ZEISS
3 Product and Functional Description | 3.5 Optional Components and Accessories
3.5.1.5 STEM Detector
Purpose
The optional STEM (Scanning Transmission Electron Microscopy) detector is an electron detector
that can be used to detect transmitted and scattered electrons underneath an ultrathin specimen.
The STEM unit consists of a pre-aligned specimen holder and a Bright-field STEM detector, which
is a diode detector for electrons.
Position
The pre-aligned holder fits directly on the specimen stage and carries the specimen.
1
2
Fig. 34: Schematics of the
detector
1
2
Bright-field STEM detector
In variable pressure mode, the STEM detector enables you to explore the nanostructure of non-
conducting specimens.
Instruction Manual ZEISS EVO | en-US | Rev. 10 | 354706-0780-006
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Summary of Contents for EVO
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