Dell OptiPlex HUB, Troubleshooting Manual

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Running the Dell Diagnostics 4-9
T
ests in the Dell Diagnostics
To troubleshoot components or devices, run the appropri-
ate test (test group or subtest) in the diagnostics on your
diagnostics diskette. The diagnostics exercises the func-
tional components and devices of your computer system
more vigorously and thoroughly than they are exercised
during normal operation. The diagnostics is organized by
components into test groups and subtests within each test
group. Each subtest is designed to detect any errors that
may interfere with the normal operation of a specific
device of the computer.
NOTE: Some subtests requiring hardware not listed in
the System Configuration area of the diagnostics screen
appear to run, but they conclude with a status message
stating
Component not present (or
disabled).
Table 4-2 lists the diagnostic test groups, their subtests,
and comments concerning their use.
Table 4-2. Dell Diagnostics Tests
Test Groups Subtests Description
RAM Quick Memory Test
Comprehensive Memory Test
Secondary Cache Memory Test Tests the RAM and cache. (Some computers include
expanded or extended memory; all memory is
tested.)
System Set CMOS Confidence Test
CMEM Confidence Test
DMA Controller Test
Real-Time Clock Test
System Timers Test
Interrupt Controller Test
Reset Button Test
System Speaker Test
Coprocessor Calculation Test
Coprocessor Error Exception Test
PC Card Controller Test
Thermal Control Test
Multiprocessor Test
USB Register Test
USB Memory Structure Test
Tests the system board’s support chips, DMA con-
troller, computer timer, NVRAM, speaker controller,
cache, and EISA configuration RAM chip, as
appropriate.
Tests the math coprocessor that is internal to the
microprocessor.
Tests the PC Card controller on the system board.
Checks the functionality of the thermal-monitoring
and microprocessor speed-switching device on the
system board.
For systems with multiprocessors, confirms that the
secondary microprocessor is operational.
Checks the onboard registers of the USB interface.
This subtest does not test USB peripherals.
Monitors the ability of a USB controller to process a
simple set of memory-resident instructions.
NOTES: Not all of these tests appear for each system.
For the full name of an abbreviation or acronym used in this table, see the abbreviation and acronym list that precedes the Index.