Technical Data
Leica M525 F20/CT20 / Ref. 10 715 156 / Version 01 53
13.10 Limitations of use
The Leica M525 F20 is only to be used on a strong, level floor in
enclosed rooms. Negative effects from drift must be taken into
accounts on floors with an inclination exceeding 0.3°.
The Leica M525 F20 is not suitable for crossing thresholds higher
than 20 mm.
To move the surgical microscope over thresholds of 20 mm, the
wedge (1) included in the packaging can be used.
X
X
Place the wedge (1) in front of the threshold.
X
X
Move the surgical microscope across the threshold in transport
position, pushing it by the handle.
Without auxiliary equipment, the Leica M525 F20 can be moved
across thresholds up to a max. height of 5 mm.
13.11 Electromagnetic compatibility
(EMC)
Environment for which the instrument is suitable
Hospitals except for near active HF Surgical Equipment and the RF
shielded room of an ME System for magnetic resonance imaging,
where the intensity of EM Disturbances is high.
Compliance IEC 60601-1-2
Emissions • CISPR 11, Class A, Group 1
• Harmonic Distortion per IEC 61000-3-2 Class A
• Voltage Fluctuation and Flicker per IEC 61000-3-3
Class A, Figures 3-7
Immunity • Electrostatic discharge IEC 61000-4-2:
CD +/- 8 kV, AD +/- 15 kV
• Radiated RF EM Fields IEC 61000-4-3:
80 – 2700 MHz: 10 V/m
• Proximity Wireless fields IEC 61000-4-3:
380 – 5785 MHz: 9 V/m; 28 V/m
• Electrical Fast Transients and
bursts IEC 61000-4-4:
± 2 kV: Power supply lines
• Surges IEC 61000-4-5:
± 1 kV Line-to-line
± 2 kV Line-to-ground
• Conducted disturbances, induced by RF fields
IEC 61000-4-6:
10 V rms
• Rated Power-frequency Magnetic Field IEC 61000-
4-8:
30 A/m
• Voltage dips and interruptions IEC 61000-4-11:
according to IEC 60601-1-2:2014
