SECTION 5
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SECTION 5
ID Sensor Unit Functions
79
RFID System
User's Manual
Using the Test Mode
1.
Set the operation in Test Mode
The operation to be performed in Test Mode is set in the DM Area. The settings are listed in the following table.
For details on the settings for the operation in Test Mode, refer to
and
Run/Test Switching Method Setting
2.
Turn ON the test switch.
The Test Operation is started using the method set in the DM Area
To start Test Mode using the switch on the front of the Unit, set DM m+80 to 0000.
To start Test Mode using bit 15 of CIO n+0, set DM m+80 to 0001.
The test that is performed cannot be changed after entering Test Mode, even if the test settings in DM m+50 and DM
m+51 are changed. Always set the test settings in DM m+50 and DM m+51 before entering Test Mode.
Test Operation
• Communications test
• Range level
• Read speed level
• Write speed level
• Noise level
• Communications success rate
Test Antenna
• Antenna 1
• Antenna 2
Number of Test Bytes
0000 to 0800 hex (bytes)
Run/Test Switching Method
• CPU Unit
• Test switch
DM (m+50) and (m+51)
Run Mode
Test Mode
Set the test settings.
Test Switch
or
CIO ((n+0), bit 15)
Summary of Contents for CJ1W-V680C11
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