Chapter 2
59
Using System Features
Key Locations
Shape
Marker/More (1 of 2)/
Short
Meas Setup/More(1 of 2)/ Advanced/More (1 of 2)/Data Packing/
Show Errors
System/
Show System
System/More(1 of 3)/
SICL Server
System/Config I/O/
Signal Amptd
Input/IF Align Signal/
Signal Rate
Input/IF Align Signal/
Signal Type
Input/IF Align Signal/
Slope
Mode Setup/Trigger/Ext Front
Slope
Mode Setup/Trigger/Ext Rear/
Slope
Mode Setup/Trigger/RF Burst/
Slope
Mode Setup/Trigger/Video/
Socket Port
System/Config I/O/ SCPI Lan
Span
Meas Setup/
SPAN/
X Scale
Front Panel
Spectrum
View/Trace/
Note: This feature is used when measurement is set to spectrum.
Spectrum
Marker/Trace/
Note: This feature is used when measurement is set to spectrum.
Spectrum Avg
Marker/Trace/
Note: This feature is used when measurement is set to spectrum.
Spectrum (Freq
Domain)
MODE/Service/
Spectrum (Freq
Domain)
MODE/Basic/
Store Abs Ampl to
EEROM
System/Alignments/Align Subsystem/ Align 50 MHz Reference/
Sweep Time
Meas Setup/ Can be accessed when measure is set to waveform.
System
Front Panel
Telnet Port
System/Config I/O/ SCPI Lan
Timebase Freq
MODE/Service/
Table 2-1
Key Access Locations
Key
Key Access Path
Содержание E4406A
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Страница 138: ...138 Chapter4 Making Measurements Front Panel Test ...
Страница 139: ...139 5 Functional Testing ...
Страница 214: ...214 Chapter6 If You Have a Problem Returning Your Instrument to Agilent Technologies ...
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Страница 217: ...217 7 Options and Accessories ...
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