts to permanent interruption).
Test Sequence
The DUT is connected to a battery source. The test can be performed using a VDS 200N source
controlled with AutoWave. The PFM 200N100.1 is used as the generator of the disturbances. The test
is not for power lines (e.g. T.15,
T.30, T.87, …) instead on signal or data lines as well as T.31 return
lines.
Test parameters, E-13 Pin interruption
DUT operating mode
Operating mode II.a and II.c
Must be performed for all relevant statuses of the voltage supply terminals
(e.g., T.15, T.30, T.87) and their combinations.
Z1
Condition 1: pin connected
Z2
Condition 2: pin interrupted
t
r
≤ (0,1*t
1
)
t
f
≤ (0,1*t
1
)
Number of cycles
The following applies to the two test cases and the
relevant terminal status:
3 cycles with operating mode II.a
3 cycles with operating mode II.c
Each test must be evaluated separately.
Number of DUTs
At least 6
Test Case 1
Figure 8.1
Each pin must be removed for t = 10 s and then replaced (slow interval).
Test Case 2
Figure 8.2
Burst on each pin in order to simulate a loose contact
Number of pulses in the burst
4,000
a
Burst
t
1
0.1 ms
t
2
1 ms
t
3
10 s
