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29 September 1997 – Subject To Change
Testability and Diagnostics
12–5
Test Interface
During the capture operation, the shift register stage of IR is loaded with the value
00001. This automatic load feature is useful for testing the integrity of the IEEE
1149.1 scan chain on the module.
Bypass Register
The bypass register is a 1-bit shift register. It provides a short single-bit scan path
through the port (chip).
Boundary-Scan Register
The 261-bit boundary-scan register is accessed during SAMPLE, EXTEST, and
CLAMP instructions. Refer to Section 12.3 for the organization of this register.
Table 12–3 Instruction Register
IR<4:0> Name
Selected
Scan Register Operation
00000
EXTEST
BSR
BSR drives pins. Interconnect test mode.
00010
SAMPLE/PRELOAD BSR
Preloads BSR.
00010
Private
BSR
Private.
00011
Private
BSR
Private.
00100
CLAMP
BPR
BSR drives pins.
00101
HIGHZ
BPR
Tristate all output and I/O pins.
00110
Private
IDR
Private.
00111
Private
IDR
Private.
01000
through
11110
Private
BPR
Private.
11111
BYPASS
BPR
Default.