651
32072H–AVR32–10/2012
AT32UC3A3
• The NAKed OUT Interrupt (NAKOUTI)
• The High-bandwidth isochronous IN error Interrupt (HBISOINERRI) if the high-bandwidth
isochronous feature is supported by the device (see the UFEATURES register for this)
• The NAKed IN Interrupt (NAKINI)
• The High-bandwidth isochronous IN Flush error Interrupt (HBISOFLUSHI) if the high-
bandwidth isochronous feature is supported by the device (see the UFEATURES register for
this)
• The Overflow Interrupt (OVERFI)
• The STALLed Interrupt (STALLEDI)
• The CRC Error Interrupt (CRCERRI)
• The Transaction error (ERRORTRANS) interrupt if the high-bandwidth isochronous feature is
supported by the device (see the UFEATURES register for this)
•DMA interrupts
The processing device DMA interrupts are:
• The End of USB Transfer Status (EOTSTA) interrupt
• The End of Channel Buffer Status (EOCHBUFFSTA) interrupt
• The Descriptor Loaded Status (DESCLDSTA) interrupt
There is no exception device DMA interrupt.
27.7.2.20
Test Modes
When written to one, the UDCON.TSTPCKT bit switches the USB device controller in a “test
packet”mode:
The transceiver repeatedly transmit the packet stored in the current bank. TSTPCKT must be
written to zero to exit the “test-packet” mode. The endpoint shall be reset by software after a
“test-packet” mode.
This enables the testing of rise and falling times, eye patterns, jitter, and any other dynamic
waveform specifications.
The flow control used to send the packets is as follows:
• TSTPCKT=1;
• Store data in an endpoint bank
• Write a zero to FifoCON bit
To stop the test-packet mode, just write a zero to the TSTPCKT bit.
Содержание AT32UC3A3128
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