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6.11 Monitor Function
6.11.4 Executional conditioned device test
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FUNCTIONS
6.11.4 Executional conditioned device test
This function changes a device value within the specified step of a sequence program.
This enables debugging of the specified ladder block without modifying the sequence
program.
*1
Note21Note22
* 1 : The Executional conditioned device test is targeted for sequence programs only. (SFC programs
are not supported.)
(1) Operation of Executional conditioned device test
A device value will be changed based on the registration data once after the
executional conditioned device test setting is registered.
The changed device value becomes effective in the step after the specified step
number and later.
Note that a device value is changed within the specified step regardless of an
execution status of the instruction in the specified step.
Note21
Note22
Figure 6.40 Operation of Executional conditioned device test
Figure 6.41 Operation example of Executional conditioned device test
Universal
UD
Note6.19
Note6.20
Redundant
High
Performance
Basic
Process
Note6.20
Note6.20
Note6.20
When using the Executional conditioned device test in the Universal model QCPU, check the
versions of CPU module and GX Developer. (
Universal
UD
The Basic model QCPU, High Performance model QCPU, Process CPU, and Redundant CPU
do not support the Executional conditioned device test.
Process
Redundant
Basic
High
Performance
Program name
Step No.
Device
Setting value
Execution timing
: MAIN
: 10
: M0
: ON
: Before executing instruction
Registration data
GX Developer
Program: MAIN
Turning ON M0.
<Program example>
<Operation>
Processing
LD M0
10
35
OFF
45
Changes the value in D0 to "35".
+ K10 D0
Value in D0
Value in M0
Executional conditioned device test which
sets "35" in D0 in this step is registered.
A device value is changed within the
specified step regardless of the value in M0.
Ladder mode
List mode