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29 September 1997 – Subject To Change
Testability and Diagnostics
12–3
Test Interface
Note:
DIGITAL recommends that the trst_l pin be driven low (asserted) when
the JTAG (IEEE 1149.1) logic is not in use.
2.
Coverage of oscillator differential input pins
The two differential clock input pins, osc_clk_in_h and osc_clk_in_l, do not
have any boundary-scan cells associated with them (noncompliant spec
10.4.1(b) in IEEE 1149.1–1993). Instead, there is an extra input BSR cell in the
boundary-scan register in bit position 241 (at pin dc_ok_h). This cell captures
the output of a “clock sniffer” circuit. It captures a 1 when the oscillator is con-
nected, and captures a 0 if the chip’s oscillator connections are broken.
This exception to the standard is made to permit a meaningful test of the oscilla-
tor input pins.
Refer to IEEE Standard 1149.1–1993 A Test Access Port and Boundary Scan Archi-
tecture for a full description of the specification.
Figure 12–1 shows the user-visible features from this port.
Figure 12–1 IEEE 1149.1 Test Access Port
Instruction Register (IR)
Bypass Register (BPR)
Die-ID Register (IDR)
Boundary-Scan Register (BSR)
TAP Controller
State Machine &
Control Dispatch
Logic
TRST_L
TMS_H
TCK_H
TDO_H
TDI_H
CONTROL
LJ-03463.AI4