Nanosurf easyScan 2 AFM, Operating Instructions Manual

Page: 71 / 164

S
PREADING
R
ESISTANCE
71
For best results, the sample should be electrically isolated except for the
connection mentioned above.
- Select a cantilever:
CDT-NCLR should be used for samples where a high force is needed to
penetrate a surface oxide layer.
CONT-PtIr cantilevers can be used on delicate samples. The applied volt-
age should be small, because high currents may cause the conducting layer
on the tip to evaporate. Also, applied forces should be very small to prevent
damage to the conducting layer.
NCL-PtIr cantilevers could be used in combination with non-contact
topography measurements, but damage to the tip is likely.
IMPORTANT
• Standard CONTR cantilevers can not be used due to the surface oxide on
the tip, and the semiconducting contact between the tip and the sample.
• EFM cantilevers cannot be used for static force mode measurements, due
to their insufficient width.
- Install the cantilever as described in section Installing the cantilever (p.37).
- Select the Spreading resistance mode in the Operating mode panel.
- Open the Z-Controller panel.
- Verify the force Set point.
- Set the Tip voltage in the section Tip Properties.
To display the measurement results:
- Create a new chart in the Imaging window by clicking in the Chart
bar.
- If necessary, increase the size of the window to make space for the new
chart.
- Select the ‘Color map’ chart type by .
- Select the ‘Tip current’ signal by .