Nanosurf easyScan 2 AFM, Operating Instructions Manual

Page: 51 / 164

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PPROACHING THE SAMPLE
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The side view should look like figure Side view of the cantilever after manual
coarse approach . You can use the cantilever as a ruler to judge distances in
the views of the integrated optics.
Manual Coarse approach
In this step, the sample surface is brought within the range of the fine
approach stage.
- Use the three levelling screws (figure Parts of the scan head (p.18)) to lower
the Scan head so that the cantilever is within 1-2 mm of the sample. Take
care that the Scan head remains levelled parallel to the sample surface by
turning all screws approximately the same amount.
When the sample is reflective, the mirror image of the cantilever should
now be visible (figure
Side view of the cantilever after manual coarse
approach ). When the sample is not reflective, the shadow of the cantilever
may be visible. If neither a mirror image nor a shadow are visible, change
the light until it is visible, for example by adding a light source, or by shad-
ing the light from outside or from bright surfaces in the room.
Manual approach using the approach stage
In this step, the tip is brought as close to the sample surface as possible,
without running a risk of touching it. The closer the tip is, the less time the
automatic final approach takes.
- Observe the distance between tip and sample in the side view of the inte-
Side view of the cantilever after manual coarse approach