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8.5 Making System Settings
204
The following self tests are available. Results are displayed on the screen.
If any faults are found, have the instrument repaired. Contact your authorized Hioki dis-
tributor or reseller.
Self-Test
Select the
[System]
Screen.
Select the self test to per-
form.
Apply
1
2
Self-Test
Details
KEY/LED
Tests the keys and LEDs for correct operation.
After every key has been pressed, the KEY/LED check finishes.
Pressing
START
also tests whether the LED lights.
If you notice a malfunction, press
START
and
STOP
simultaneously to
abort the test.
LCD
Tests the screen display (character test, gradation test, color test)
The screen changes each time you press an operation key.
If the display screen seems abnormal, request repairs.
ROM/RAM
ROM/RAM Tests the instrument's internal memory (ROM and RAM)
If "
NG
" appears, request repairs.
SD card
Tests whether the inserted SD memory card can be recognized by the instru-
ment. Use only the included SD memory card or a genuine HIOKI optional SD
memory card. Proper operation is not guaranteed with other SD memory cards,
and you may not be able to properly save and load data.
USB
Memory
Tests whether the inserted USB flash drive is recognized by the instrument.
(Proper operation of USB flash drives cannot be guaranteed. It is recommended
to use the included SD memory card or a genuine HIOKI optional SD memory
card.)
Unit
Information
Tests the configuration display for currently connected input units as well as the
input units.
Summary of Contents for LR8410-20
Page 1: ......
Page 2: ......
Page 12: ...Contents x...
Page 32: ...Operating Precautions 20...
Page 78: ...2 7 Compensating for Input Circuit Offset Zero Adjustment 66...
Page 122: ...3 10 Viewing and Editing with the All Channel Settings List 110...
Page 138: ...4 3 Marking Waveforms and Searching Marks Search Function 126...
Page 222: ...9 4 Synchronous Measurements with Multiple instruments 210...
Page 316: ...13 3 Disposing of the instrument 304...
Page 360: ...Index Index 4...
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