
Increasing
Measurement
Accurac
y
and
Time-Interval
Measurement
Increasing
Measurement
Accuracy
Measurement
statistics
in
the
instrument
give
valuable
insight.
T
o
view
statistics
,
select
the
Dene
Measure
menu.
The
Statistics
softkey
allows
you
to
display
either
the
minimum
and
maximum
or
the
mean
and
standard
deviation
of
all
selected
measurements
.
The
most
recent
value
is
always
displayed.
Y
ou
need
to
know
how
much
the
instrument's
time-interval
measurement
varies
statistically
because
this
aects
measurements
of
the
statistical
behavior
of
your
system.
Jitter
introduced
by
the
instrument
has
two
components:
a
xed
part
and
a
variable
part.
The
xed
component
of
jitter
is
the
same
at
all
points
on
the
time
base
,
including
the
trigger
point.
The
variable
component
increases
as
the
delay
from
the
trigger
point
increases
.
T
o
view
the
xed
part
of
the
jitter
,
set
the
P
osition
control
in
the
Time
Base
menu
to
its
minimum
value
.
Set
the
Reference
control
in
the
Time
Base
menu
to
Center
.
Set
up
the
instrument
to
view
a
fast-rising
edge
from
a
pulse
generator
,
such
as
an
HP
8131A.
The
triggered
edge
should
be
at
the
center
of
the
screen.
Press
the
Trigger
menu
key
.
Y
ou
will
see
the
trigger
level
marker
displayed
on
the
screen.
Ideally
there
would
be
no
jitter
(no
horizontal
spreading
of
the
trace)
where
the
waveform
intersects
the
trigger
level.
Any
spreading
is
the
xed
part
of
the
jitter
.
T
o
view
the
variable
part
of
the
jitter
,
you
must
have
a
synthesized,
crystal-controlled
signal
source
because
the
source
must
have
less
jitter
than
the
instrument's
time
base
.
Y
ou
can
use
these
HP
signal
sources
to
characterize
time
base
jitter:
HP
8656B
(see
following
paragraph)
HP
8657A
(see
following
paragraph)
HP
3335A
synthesized
function
generator
HP
80000
pulse/pattern
generator
The
faster
the
slew
rate
of
the
source
,
the
easier
it
is
to
evaluate
jitter
.
One
way
to
get
fast-slewing
edges
is
to
trigger
a
pulse
generator
,
such
as
an
HP
8130A
or
HP
8131A,
with
a
stable
sine-wave
source
,
like
an
HP
8656B
or
HP
8657A.
9-6
Summary of Contents for 54750A
Page 1: ...User s Guide HP 83480A Analyzer HP 54750A Oscilloscope ...
Page 6: ...NOTE Clean the cabinet using a damp cloth only vi ...
Page 7: ...X Ray Radiation Notice vii ...
Page 8: ...Declaration of Conformity viii ...
Page 17: ...Figure0 1 Exampleof astatic safeworkstation xvii ...
Page 28: ......
Page 43: ...1 The Instrument at a Glance ...
Page 57: ...The Rear Panel Figure1 3 Theinstrument rearpanel 1 15 ...
Page 60: ...TheInstrument ataGlance ...
Page 61: ...2 General Purpose Keys ...
Page 69: ...3 Speci cations and Characteristics ...
Page 76: ...Speci cationsand Characteristics ...
Page 77: ...4 Calibration Overview ...
Page 84: ...CalibrationOverview ...
Page 85: ...5 Eye Mask and Eyeline Mode Measurement Tutorials ...
Page 136: ...Eye Mask andEyelineModeMeasurement Tutorials ...
Page 137: ...6 The Digital Communications Analysis Menus ...
Page 173: ...The Digital Communications Analysis Menus MeasureEyeMenu Figure6 7 Crossing measurement 6 37 ...
Page 178: ...The Digital Communications Analysis Menus MeasureEye Menu Figure6 11 MeasuringQ factor 6 42 ...
Page 191: ...7 Waveform Measurements ...
Page 211: ...8 Making Automatic Measurements ...
Page 233: ...9 Increasing Measurement Accuracy and Time Interval Measurement ...
Page 252: ...IncreasingMeasurement Accuracy andTime Interval Measurement ...
Page 253: ...10 General Purpose Oscilloscope Menus ...
Page 317: ...11 The General Function Menus ...
Page 345: ...The General Function Menus DisplayMenu Figure11 3 Connecteddots 11 29 ...
Page 415: ...12 Messages ...
Page 421: ...13 How the Instrument Works ...
Page 453: ...Index ...