Tektronix CTS 850, User Manual

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Basic Test Procedures
CTS850 SDH/PDH Test Set User Manual
3–23
Jitter/Wander Testing
With the CTS850 jitter generation and analysis capability, it is easy
to run the following automated ITU jitter conformance tests:
H
Jitter Tolerance
H
Jitter Transfer
H
Output Jitter (Jitter Generation)
H
Pointer Jitter
This section shows examples of the jitter tolerance, jitter transfer and
video timing quality tests.
Testing Jitter Tolerance
The CTS850 generates a signal that contains jitter at various
frequencies and feeds it to the network element. Simultaneously, the
CTS850 receives the output from the network element and analyzes
its performance.
You can specify several parameters for the test:
H
Mask type for jitter analysis
H
Start frequency
H
End frequency
H
Number of frequency samples
H
Tolerance criteria
The results are displayed in numerical and graphical form.
The CTS850 provides two methods to measure the tolerance of a
network element to jitter applied at its input:
H
Onset-of-errors method
H
1 dB power penalty (BER) method
These methods are fully specified and described in the ITU-T
Recommendation O.171 test set standard.