
Contents
6-8.
Eye
width
measurement.
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6-38
6-9.
Jitter
measurement.
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6-39
6-10.
Duty
cycle
distortion
measurement.
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6-40
6-11.
Measuring
Q-factor
.
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6-42
7-1.
Pulse
parameters
the
instrument
measures
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7-3
7-2.
The
instrument
uses
this
process
for
waveform
measurement.
7-5
7-3.
Some
measurements
are
made
from
the
histogram.
.
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.
7-6
7-4.
The
middle
20
percent
of
the
waveform
is
ignored.
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.
7-8
7-5.
Calculating
the
10,
50,
and
90
percent
thresholds
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.
7-10
7-6.
Thresholds
are
used
to
determine
edges
.
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7-11
7-7.
The
system
ignores
incomplete
transitions
when
dening
edges
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7-12
7-8.
W
aveform
period
is
measured
at
the
middle
threshold.
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.
7-13
7-9.
W
aveform
denitions
used
to
make
voltage
measurements
.
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.
7-15
7-10.
Y
ou
may
dene
1time
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7-19
9-1.
Erroneous
rise
time
measurements
due
to
jitter
.
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9-8
9-2.
Eect
of
vertical
dc
errors
on
measurement
accuracy
.
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9-10
9-3.
Edges
of
opposite
polarity
reinforce
dc
errors
.
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9-11
9-4.
F
aster
transitions
decrease
eect
of
dc
oset
errors
.
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.
9-12
9-5.
Measure
time
intervals
at
fastest-changing
part
of
transition.
.
9-12
9-6.
Narrow
pulse
applied
to
the
instrument.
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9-16
9-7.
Errors
in
pulse
height
measurement.
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9-17
9-8.
Error
in
pulse
width
at
10%
level
is
approximately
equal
to
the
error
in
10%{90%
rise
time
.
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9-18
9-9.
Eect
of
probe
capacitance
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9-19
10-1.
Standard
measurement
thresholds
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10-8
10-2.
Standard
deviations
of
a
Gaussian
distribution.
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10-20
10-3.
Sine
wave
in
the
frequency
domain.
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10-29
10-4.
An
FFT
display
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10-30
10-5.
An
example
of
the
histogram
display
.
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10-38
11-1.
The
Directory
display
.
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11-4
11-2.
Dots
only
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11-28
11-3.
Connected
dots
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11-29
11-4.
Screen
in
grid
mode
using
one
graph.
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11-31
11-5.
Screen
in
frame
mode
using
one
graph.
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.
11-32
11-6.
Screen
in
frame
mode
using
two
graphs
.
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.
11-33
11-7.
A
functional
view
of
the
limit
test.
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11-43
11-8.
Setup
screen.
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11-71
11-9.
The
System
Conguration
display
.
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.
11-80
11-10.
A
typical
Cal
Status
display
.
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11-86
11-11.
A
typical
Firmware
support
screen.
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11-89
Contents-12
Summary of Contents for 54750A
Page 1: ...User s Guide HP 83480A Analyzer HP 54750A Oscilloscope ...
Page 6: ...NOTE Clean the cabinet using a damp cloth only vi ...
Page 7: ...X Ray Radiation Notice vii ...
Page 8: ...Declaration of Conformity viii ...
Page 17: ...Figure0 1 Exampleof astatic safeworkstation xvii ...
Page 28: ......
Page 43: ...1 The Instrument at a Glance ...
Page 57: ...The Rear Panel Figure1 3 Theinstrument rearpanel 1 15 ...
Page 60: ...TheInstrument ataGlance ...
Page 61: ...2 General Purpose Keys ...
Page 69: ...3 Speci cations and Characteristics ...
Page 76: ...Speci cationsand Characteristics ...
Page 77: ...4 Calibration Overview ...
Page 84: ...CalibrationOverview ...
Page 85: ...5 Eye Mask and Eyeline Mode Measurement Tutorials ...
Page 136: ...Eye Mask andEyelineModeMeasurement Tutorials ...
Page 137: ...6 The Digital Communications Analysis Menus ...
Page 173: ...The Digital Communications Analysis Menus MeasureEyeMenu Figure6 7 Crossing measurement 6 37 ...
Page 178: ...The Digital Communications Analysis Menus MeasureEye Menu Figure6 11 MeasuringQ factor 6 42 ...
Page 191: ...7 Waveform Measurements ...
Page 211: ...8 Making Automatic Measurements ...
Page 233: ...9 Increasing Measurement Accuracy and Time Interval Measurement ...
Page 252: ...IncreasingMeasurement Accuracy andTime Interval Measurement ...
Page 253: ...10 General Purpose Oscilloscope Menus ...
Page 317: ...11 The General Function Menus ...
Page 345: ...The General Function Menus DisplayMenu Figure11 3 Connecteddots 11 29 ...
Page 415: ...12 Messages ...
Page 421: ...13 How the Instrument Works ...
Page 453: ...Index ...