A F
IRST
M
EASUREMENT
48
Preparing the instrument
IMPORTANT
• Never touch the cantilever or the surface of the sample! Good results rely
heavily on a correct treatment of the tip and the sample.
• Avoid exposing the system to direct light while measuring. This could
influence the beam deflection detector and reduce the quality of the
measurement.
Prepare the instrument as follows (see chapter
(p.36) for more detailed instructions):
- If you have the AFM Dynamic Module, install an NCLR type cantilever,
otherwise install an CONTR type cantilever.
- Install one of the samples from the Nanosurf AFM Basic sample kit or
Calibration sample kit. Preferably install the 10 µm Calibration grid
when using a 70µm or 110µm scan head and the 660 nm Calibration grid
when using a 10µm scan head.
The measurement examples shown here were made with the 10 µm Cali-
bration grid.
To make sure that the configuration is correct, do the following:
- Open the User interface dialog via the menu ‘Options/Config User Inter-
face...’.
- Select the ‘Easy level’ user interface mode.
- Open the menu item ‘File>Parameters>Load...’, and load the file
‘Default_EZ2-AFM.par’ from the directory with default easyScan 2 con-
figurations. Usually this is ‘C:\Program Files\Nanosurf\Nansurf easyScan
2 software\Config’.
Entering values in the control panels
To change a parameter in any panel, use on of the following methods:
• Activate the parameter by clicking it with the mouse pointer, or by select-
Summary of Contents for easyScan 2 AFM
Page 1: ...Operating Instructions easyScan 2 AFM Version 1 6...
Page 7: ...7...
Page 86: ...AFM THEORY 86 Scanner coordinate system x y...
Page 159: ...THE SCRIPT CONFIGURATION DIALOG 159 This page was intentionally left blank...
Page 160: ...AUTOMATING MEASUREMENT TASKS 160 This page was intentionally left blank...
Page 161: ...THE SCRIPT CONFIGURATION DIALOG 161 This page was intentionally left blank...
Page 163: ...163 Window Operating windows Imaging 120 Positioning 115 Report 153 Spectroscopy 128...
Page 164: ......