
Eye
,
Mask
and
Eyeline
Mode
Measurement
T
utorials
T
esting
to
a
Mask
V
erifying
waveform
conformance
to
the
mask
With
mask
testing
activated,
the
instrument
automatically
determines
the
waveform
conformance
to
the
mask.
The
following
information
is
displayed
on
the
bottom
of
the
display
.
STM16/OC48
This
is
the
standard
mask
to
which
the
eye
is
being
tested.
total
wfms
This
is
the
number
of
waveforms
taken
(total
samples/record
length).
failed
wfms
This
is
the
number
of
waveforms
that
have
violated
the
mask.
total
samples
The
number
of
data
points
compared
to
the
mask.
failed
samples
The
number
of
data
points
which
violate
the
mask.
1
This
represents
the
number
of
failed
samples
that
have
violated
the
center
(number
1)
region
of
the
mask.
2
This
represents
the
number
of
failed
samples
that
have
violated
the
upper
(number
2)
region
of
the
mask.
3
This
represents
the
number
of
failed
samples
that
have
violated
the
lower
(number
3)
region
of
the
mask.
Using
mask
margins
When
a
test
device
passes
a
mask
test
without
any
violations
,
it
is
often
useful
to
determine
the
margin
of
compliance
.
Mask
margins
are
used
for
this
purpose
.
First
a
mask
measurement
is
made
,
then
the
mask
is
linearly
increased
in
size
by
a
particular
percentage
.
F
or
instance
,
if
you
want
to
verify
that
the
test
device
can
comply
to
a
standard
mask
with
a
20%
margin,
the
margin
value
is
set
to
20%.
If
a
test
device
fails
to
comply
to
a
standard
mask
you
may
set
a
negative
margin,
and
determine
where
the
device
starts
to
fail.
T
esting
to
a
xed
margin
T
o
establish
a
mask
margin,
use
the
following
procedure:
1.
Make
a
mask
measurement
as
outlined
in
the
previous
procedure
.
2.
Select
NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
Create
mask...
on
the
Mask
T
est
softkey
menu.
3.
Select
NNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNNN
Mask
margins
on
from
the
Create
Mask
menu.
4.
Set
the
margin
percentage
by
selecting
the
NNNNNNNNNNNNNNNNNNNNNNNNNN
Margin
%
softkey
and
using
the
knob
.
5-34
Summary of Contents for 54750A
Page 1: ...User s Guide HP 83480A Analyzer HP 54750A Oscilloscope ...
Page 6: ...NOTE Clean the cabinet using a damp cloth only vi ...
Page 7: ...X Ray Radiation Notice vii ...
Page 8: ...Declaration of Conformity viii ...
Page 17: ...Figure0 1 Exampleof astatic safeworkstation xvii ...
Page 28: ......
Page 43: ...1 The Instrument at a Glance ...
Page 57: ...The Rear Panel Figure1 3 Theinstrument rearpanel 1 15 ...
Page 60: ...TheInstrument ataGlance ...
Page 61: ...2 General Purpose Keys ...
Page 69: ...3 Speci cations and Characteristics ...
Page 76: ...Speci cationsand Characteristics ...
Page 77: ...4 Calibration Overview ...
Page 84: ...CalibrationOverview ...
Page 85: ...5 Eye Mask and Eyeline Mode Measurement Tutorials ...
Page 136: ...Eye Mask andEyelineModeMeasurement Tutorials ...
Page 137: ...6 The Digital Communications Analysis Menus ...
Page 173: ...The Digital Communications Analysis Menus MeasureEyeMenu Figure6 7 Crossing measurement 6 37 ...
Page 178: ...The Digital Communications Analysis Menus MeasureEye Menu Figure6 11 MeasuringQ factor 6 42 ...
Page 191: ...7 Waveform Measurements ...
Page 211: ...8 Making Automatic Measurements ...
Page 233: ...9 Increasing Measurement Accuracy and Time Interval Measurement ...
Page 252: ...IncreasingMeasurement Accuracy andTime Interval Measurement ...
Page 253: ...10 General Purpose Oscilloscope Menus ...
Page 317: ...11 The General Function Menus ...
Page 345: ...The General Function Menus DisplayMenu Figure11 3 Connecteddots 11 29 ...
Page 415: ...12 Messages ...
Page 421: ...13 How the Instrument Works ...
Page 453: ...Index ...